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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, VLD 2007-03-07
17:20
Okinawa Mielparque Okinawa A Gate Sizing Technique for Maximizing Timing Yield of CMOS Circuits
Ryota Sakamoto, Masanori Muroyama, Tohru Ishihara, Hiroto Yasuura (Kyushu Univ.)
 [more] VLD2006-117 ICD2006-208
pp.67-72
ICD, VLD 2007-03-07
17:40
Okinawa Mielparque Okinawa A Study of Dependence on Gate Depth/Width for Analyzing Delay/Power Variations in 90nm CMOS Circuits
Masaki Yamaguchi (Kyushu Univ.), Yuan Yang (Xi’an Univ. of Technology), Ryota Sakamoto, Masanori Muroyama, Tohru Ishihara, Hiroto Yasuura (Kyushu Univ.)
As the transistor size shrinks, process variations increase. Under the existence of the variations, an existing design f... [more] VLD2006-118 ICD2006-209
pp.73-78
AI 2006-12-01
09:30
Tokyo MEW(Shiodome) An implementation of the control method for consumer electronics based on earthquake early warning
Takashi Kokawa, Ryota Sakamoto, Hitoshi Ogawa (Ritsumeikan Univ.)
In Japan, earthquakes happen on a regular basis. There is an earthquake early warning system operated by the Japan Meteo... [more] AI2006-25
pp.1-6
VLD, IPSJ-SLDM 2006-05-12
14:00
Ehime Ehime University Measurement and Analysis of Delay and Power Variations in 90nm CMOS Circuits
Masaki Yamaguchi (Kyushu Univ.), Yang Yuan (Xi'an Univ. of Technology), Kosuke Tarumi, Ryota Sakamoto, Masanori Muroyama, Tohru Ishihara, Hiroto Yasuura (Kyushu Univ.)
As the transistor size shrinks, process variations increase. Under the existence of the variations, an existing design f... [more] VLD2006-13
pp.41-46
SS 2006-04-21
10:30
Niigata Niigata Univ., Igarashi Campus Test Case Generation for Design Pattern Detection
Ryouta Sakamoto, Shinpei Hayashi, Motoshi Saeki (Tokyo Inst. of Tech.)
To help with understanding of existing programs, some researches to detect occurrences of design patterns via dynamic an... [more] SS2006-9
pp.7-12
ICD, SDM 2005-08-18
09:45
Hokkaido HAKODATE KOKUSAI HOTEL A Digital Detector Design For Measuring Gate-Delay Variation
Ryota Sakamoto, Masanori Muroyama, Kosuke Tarumi, Hiroto Yasuura (Kyushu Univ.)
(Advance abstract in Japanese is available) [more] SDM2005-131 ICD2005-70
pp.19-24
 Results 1 - 6 of 6  /   
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