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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 58 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2017-11-22
16:05
Tokyo Kikai-Shinko-Kaikan Bldg. Efficient Evaluation Method for Information Leakage of Cryptographic Devices Based on Frequency Selection
Airi Sugimoto (Tohoku Univ.), Daisuke Fujimoto, Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-75
Evaluating electromagnetic information leakage from a cryptographic device takes a considerable amount of time because o... [more] EMCJ2017-75
pp.63-66
EMD 2017-11-17
13:20
Tokyo The University of Electro-Communications The influence of contact conditions of gap on the frequency characteristics of the transmission line
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2017-47
When a connector connecting electric devices has loose contact or degradation over time, it causes contact failure. Prev... [more] EMD2017-47
pp.27-30
ISEC 2017-09-04
12:10
Tokyo Kikai-Shinko-Kaikan Bldg. A Lower Bound on the Number of Shuffles for Commited-Format AND Protocols
Daiki Miyahara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2017-43
(To be available after the conference date) [more] ISEC2017-43
pp.15-22
EMCJ, IEE-EMC, IEE-MAG 2017-05-18
14:40
Overseas Nanyang Technological University [Poster Presentation] Fundamental Study on the Effect of Contact Condition at Gap of Transmission Line on Transmission Characteristic
Kenji Aihara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-8
When a connector of an information transmission cable has loose contact or degradation over time, the effect may lead to... [more] EMCJ2017-8
pp.3-4
EMCJ, IEE-EMC, IEE-MAG 2017-05-18
14:43
Overseas Nanyang Technological University [Poster Presentation] A Method of Fault Detection in Encryption Device Based on Leaked EM Information from Adder Circuit
Naoto Saga (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2017-9
In this study, we observe leaked EM information radiated from an encryption device to estimate a timing of fault caused ... [more] EMCJ2017-9
pp.5-6
ISEC 2017-05-12
10:50
Tokyo Kikai-Shinko-Kaikan Bldg. A Note on the Numbers of Cards Required to Make Copied Commitments
Daiki Miyahara (Tohoku Univ.), Yu-ichi Hayashi (NAIST), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2017-3
Card-based cryptography performs secure multi-party computation with black and red cards. Usually, a Boolean value is en... [more] ISEC2017-3
pp.15-22
ISEC, LOIS, SITE 2016-11-07
14:30
Fukui Community Hall & AOSSA Mall, Fukui Applications of Card-Based Cryptography to Education
Takaaki Mizuki (Tohoku Univ.) ISEC2016-53 SITE2016-43 LOIS2016-31
(To be available after the conference date) [more] ISEC2016-53 SITE2016-43 LOIS2016-31
pp.13-17
ISEC 2016-09-02
09:45
Tokyo Kikai-Shinko-Kaikan Bldg. A Note on Secure Execution of Random Bisection Cut
Itaru Ueda, Akihiro Nishimura (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) ISEC2016-38
Using a deck of cards, we can realize a secure computation. Especially, since a random bisection cut was devised in 2009... [more] ISEC2016-38
pp.1-7
EMCJ, IEE-EMC, IEE-MAG 2016-06-02
13:30
Overseas NTU, Taiwan [Poster Presentation] Study on Side-Channel Analysis Based on Asynchronous Measurement
Airi Sugimoto (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2016-24
Previous researches about Correlation Power Analysis (CPA) have been presupposed to use a trigger signal to measure side... [more] EMCJ2016-24
pp.21-22
EMCJ, IEE-EMC, IEE-MAG 2016-06-02
13:33
Overseas NTU, Taiwan [Poster Presentation] Study on Fault Sensitivity Analysis of Cryptographic Device under IEMI
Takuya Itoh (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2016-43
The existing intentional electromagnetic interference (IEMI) fault injection method based on continuous sinusoidal waves... [more] EMCJ2016-43
pp.83-84
EMD 2015-11-06
12:40
Miyagi Tohoku University, School of engineering, Aoba memorial hall Estimation of Inductance at Surface Structure in Contact Surfaces of Coaxial Connector
Tomoya Sato (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2015-81
When a connector has contaminated surfaces or weak contact force, nonuniform current distribution between the real conta... [more] EMD2015-81
pp.77-82
EMCJ 2015-07-09
16:40
Tokyo Kikai-Shinko-Kaikan Bldg. Feasibility of Fault Injection Time Estimation Using EM Leakage from Cryptographic Devices
Ko Nakamaura (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2015-43
 [more] EMCJ2015-43
pp.73-78
EMCJ, IEE-EMC, IEE-MAG 2015-06-26
13:00
Overseas KMITL, Thailand [Poster Presentation] Effect of Clock Frequencies on EM Information Leakage from Cryptographic Devices
Megumi Saito (Tohoku Univ.), Yu-ichi Hayashi (Tohoku Gakuin Univ.), Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2015-24
 [more] EMCJ2015-24
pp.45-47
IA, IPSJ-IOT, SITE [detail] 2015-03-05
13:25
Fukushima   Experimental Evaluation of OpenFlow Network for High-quality Video Streaming Optimized by Bandwidth Efficiency
Shoichi Ando, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) SITE2014-61 IA2014-93
Real-time high-quality video streaming for multiple receivers needs low latency, jitter and wide available bandwidth. In... [more] SITE2014-61 IA2014-93
pp.31-34
ISEC, IT, WBS 2015-03-03
10:30
Fukuoka The University of Kitakyushu A Note on Secure Computations with Commercially Available Playing Cards
Takaaki Mizuki (Tohoku Univ.) IT2014-90 ISEC2014-103 WBS2014-82
It is known that Secure Multi-Party Computations can be conducted using a number of physical cards with identical backs,... [more] IT2014-90 ISEC2014-103 WBS2014-82
pp.179-186
EMD 2014-11-30
14:00
Hokkaido Chitose Cultural Center Fundamental Study on a Mechanism of Increased Inductance due to Connector Contact Failure
Tomoya Sato, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2014-89
Electromagnetic radiation occurs at the contact boundary surface of a coaxial connector with insufficient torque because... [more] EMD2014-89
pp.139-142
IA 2014-11-27
13:25
Tottori Green-Squalle Sekigane (Tottori) Basic Study on the Method for Real-Time Video Streaming with Low Latency and High Bandwidth Efficiency
Shoichi Ando, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) IA2014-68
In this report, we proposed the method for high-quality video streaming with low latency and high bandwidth efficiency. ... [more] IA2014-68
pp.37-40
ISEC, LOIS, SITE 2014-11-21
14:15
Hyogo   Card-based Generation of Random Permutations without Fixed Points
Rie Ishikawa, Eikoh Chida (NIT, Ichinoseki Colleage), Takaaki Mizuki (Tohoku Univ.) ISEC2014-58 SITE2014-49 LOIS2014-28
Consider a scenario where there are $n$ players who want to exchange gifts.
That is, we want to generate a random permu... [more]
ISEC2014-58 SITE2014-49 LOIS2014-28
pp.13-18
EMCJ, IEE-EMC, MW, EST [detail] 2014-10-23
10:25
Akita Akita Prefectural Univ. Effect of Precisely Timed Intentional Electromagnetic Interference on Internal Operation in Cryptographic Device
Mizuki Kobayashi, Yu-ichi Hayashi, Naofumi Homma, Takaaki Mizuki, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-46 MW2014-102 EST2014-60
This paper presents a new intentional electromagnetic interference (IEMI) fault-injection method that can inject transie... [more] EMCJ2014-46 MW2014-102 EST2014-60
pp.11-15
EMCJ 2014-07-10
15:45
Tokyo Kikai-Shinko-Kaikan Bldg. Feasibility of Fault-injected Timing Identification for Actual Cryptographic Devices Using Side-channel Information
Ko Nakamaura, Yu-ichi Hayashi, Takaaki Mizuki, Naofumi Homma, Takafumi Aoki, Hideaki Sone (Tohoku Univ.) EMCJ2014-23
The intentional electromagnetic interference (IEMI) fault-injection method using continuous sine waves causes random-byt... [more] EMCJ2014-23
pp.37-42
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