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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
RCC, MICT 2015-05-28
15:20
Tokyo Kikai-Shinko-Kaikan Bldg Rapid Recovery Technique from Soft Error of FPGAs in Information and Communication Apparatus
Kenichi Shimbo, Tadanobu Toba, Takumi Uezono, Hidefumi Ibe (Hitachi) RCC2015-9 MICT2015-9
As the amount of data traffic through the communication infrastructure is increasing, a development of high-speed inform... [more] RCC2015-9 MICT2015-9
pp.37-42
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-02
13:50
Kochi Kochi City Culture-Plaza [Invited Talk] Failures due to Terrestriall Neutrons in Most Advanced Semicondutor Devices -- Impacts and Hardening Techniques down to 22nm Design Rule --
Eishi Ibe, Kenichi Shimbo, Hitoshi Taniguchi, Tadanobu Toba (Hitachi, Ltd.) CPM2009-139 ICD2009-68
The status-of-the-art in failures and their mechanisms of CMOS memories and logic gates induced by terrestrial neutrons ... [more] CPM2009-139 ICD2009-68
pp.29-34
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-02
16:00
Kochi Kochi City Culture-Plaza [Panel Discussion] EMC Circuit Design and Jisso Design for System LSI -- Proposal for Circuit Design Managing EMC and Jisso Issue from Jisso-side --
Hideki Osaka (HITACHI Ltd.), Hideki Asai (Shizuoka Univ.), Hidefumi Ibe (HITACHI Ltd.), Yoshiyuki Saito (Panasonic), Takashi Harada (NEC), Narimasa Takahashi (IBM Japan) CPM2009-142 ICD2009-71
Nowadays, a JISSO design is very important to get the target performance out of a system LSI. More specifically, co-desi... [more] CPM2009-142 ICD2009-71
pp.47-49
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2009-12-03
10:00
Kochi Kochi City Culture-Plaza Correlation of Mitigation of Soft-error Rate of Routers between Neutron Irradiation Test and Field Soft-error Data
Kenichi Shimbo, Tadanobu Toba, Hidehumi Ibe, Koji Nishii (Hitachi) CPM2009-143 ICD2009-72
We evaluated the soft error tolerance of the information system by the neutron irradiation test. We estimated the correl... [more] CPM2009-143 ICD2009-72
pp.51-55
ICD, SDM 2008-07-17
15:05
Tokyo Kikai-Shinko-Kaikan Bldg. A Fully Logic-Process-Compatible, SESO-memory Cell with 0.1-FIT/Mb Soft Error, 100-MHz Random Cycle, and 100-ms Retention
Norifumi Kameshiro, Takao Watanabe, Tomoyuki Ishii, Toshiyuki Mine (Hitachi, Ltd.), Toshiaki Sano (Renesas), Hidefumi Ibe, Satoru Akiyama (Hitachi, Ltd.), Kazumasa Yanagisawa, Takashi Ipposhi, Toshiaki Iwamatsu, Yasuhiko Takahashi (Renesas) SDM2008-136 ICD2008-46
We proposed a fully logic compatible process for a single electron shut-off transistor (SESO). A 1-kb memory-cell array ... [more] SDM2008-136 ICD2008-46
pp.47-52
DC, CPSY 2008-04-23
15:00
Tokyo Tokyo Univ. Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
Eishi Ibe (PERL) CPSY2008-7 DC2008-7
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in
semicon... [more]
CPSY2008-7 DC2008-7
pp.37-42
ICD 2008-04-18
11:15
Tokyo   [Invited Talk] Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems -- Evolution of Multi-Node Upset Issues --
Eishi Ibe (PERL) ICD2008-10
Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] ICD2008-10
pp.51-56
ICD, ITE-CE 2006-12-15
10:15
Hiroshima   Spreading Diversity in Multi-cell Neutron-Induced Upsets with Device Scaling
Eishi Ibe (Hitachi), S. Chung, S. Wen (Cysco Systems), Hironaru Yamaguchi, Yasuo Yahagi (Hitachi), hideaki Kameyama, Shigehisa Yamamoto, Takashi Akioka (Renesas)
 [more] ICD2006-161
pp.103-108
 Results 1 - 8 of 8  /   
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