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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 80  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
CPM, ED, EID, SDM, ICD, MRIS, QIT, SCE, OME, EMD
(Joint) [detail]
2018-03-08
15:15
Shizuoka   Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 4 --
Keiji Koshida, Shin-ichi Wada (TMC), Koichiro Sawa (NIT)
Authors have studied degradation phenomena on electrical contacts under oscillations. In addition, they have developed a... [more] EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69
pp.15-20
EMD 2017-11-17
10:30
Tokyo The University of Electro-Communications A Method for Evaluating Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes against Input Waveforms (3) --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (Nippon Inst. of Tech.)
The authors obtaine experimental results on the minimal sliding amplitude (MSA) required to make resistances fluctuate o... [more] EMD2017-44
pp.7-12
EMD 2016-11-03
13:55
Hyogo Awaji Yumebutai International Conference Center Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 2 --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT)
Authors have studied degradation phenomenon on electrical contacts under the influences of an external micro-oscillation... [more] EMD2016-52
pp.11-16
EMD 2015-11-05
15:35
Miyagi Tohoku University, School of engineering, Aoba memorial hall Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT)
 [more] EMD2015-70
pp.17-21
EMD 2015-11-05
16:00
Miyagi Tohoku University, School of engineering, Aoba memorial hall An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board by a Hammering Oscillation Mechanism -- Natural Frequency --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT)
 [more] EMD2015-71
pp.23-28
EMD 2015-10-02
16:50
Saitama Fuji Electric FA Components & SystemCo.,Ltd. Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions --
Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT)
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] EMD2015-66
pp.37-42
EMCJ, EMD 2015-07-10
14:55
Tokyo Kikai-Shinko-Kaikan Bldg. An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (4) -- A theoretical method for the responses of the oscillation system by a rectangular waveform or quasi-impulsive ones --
Shin-ichi Wada (TMC), Koichiro Sawa (NIT)
 [more] EMCJ2015-49 EMD2015-26
pp.31-36
EMD, CPM, OME 2015-06-19
15:55
Tokyo Kikai-Shinko-Kaikan Bldg. By means of a statistical method an analysis of degradation phenomenon of electrical contacts using micro-sliding mechanisms -- A statistical analysis using data of minimal sliding amplitudes under some conditions --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
Authors have designed and developed a mechanism to be capable of micro-sliding electrical contact directly by using a gi... [more] EMD2015-17 CPM2015-27 OME2015-30
pp.35-40
EMD, R 2015-02-20
15:20
Shizuoka   A method for evaluating degradation phenomenon of electrical contacts using a micro-sliding mechanisms -- Minimal sliding amplitudes against input waveforms under some conditions --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
Authors have designed and developed a micro-sliding mechanism (MSM1) which causes electronic devices to oscillate direct... [more] R2014-73 EMD2014-110
pp.13-20
EMD 2014-12-19
14:05
Tokyo Kikai-Shinko-Kaikan Bldg An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (8) -- The effect by application time of external force (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.)
Authors, first, analyse the transient response and steady-state one using theoretical inputs developed by Fourier series... [more] EMD2014-95
pp.1-6
EMD 2014-12-19
14:30
Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (4) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-96
pp.7-12
EMD 2014-12-19
14:55
Tokyo Kikai-Shinko-Kaikan Bldg Degradation phenomenon of electrical contacts by using a micro-sliding mechanism and a hammering oscillation mechanism -- The effect of adding quasi-impulsive oscillation to micro-sliding --
Shin-ichi Wada, Hiroki Iwamoto, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have designed and developed a hammering oscillation system which gives transient external-force repeatedly to el... [more] EMD2014-97
pp.13-18
EMD 2014-11-30
14:55
Hokkaido Chitose Cultural Center An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (6) -- The effect by application time of external force --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have studied the degradation phenomenon of electrical contact under the influences of an external micro-oscillat... [more] EMD2014-91
pp.149-154
EMD 2014-11-30
15:15
Hokkaido Chitose Cultural Center Degradation phenomenon of electrical contacts by using a micro-sliding mechanism -- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions (3) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have studied degradation phenomenon on contact resistance under the influences of an external micro-oscillation.... [more] EMD2014-92
pp.155-160
EMD, LQE, OPE, CPM, R 2014-08-22
15:55
Hokkaido Otaru Economy Center An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (PCB) (6) -- The effect by application time of external force --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have obtained the transient response and steady-state one using theoretical inputs developed by Fourier series a... [more] R2014-49 EMD2014-54 CPM2014-69 OPE2014-79 LQE2014-53
pp.133-138
EMD, LQE, OPE, CPM, R 2014-08-22
16:15
Hokkaido Otaru Economy Center Degradation Phenomenon of Electrical Contacts by a Micro-Sliding Mechanism -- The comparison of the evaluated minimal sliding amplitudes --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have developed a mechanism which supplies reciprocal micro-sliding to electrical contacts directly driven by a p... [more] R2014-50 EMD2014-55 CPM2014-70 OPE2014-80 LQE2014-54
pp.139-144
EMD, LQE, OPE, CPM, R 2014-08-22
16:35
Hokkaido Otaru Economy Center Degradation phenomenon of electrical contacts by a micro-sliding mechanism -- The comparison of the evaluated minimal sliding amplitudes under some conditions (2) --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have developed a hammering oscillating mechanism which gives micro-oscillation to electrical
contacts, and have... [more]
R2014-51 EMD2014-56 CPM2014-71 OPE2014-81 LQE2014-55
pp.145-150
OME, EMD, CPM 2014-06-20
11:20
Tokyo Kikai-Shinko-Kaikan Bldg. An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (5) -- Natural Frequency and Damping Ratio(2) --
Keiji Koshida, Shin-ichi Wada, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have obtained the steady-state responses using theoretical inputs developed by Fourier series and the analytical... [more] EMD2014-14 CPM2014-34 OME2014-22
pp.33-38
NLP 2014-03-10
16:10
Tokyo Sophia University Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (5) --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more] NLP2013-176
pp.67-72
EMD 2014-01-31
13:35
Tokyo   An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board(4) -- Natural Frequency and Damping Ratio --
Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.)
Authors have obtained the steady-state responses using theoretical inputs developed by Fourier series and the analytical... [more] EMD2013-136
pp.1-6
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