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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM | 2022-11-10 14:00 |
Online | Online | [Invited Talk]
Modeling Electrical Properties of CrSi Thin Films Kenichiro Sonoda, Nobuhito Shiraishi, Kazuyoshi Maekawa, Nozomi Ito, Eiji Hasegawa, Tamotsu Ogata (Renesas Electronics)  SDM2022-67 |
Electrical resistivity of CrSi thin films is modeled considering phase transitions and grain growth during thermal annea... [more] | SDM2022-67 pp.14-18 |
| SDM | 2022-01-31 13:15 |
Online | Online | [Invited Talk]
**** Tomoya Saito, Takashi Ito, Yasuhiko Taito, Kenichiro Sonoda, Genta Watanabe, Ken Matsubara, Akihiko Kanda, Takahiro Shimoi, Koichi Takeda, Takashi Kono (Renesas) SDM2021-68 |
We present the low energy write techniques and measurement results of a 20Mb embedded STT-MRAM test chip in 16nm FinFET ... [more] | SDM2021-68 pp.1-4 |
| SDM | 2021-11-12 10:30 |
Online | Online | [Invited Talk]
Full band Monte Carlo analysis of the uniaxial stress impact on 4H-SiC high energy transport Tomoya Nishimura, Katsumi Eikyu, Kenichiro Sonoda, Tamotsu Ogata (Renesas Electronics) SDM2021-61 |
SiC is expected to be the next-generation semiconductor material especially for power devices, and some have been put in... [more] | SDM2021-61 pp.43-46 |
| SDM | 2020-11-19 15:20 |
Online | Online | [Invited Talk]
A technique for phase-detection auto focus under near-infrared-ray incidence in a back-side illuminated CMOS image sensor pixel Tatsuya Kunikiyo, Hidenori Sato, Takeshi Kamino, Koji Iizuka, Ken'ichiro Sonoda, Tomohiro Yamashita (Renesas Electronics) SDM2020-26 |
A novel phase-detection auto focus (PDAF) technique for incident 850 nm plane wave is demonstrated using Ge-on-Si layer ... [more] | SDM2020-26 pp.21-24 |
| SDM | 2020-02-07 09:35 |
Tokyo | Tokyo University-Hongo | [Invited Talk]
Impact of Homogeneously Dispersed Al Nanoclusters by Si-monolayer Insertion into Hf0.5Zr0.5O2 Film on FeFET Memory Array with Tight Threshold Voltage Distribution Tadashi Yamaguchi, Keiichi Maekawa, Takahiro Ohara, Atsushi Amo, Eiji Tsukuda, Kenichiro Sonoda, Hiroshi Yanagita, Masao Inoue, Masazumi Matsuura, Tomohiro Yamashita (Renesas) SDM2019-89 |
[more] | SDM2019-89 pp.5-8 |
| SDM | 2018-11-08 09:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
SISPAD 2018 Review Kenichiro Sonoda (Renesas Electronics) SDM2018-64 |
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) was held on September 24-26,... [more] | SDM2018-64 pp.1-6 |
| SDM | 2018-10-17 14:00 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
Fin-FET MONOS for Next Generation Automotive-MCU Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Yasuo Yamaguchi, Tomohiro Yamashita (Renesas) SDM2018-52 |
[more] | SDM2018-52 pp.1-5 |
| SDM | 2018-01-30 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Reliability and Scalability of FinFET Split-Gate MONOS Array with Tight Vth Distribution for 16/14nm-node Embedded Flash Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Tomohiro Yamashita, Yasuo Yamaguchi (renesas) SDM2017-94 |
Reliability and scalability of split-gate metal-oxide nitride oxide silicon (SG-MONOS) are discussed for 16/14nm-node em... [more] | SDM2017-94 pp.13-16 |
| ICD | 2017-04-20 14:55 |
Tokyo | [Invited Lecture]
First demonstration of FinFET Split-Gate MONOS for High-Speed and Highly-Reliable Embedded Flash in 16/14nm-node and beyond Shibun Tsuda, Yoshiyuki Kawashima, Kenichiro Sonoda, Atsushi Yoshitomi, Tatsuyoshi Mihara, Shunichi Narumi, Masao Inoue, Seiji Muranaka, Takahiro Maruyama, Tomohiro Yamashita, Yasuo Yamaguchi (Renesas Electronics), Digh Hisamoto (Hitachi) ICD2017-7 |
FinFET split-gate metal-oxide nitride oxide silicon (SG-MONOS) Flash memories have been fabricated and operated for the ... [more] | ICD2017-7 pp.35-38 |
|
| SDM | 2017-01-30 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
First Demonstration of FinFET Split-Gate MONOS for High-Speed and Highly-Reliable Embedded Flash in 16/14nm-node and Beyond Shibun Tsuda, Yoshiyuki Kawashima, Kenichiro Sonoda, Atsushi Yoshitomi, Tatsuyoshi Mihara, Shunichi Narumi, Masao Inoue, Seiji Muranaka, Takahiro Maruyama, Tomohiro Yamashita, Yasuo Yamaguchi (Renesas Electronics), Digh Hisamoto (Hitachi) SDM2016-134 |
FinFET split-gate metal-oxide nitride oxide silicon (SG-MONOS) Flash memories have been fabricated and operated for the ... [more] | SDM2016-134 pp.17-20 |
| SDM | 2016-11-10 10:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
SISPAD 2016 Review (1) Kenichiro Sonoda (Renesas Electronics) SDM2016-79 |
[more] | SDM2016-79 pp.1-7 |
| SDM | 2015-11-06 14:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Impacts of the 4H-SiC/SiO2 Interface States on the Switching Operation of Power MOSFETs Atsushi Sakai, Katsumi Eikyu, Kenichiro Sonoda (REL), Kenichi Hisada, Koichi Arai, Yoichi Yamamoto (RSMC), Motoaki Tanizawa, Yasuo Yamaguchi (REL) SDM2015-91 |
[more] | SDM2015-91 pp.39-43 |
| SDM | 2014-11-07 10:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
SISPAD 2014 Review Kenichiro Sonoda (Renesas Electronics) SDM2014-103 |
2014 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) was held on September 9-11... [more] |
SDM2014-103 pp.43-46 |
| SDM | 2013-11-14 14:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | The effect of incorporated elements in nitrogen vacancies on electron trap level in silicon nitride Kenichiro Sonoda, Eiji Tsukuda, Motoaki Tanizawa, Kiyoshi Ishikawa, Yasuo Yamaguchi (Renesas Electronics) SDM2013-103 |
[more] | SDM2013-103 pp.21-26 |
| SDM, VLD | 2007-10-30 13:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Electro-Thermal Compact Model for Reset Operation of Phase Change Memories Atsushi Sakai, Kenichiro Sonoda, Masahiro Moniwa, Kiyoshi Ishikawa, Osamu Tsuchiya, Yasuo Inoue (Renesas Technology Corp.) VLD2007-55 SDM2007-199 |
A three-dimensional (3D) electro-thermal compact model for the reset operation of a phase change memory (PCM) cell is pr... [more] | VLD2007-55 SDM2007-199 pp.23-26 |
| SDM, VLD | 2006-09-26 11:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Modeling of Discrete Dopant Effects on Threshold Voltage Shift by Random Telegraph Signal Ken'ichiro Sonoda, Kiyoshi Ishikawa, Takahisa Eimori, Osamu Tsuchiya (Renesas Technology Corp.) |
This paper discusses the discrete channel dopant effects on the threshold voltage shift by random telegraph signal (RTS)... [more] | VLD2006-42 SDM2006-163 pp.19-24 |
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