|
|
All Technical Committee Conferences (Searched in: All Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SCE |
2014-07-23 14:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Improvement of 64-kb Josephson-CMOS hybrid memories toward their complete operation Yuta Sasaki, Xizhu Peng, Yuki Yamanashi, Nobuyuki Yoshikawa (Yokohama National Univ.) SCE2014-33 |
[more] |
SCE2014-33 pp.51-56 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 10:30 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
A LSI-Package-Board co-evaluation of Power noise in the Digital LSI Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ.) VLD2012-91 DC2012-57 |
Problems related with power noise in LSI system are getting prominent
because of the higher integration and lower $V_{d... [more] |
VLD2012-91 DC2012-57 pp.183-188 |
EMCJ |
2012-04-20 15:10 |
Ishikawa |
Kanazawa Univ. |
Integrated evaluation of on-board and on-chip power noise measurement results in digital LSI Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Makoto Nagata (Kobe Univ.) EMCJ2012-7 |
In recent LSI system designs, noise environment of LSI system is getting worse.
Therefore proper noise oriented design ... [more] |
EMCJ2012-7 pp.37-42 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-30 09:25 |
Miyazaki |
NewWelCity Miyazaki |
Measurements and Co-Simulation of On-Chip and On-Boad AC Power Noise in Digital Integrated Circuits Kumpei Yoshikawa, Yuta Sasaki (Kobe Univ.), Kouji Ichikawa (DENSO), Yoshiyuki Saito (Panasonic), Makoto Nagata (Kobe Univ./CREST,JST) CPM2011-163 ICD2011-95 |
Power noise of an integrated circuit (IC) chip is dominantly characterized by the frequency-domain impedance of a chip-p... [more] |
CPM2011-163 ICD2011-95 pp.73-78 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2010-11-29 10:40 |
Fukuoka |
Kyushu University |
Evaluation of frequency components of power noise in CMOS digital LSI Kumpei Yoshikawa, Hiroshi Matsumoto, Yuta Sasaki (Kobe Univ.), Makoto Nagata (Kobe Univ./CREST-JST) CPM2010-124 ICD2010-83 |
Recent trends of electric devices are higher performance and/or lower power consumption.
To achieve these designs, LSI ... [more] |
CPM2010-124 ICD2010-83 pp.1-6 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|