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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMCJ, IEE-EMC, IEE-MAG | 2017-05-18 14:49 |
Overseas | Nanyang Technological University | [Poster Presentation]
Continuity Condition on Single Conductor Transmission Line Model for Thin Wire Structures Daiki Tashiro, Takashi Hisakado, Tohlu Matsushima, Osami Wada (Kyoto Univ.)  EMCJ2017-11 |
When we analyze current on thin wire structures, the distributed constant circuit model cannot be applied to the structu... [more] | EMCJ2017-11 pp.9-10 |
| EMCJ, IEE-EMC, IEE-MAG | 2017-05-18 14:55 |
Overseas | Nanyang Technological University | [Poster Presentation]
Communication Quality of Ethernet in Relation to Parameters of Pulse Disturbance and Imbalance of Signal Transmission System Sayaka Matsushima, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2017-13 |
Recently, there are high interests in using Ethernet for in-car network, but the communication quality of high-speed Eth... [more] | EMCJ2017-13 pp.13-14 |
| EMCJ | 2016-09-16 11:55 |
Hyogo | University of Hyogo | TDR with Utility-Pole-Distance Resolution Considering Mode Conversion for Detection of Fault Type in Power Distribution Lines Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.), Shinpei Oe, Tsuyoshi Sasaoka, Yasuharu Sakai (Kansai Electric Power Co. Inc.) EMCJ2016-52 |
It is necessary to detect a fault point in a distribution system for accident restoration in power grid. Applying a puls... [more] | EMCJ2016-52 pp.13-18 |
| EMCJ | 2016-04-15 14:20 |
Ishikawa | Kanazawa Univ. | Formulation of Single Conductor Line with External Excitation and Radiation Takashi Hisakado, Takuya Kimura, Tohlu Matsushima, Osami Wada (Kyoto Univ.) EMCJ2016-4 |
[more] | EMCJ2016-4 pp.17-22 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2015-10-23 14:20 |
Miyagi | Sakura Hall, Katahira Campus, Tohoku Univ. | Expression of radiation loss on single conductor line using self-induced current by electric-field from terminals Takuya Kimura, Takashi Hisakado, Tohlu Matsushima, Osami Wada (Kyoto Univ.) EMCJ2015-78 MW2015-117 EST2015-88 |
A novel circuit model of a single conductor transmission line is proposed to express current propagation with effect of ... [more] | EMCJ2015-78 MW2015-117 EST2015-88 pp.117-122 |
| EMCJ | 2015-07-09 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Correlation between Immunity Behavior and Internal Terminal Voltage of LDO Regulator Circuits Hidetoshi Miyahara, Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-33 |
Predicting undesired behavior of IC caused by conducted electromagnetic disturbances at a design stage of electronic pro... [more] | EMCJ2015-33 pp.13-18 |
| EMCJ, IEE-EMC, IEE-MAG | 2015-06-26 15:20 |
Overseas | KMITL, Thailand | Macro model of LDO voltage regulator for estimation of immunity to conducted disturbance Tohlu Matsushima, Nobuaki Ikehara, Hidetoshi Miyahara, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2015-30 |
In this report, an ICIM-CI model, which is discussed in IEC, for evaluation of IC immunity is described. In addition, a ... [more] | EMCJ2015-30 pp.73-78 |
| NLP, CCS | 2015-06-11 15:55 |
Tokyo | Waseda Univerisity | Analysis of Errors due to Timing Desynchronization in the Peer-to-Peer Energy Transfer System Daniel Kiss, Takuya Edagawa, Takashi Hisakado, Osami Wada (Kyoto Univ.) NLP2015-52 CCS2015-14 |
[more] | NLP2015-52 CCS2015-14 pp.79-84 |
| EMCJ, IEE-EMC, MW, EST [detail] | 2014-10-24 15:20 |
Akita | Akita Prefectural Univ. | Equivalent circuit model of meta-atom with radiation loss caused by retardation Katsuya Ohishi, Takashi Hisakado, Osami Wada (Kyoto Univ) EMCJ2014-66 MW2014-122 EST2014-80 |
Metamaterials are artificial materials and they produce electromagnetic phenomena which do not occur in nature.The metam... [more] | EMCJ2014-66 MW2014-122 EST2014-80 pp.135-140 |
| EMCJ, EST | 2014-09-12 13:00 |
Hokkaido | Kitami Inst. Technology | Estimation Method of Packet Error Rate Considering Pulse Duration of Burst Disturbance Kazuhiro Takaya (NTT), Daisuke Tomita, Kouki Umeda, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2014-36 EST2014-50 |
[more] | EMCJ2014-36 EST2014-50 pp.29-34 |
| EMCJ | 2014-07-10 13:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Packet Error Rate Estimation of Direct-Sequence Spread-Spectrum Communication System Considering Frequency of a Narrow-Band Disturbance Daisuke Tomita, Kouki Umeda (Kyoto Univ.), Kazuhiro Takaya (NTT/Kyoto Univ.), Masakatsu Ogawa (Sophia Univ.), Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2014-17 |
A method to estimate the degree of quality degradation of digital wireless communication by measuring amplitude probabil... [more] | EMCJ2014-17 pp.1-6 |
| MW | 2014-05-22 16:45 |
Kyoto | Doshisha Univ. | Expression of Power Flow with Electromagnetic Potential in Traveling Current Model Takashi Hisakado, Akira Hagirawa, Osami Wada (Kyoto Univ.) MW2014-35 |
[more] | MW2014-35 pp.67-72 |
| EMCJ | 2013-07-11 12:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Impedance Balance Control for Suppression of Substrate Noise Coupling in CMOS IC Masaaki Maeda, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ) EMCJ2013-30 |
Simultaneous switching current generated by operation of a CMOS circuit is injected into the CMOS substrate, and causes ... [more] | EMCJ2013-30 pp.15-20 |
| MW | 2013-05-30 16:45 |
Kyoto | Ryukoku Univ. | Equivalent Circuit of Metamaterial Composed of Conducting Spheres Connected by Conducting Wires Takashi Hisakado, Keisuke Yoshida, Osami Wada (Kyoto Univ.) MW2013-14 |
[more] | MW2013-14 pp.23-28 |
| EMCJ | 2013-04-12 13:45 |
Okayama | Okayama Univ. | Improvement of Reproducibility of DPI Method to Quantify RF Conducted Immunity of Voltage Regulator Nobuaki Ikehara, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2013-4 |
In recent years, immunity of a voltage regulator which supplies constant voltage to electronic circuits becomes increas... [more] |
EMCJ2013-4 pp.19-24 |
| EST, EMCJ, IEE-EMC [detail] | 2012-10-25 13:35 |
Miyagi | Tohoku Gakuin University(Tagajo Campus) | LECCS-core Model Representing the Effect of Fluctuations in Supply Voltage by High-Frequency Current Ayumu Izuhara, Teruyoshi Yamasaki, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2012-69 EST2012-53 |
For simulating high-frequency power-supply currents generated by an LSI chip, EMC macro-model called LECCS model compose... [more] | EMCJ2012-69 EST2012-53 pp.31-36 |
| EST, EMCJ, IEE-EMC [detail] | 2012-10-25 14:00 |
Miyagi | Tohoku Gakuin University(Tagajo Campus) | Modeling of single conductor transmission line and its excitation by external incident-field Takashi Hisakado, Kohe Shimizu, Osami Wada (Kyoto Univ.) EMCJ2012-70 EST2012-54 |
[more] | EMCJ2012-70 EST2012-54 pp.37-42 |
| EMCJ | 2012-07-19 13:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Equivalent Circuit Models of Capacitance and Inductance at Resonance Based on Electric and Magnetic Energy Taiki Nishimoto, Rikiya Asai, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2012-34 |
In high-frequency circuits, conductive planes are preferably used to stabilize electric potential. However, their large ... [more] | EMCJ2012-34 pp.13-18 |
| NLP | 2011-11-11 11:25 |
Okinawa | Miyako Island Marine Terminal | Singular Points in Periodic Solution of Nonlinear Circuit Equation with Complex Variable Hiroki Tsukida, Takashi Hisakado (Kyoto Univ.) NLP2011-115 |
[more] | NLP2011-115 pp.129-133 |
| EMCJ, IEE-EMC | 2011-06-24 10:05 |
Kyoto | Kyoto Univ. | Package-Common-Mode Resonance Caused by Parasitic Capacitor between Package and Printed Circuit Board Tohlu Matsushima, Nobuo Hirayama, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2011-34 |
[more] | EMCJ2011-34 pp.1-6 |
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