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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2011-02-14 10:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.)  DC2010-60 |
Excessive capture power in at-speed scan testing may cause timing failures, resulting in test-induced yield loss. This h... [more] | DC2010-60 pp.7-12 |
| NC, NLP, IPSJ-BIO [detail] | 2010-06-19 13:25 |
Okinawa | Ryukyu-daigaku-gozyu-syunen-kinenn-kaikan | A Shooting Method for Self-Excited Oscillators with Periodically Switch-Coupling Shigeki Tsuji (Oita Nat Coll. of Tech.), Hiroto Furukawa, Takuji Kousaka (Oita Univ.) NLP2010-15 NC2010-15 |
[more] | NLP2010-15 NC2010-15 pp.131-134 |
| CAS, NLP | 2009-09-25 10:25 |
Hiroshima | Hiroshima Univ. Higashi Senda Campus | Experimental Study of an Interrupted Electric Circuit with PWM-1 Control Hiroto Furukawa, Hiroyuki Asahara, Takuji Kousaka (Oita Univ.) CAS2009-39 NLP2009-75 |
PWM-1 is known as a control method of the power conversation ciruit. In this paper,we analyze qualitative property and ... [more] |
CAS2009-39 NLP2009-75 pp.87-90 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-17 13:50 |
Fukuoka | Kitakyushu Science and Research Park | A Capture-Safe Test Generation Scheme for At-speed Scan Testing Atsushi Takashima, Yuta Yamato, Hiroshi Furukawa, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyusyu Institute of Technology) VLD2008-62 DC2008-30 |
Capture-safety, defined as the avoidance of any timing error due to unduly high switching activity in capture mode durin... [more] | VLD2008-62 DC2008-30 pp.13-18 |
| VLD, CPSY, RECONF, DC, IPSJ-SLDM, IPSJ-ARC (Joint) [detail] |
2007-11-20 10:30 |
Fukuoka | Kitakyushu International Conference Center | A Transition Delay Test Generation Method for Capture Power Reduction during At-Speed Scan Testing Tomoaki Fukuzawa, Kohei Miyase, Yuta Yamato, Hiroshi Furukawa, Xiaoqing Wen, Seiji Kajihara (KIT) VLD2007-71 DC2007-26 |
High power dissipation can occur when a response to the test vector is captured by flip-flops in at-speed scan testing, ... [more] | VLD2007-71 DC2007-26 pp.7-12 |
| OME | 2006-11-10 13:25 |
Nagano | Shinshu Univ. | Gas-sensing Using Localized Surface Plasmon and Quartz Crystal Microbalance Hiroyuki Furukawa, Yasuo Ohdaira, Kazunari Shinbo, Keizo Kato, Futao Kaneko (Niigata Univ.) |
[more] | OME2006-92 pp.7-11 |
| SDM | 2006-06-21 13:50 |
Hiroshima | Faculty Club, Hiroshima Univ. | Characterization of Interfacial Reactions in Al2O3/SiNx/poly-Si Stack Structure by Photoemission Measurements Hiroaki Furukawa, Masahiro Taira, Akio Ohta, Hiroshi Nakagawa, Hideki Murakami, Seiichi Miyazaki (Hiroshima Univ.), Kenji Komeda, Mitsuhiro Horikawa, Kuniaki Koyama, Hideharu Miyake (Elpida Memory) |
[more] | SDM2006-44 pp.13-17 |
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