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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
OFT |
2017-05-25 14:55 |
Shimane |
Shimane Univ. (Matsue campus) |
Speed Improvement of Strain Measurement with Brillouin Optical Correlation Domain Reflectometry Using Polarization Diversity Osamu Furukawa, Hideo Shida, Shin-ichiro Tezuka, Satoshi Matsuura, Shoji Adachi (Yokogawa Electric Corp.) OFT2017-3 |
A Brillouin optical correlation domain reflectometry (BOCDR) system using polarization diversity is developed. Polarizat... [more] |
OFT2017-3 pp.11-16 |
VLD |
2010-09-27 16:30 |
Kyoto |
Kyoto Institute of Technology |
[Invited Talk]
An Automatic Test Generation Framework for Digitally-Assisted Analog Circuit Satoshi Komatsu, Mohamed Abbas (Univ. of Tokyo), Yasuo Furukawa (Advantest), Kunihiro Asada (Univ. of Tokyo) VLD2010-46 |
This paper presents a new analog ATPG (AATPG) framework that generates near-optimal test stimulus for the digitally-assi... [more] |
VLD2010-46 pp.25-30 |
ICD, CPM |
2005-01-28 16:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
New SoC Testing technologies for beyond 65nm process rule
-- New Failure Analysis and Testing methodologies for low-k/Cu Interconnect technique -- Makoto Yamazaki, Yasuo Furukawa (ADVANTEST) |
To solve the problems such as the yield improvements and securing the test quality in the SoC devices made efficient, th... [more] |
CPM2004-173 ICD2004-218 pp.65-70 |
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