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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
PRMU, MVE, IPSJ-CVIM [detail] 2018-01-18
09:55		 Osaka  
Seina Kamada (Kyushu Univ.), Taisuke Sato, Toshiharu Suzuki (Hokkaido Univ.), Seiichi Uchida (Kyushu Univ.) PRMU2017-113 MVE2017-34		 (To be available after the conference date) [more] PRMU2017-113 MVE2017-34
pp.9-14
SIS, IPSJ-AVM 2014-09-12
09:30		 Yamagata SHONAI INDUSTRIAL PROMOTION CENTER A platform realizing fast retrieval of parent-child tree of containers and inner objects over EPCIS events
Yuki Sato, Taisuke Sato, Jin Mitsugi, Osamu Nakamura, Jun Murai (Keio Univ.) SIS2014-61		 EPCIS is one of the standards defined in EPCglobal Architecture Framework.
EPCIS is a repository service which records ... [more]		 SIS2014-61
pp.67-72
SIS, IPSJ-AVM 2014-09-12
10:20		 Yamagata SHONAI INDUSTRIAL PROMOTION CENTER Time synchronization with sensor data correlation
Yuichiro Aoki, Yuki Sato, Taisuke Sato, Jin Mitsugi, Osamu Nakamura, Jun Murai (Keio Univ.) SIS2014-63		 This report proposes a method to determine the absolute time of a sensor event in a sensor device which does not have cl... [more] SIS2014-63
pp.77-80
IBISML 2010-06-15
16:05		 Tokyo Takeda Hall, Univ. Tokyo An EM algorithm on binary decision diagrams with order encoding for propositional logic-based probabilistic models
Masakazu Ishihata, Yoshitaka Kameya, Taisuke Sato (Tokyo Inst. of Tech.), Shin-ichi Minato (Hokkaido Univ) IBISML2010-23		 We propose an EM algorithm on Binary Decision Diagrams (BDDs) with order encoding for propositional logic-based probabil... [more] IBISML2010-23
pp.155-165
PN, OPE, EMT, LQE 2009-01-29
10:35		 Kyoto Kyoto Institute Technology (Matsugasaki Campus) Si-wire waveguide integrated device
Haruhiko Yoshida, Kazuya Ohira, Taisuke Sato, Rei Hashimoto, Norio Iizuka, Nobuo Suzuki, Mizunori Ezaki (Toshiba) PN2008-46 OPE2008-149 LQE2008-146		 Silicon photonics on an SOI wafer or chip, which enables miniaturized optical interconnection down to submicron scale ut... [more] PN2008-46 OPE2008-149 LQE2008-146
pp.21-26
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