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Committee
Date Time
Place
Paper Title / Authors
Abstract
Paper #
ICD
,
CPM
2007-01-19
13:00
Tokyo
Kika-Shinko-Kaikan Bldg.
A Constrained Test Generation Method for Low Power Testing
Yoshiaki Tounoue
,
Xiaoqing Wen
,
Seiji Kajihara
(
K I T
),
Kohei Miyase
(
JST
),
Tatsuya Suzuki
,
Yuta Yamato
(
K I T
)
High Power dissipation when the response to a test vector is captured by flip-flops in scan testing which may cause exce...
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CPM2006-148
ICD2006-190
pp.109-114
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