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Committee Date Time Place Paper Title / Authors Abstract Paper #
IPSJ-SLDM, CPSY, RECONF, VLD [detail] 2014-01-29
15:40		 Kanagawa Hiyoshi Campus, Keio University Methodology for NBTI measurement using an on-chip leakage monitor circuit
Takaaki Sato, Kimiyoshi Usami (Shibaura Inst. of Tech.) VLD2013-131 CPSY2013-102 RECONF2013-85		 Miniaturization in recent years ,LSI's aging has become prominent as a factor that prevents the normal operation.By meas... [more] VLD2013-131 CPSY2013-102 RECONF2013-85
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