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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2014-01-29
13:55		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Analysis of Transistor Characteristics in Distribution Tails beyond ±5.4σ of 11 Billion Transistors
Tomoko Mizutani, Anil Kumar, Toshiro Hiramoto (Univ. of Tokyo) SDM2013-142		 Transistors in distribution tails of 11G (11 billion) transistors were intensively measured and compared with transistor... [more] SDM2013-142
pp.31-34
SDM, ICD 2013-08-02
09:00		 Ishikawa Kanazawa University SRAM Cell Stability Parameter: Noise Margin or Vmin?
Anil Kumar, Takuya Saraya (Univ. of Tokyo), Shinji Miyano (STARC), Toshiro Hiramoto (Univ. of Tokyo) SDM2013-74 ICD2013-56		 This paper reports the comprehensive analysis of the stability parameter of SRAM cells. Results show that even if noise ... [more] SDM2013-74 ICD2013-56
pp.43-46
ICD, SDM 2012-08-02
10:00		 Hokkaido Sapporo Center for Gender Equality, Sapporo, Hokkaido Self-Improvement of Cell Stability in SRAM by Post Fabrication Technique
Anil Kumar, Takuya Saraya (Univ. of Tokyo), Shinji Miyano (STARC), Toshiro Hiramoto (Univ. of Tokyo) SDM2012-65 ICD2012-33		 The post fabrication technique for self-improvement of SRAM cell stability is validated by experiment using 1k DMA SRAM ... [more] SDM2012-65 ICD2012-33
pp.13-16
SDM, ICD 2011-08-26
09:00		 Toyama Toyama kenminkaikan Evaluation of Variability in High-k/Metal-Gate MOSFET using Takeuchi Plot
Tomoko Mizutani, Anil Kumar (Univ. of Tokyo), Akio Nishida, Kiyoshi Takeuchi, Satoshi Inaba, Shiro Kamohara (MIRAI-Selete), Kazuo Terada (Hiroshima City Univ.), Tohru Mogami (MIRAI-Selete), Toshiro Hiramoto (Univ. of Tokyo/MIRAI-Selete) SDM2011-83 ICD2011-51		  [more] SDM2011-83 ICD2011-51
pp.65-68
SDM, ICD 2011-08-26
09:25		 Toyama Toyama kenminkaikan Statistical Analysis of DIBL and Current-Onset Voltage (COV) Variability in Scaled MOSFETs
Anil Kumar, Tomoko Mizutani (Univ. of Tokyo), Akio Nishida, Kiyoshi Takeuchi, Satoshi Inaba, Shiro Kamohara (MIRAI-Selete), Kazuo Terada (Hiroshima City Univ.), Tohru Mogami (MIRAI-Selete), Toshiro Hiramoto (Univ. of Tokyo/MIRAI-Selete) SDM2011-84 ICD2011-52		  [more] SDM2011-84 ICD2011-52
pp.69-73
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