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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
MW, ED 2019-01-18
11:05		 Tokyo Hitachi, Central Research Lab. Investigation of the Pulsed-IV Degradation Mechanism of GaN-HEMT under High Temperature Storage Tests
Yasunori Tateno (Sumitomo Electric), Yasuyo Kurachi (Sumitomo Electric Device Innovations), Hiroshi Yamamoto, Takashi Nakabayashi (Sumitomo Electric) ED2018-82 MW2018-149		 The purpose of this study is to investigate the physical mechanism of pulsed-IV degradation under high temperature stora... [more] ED2018-82 MW2018-149
pp.71-74
OPE, LQE 2014-06-20
15:15		 Tokyo   Development of a Compact 224Gb/s DP-16QAM Modulator Module with Linear Driver ICs
Taizo Tatsumi, Naoki Itabashi, Tomoko Ikagawa, Naoya Kono, Morihiro Seki, Keiji Tanaka, Kazuhiro Yamaji, Yasushi Fujimura, Katsumi Uesaka, Takashi Nakabayashi, Hajime Shoji, Shoichi Ogita (SEI) OPE2014-18 LQE2014-23		 The digital coherent transmission technology using multi-level modulation has been considered to be a promising candidat... [more] OPE2014-18 LQE2014-23
pp.27-30
OPE, CPM, R 2009-04-17
13:40		 Tokyo Kikai-Shinko-Kaikan Bldg. Electrostatic-Discharge Tolerance of AlGaInAs Laser Diodes
Hiroyuki Ichikawa, Chie Fukuda, Shinji Matsukawa, Kotaro Hamada, Nobuyuki Ikoma, Takashi Nakabayashi (Sumitomo Electric Industries, Ltd.) R2009-2 CPM2009-2 OPE2009-2		 This is a report on electrostatic discharge (ESD)-induced degradation of AlGaInAs/InP laser diodes. We found that the do... [more] R2009-2 CPM2009-2 OPE2009-2
pp.7-10
CPM, OPE, R 2007-04-20
15:45		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation analysis of GaInAsP/InP laser diode
Hiroyuki Ichikawa, Masashi Ito, Chie Fukuda, Kotaro Hamada, Akira Yamaguchi, Takashi Nakabayashi (Sumitomo Electric Industries) R2007-6 CPM2007-6 OPE2007-6		 ESD-induced degradation is one of the serious reliability problems of GaInAsP/InP LD. We have conducted an analysis on E... [more] R2007-6 CPM2007-6 OPE2007-6
pp.29-33
OPE, R, CPM 2005-04-22
13:50		 Tokyo Kikai-Shinko-Kaikan Bldg. Degradation analysis of GaInAsP/InP laser diodes
Kotaro Hamada, Hiroyuki Ichikawa, Shinji Matsukawa, Takashi Nakabayashi, Akira Yamaguchi, Takashi Kato (Sumitomo Electric) 		 [more] R2005-3 CPM2005-3 OPE2005-3
pp.11-15
 Results 1 - 5 of 5  /   
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