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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| NS | 2014-10-17 11:35 |
Shimane | Matsue Terrsa | Performance Evaluation of One-to-Many Content Distribution Method Suitable for Wireless LAN with High Node Density Norio Yamagaki, Bounpadith Kannhavong, Shunichi Kinoshita, Hirofumi Ueda, Norihito Fujita, Kazuaki Nakajima (NEC)  NS2014-127 |
When the availability of carriers' mobile phone line is restricted such as the time of a disaster, etc., Wireless LAN (W... [more] | NS2014-127 pp.129-134 |
| NS, IN (Joint) |
2014-03-07 14:50 |
Miyazaki | Miyazaki Seagia | Evaluation of a One-to-Many Content Delivery System using Wireless LAN Ad Hoc Communication in High-Density Node Environments Shunichi Kinoshita, Hirofumi Ueda, Norio Yamagaki, Kazuaki Nakajima, Norihito Fujita (NEC) NS2013-277 |
At a time of disaster, it is important to share information such as the disaster status, recovery status, or safety info... [more] | NS2013-277 pp.585-590 |
| NS, CQ, ICM, NV (Joint) |
2013-11-14 15:35 |
Nagasaki | Goto Islands | [Invited Talk]
Network Traffic Estimation and Prediction Technologies for Improving User-perceived Quality Kozo Satoda, Takashi Oshiba (NEC), Hiroshi Yoshida (NEC/TITECH), Kazuaki Nakajima (NEC) NS2013-120 CQ2013-56 ICM2013-28 |
[more] | NS2013-120 CQ2013-56 ICM2013-28 pp.29-34(NS), pp.29-34(CQ), pp.31-36(ICM) |
| NS, CS, IN (Joint) |
2013-09-13 14:15 |
Miyagi | Tohoku Univ. Research Institute of Electrical Communication 2gokan | A Method Correcting Minimum RTT of TCP Congestion Control in Mobile Networks Toru Osuga, Kazuaki Nakajima (NEC) NS2013-88 |
[more] | NS2013-88 pp.87-92 |
| SDM | 2009-06-19 15:40 |
Tokyo | An401・402 Inst. Indus. Sci., The Univ. of Tokyo | Intrinsic Correlation between Mobility Reduction and Vt shift due to Interface Dipole Modulation in HfSiON/SiO2 stack by La or Al addition Kosuke Tatsumura, Takamitsu Ishihara, Seiji Inumiya, Kazuaki Nakajima, Akio Kaneko, Masakazu Goto, Shigeru Kawanaka, Atsuhiro Kinoshita (Toshiba Corp.) SDM2009-39 |
Intrinsic correlation between mobility reduction by remote Coulomb scattering (RCS) and threshold voltage shift (ΔVt), b... [more] | SDM2009-39 pp.71-76 |
| ICD, SDM | 2008-07-18 15:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Impact of Tantalum Composition in TaCx/HfSiON Gate Stack on Device Performance of Aggressively Scaled CMOS Devices with SMT and Strained CESL Masakazu Goto, Kosuke Tatsumura, Shigeru Kawanaka, Kazuaki Nakajima, Reika Ichihara, Yasuhito Yoshimizu, Hiroyuki Onoda, Koji Nagatomo, Toshiyuki Sasaki, Takashi Fukushima, Akiko Nomachi, Seiji Inumiya, Tomonori Aoyama, Masato Koyama, Yoshiaki Toyoshima (Toshiba Corp.) SDM2008-147 ICD2008-57 |
We report TaCx/HfSiON gate stack CMOS device with simplified gate 1st process from the viewpoints of fixed charge genera... [more] | SDM2008-147 ICD2008-57 pp.109-114 |
| ICD, SDM | 2007-08-24 10:20 |
Hokkaido | Kitami Institute of Technology | [Special Invited Talk]
Effect of metal-gate/high-k on characteristics of MOSFETs for 32nm CMOS and beyond Masato Koyama, Masahiro Koike, Yuuichi Kamimuta, Masamichi Suzuki, Kosuke Tatsumura, Yoshinori Tsuchiya, Reika Ichihara, Masakazu Goto, Koji Nagatomo, Atsushi Azuma, Shigeru Kawanaka, Kazuaki Nakajima, Katsuyuki Sekine (Toshiba Corp.) SDM2007-159 ICD2007-87 |
In this paper, influences of metal-gate and high-k gate dielectric application on MOSFET (32nm node and beyond) characte... [more] | SDM2007-159 ICD2007-87 pp.101-106 |
| ICD, SDM | 2006-08-18 10:15 |
Hokkaido | Hokkaido University | Suppression effects of threshold voltage variation with Ni FUSI gate electrode for 45nm node and beyond LSTP and SRAM devices Yasunori Okayama, Tomohiro Saito, Aname Oishi, Kazuaki Nakajima, Kouji Matsuo, Syuichi Taniguchi, Takatoshi Ono, Kazuhiro Nakayama, Ryota Watanabe, Ayumi Eiho, Taiki Komoda, Taiki Kimura, Mssahumi Hamaguchi, Yoichi Takekawa, Tomonori Aoyama (TOSHIBA) |
[more] | SDM2006-145 ICD2006-99 pp.115-120 |
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