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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2022-07-14
(Primary: On-site, Secondary: Online)
3D modeling of USB Type-C connector and signal transmission analysis by FDTD
Hayato Ide (NIT,Nagano College), Taiki Kitazawa, Youngwoo Kim, Yuitch Hayashi (NAIST), Takashi Kasuga (NIT,Nagano College)
(To be available after the conference date) [more]
EMCJ 2022-06-10
Hokkaido Hokkaido University
(Primary: On-site, Secondary: Online)
Fundamental Study of Electromagnetic Information Leakage Suppression at Printed Circuit Board Power Delivery Network in Cryptographic Devices
Shinpei Wada, Daisuke Fujimoto, Yuichi Hayashi, Youngwoo Kim (NAIST) EMCJ2022-27
 [more] EMCJ2022-27
EMCJ 2022-04-15
(Primary: On-site, Secondary: Online)
Analysis of Crosstalk Suppression by Low-Impedance PDN Using Ultra-Thin and High Dielectric Permittivity Substrates
Taiki Kitazawa, Youngwoo Kim, Daisuke Fujimoto, Yuichi Hayashi (NAIST) EMCJ2022-5
The high impedance power delivery network (PDN) induced crosstalk is caused by the return current discontinuity of signa... [more] EMCJ2022-5
HWS, ICD [detail] 2021-10-19
Online Online Study on Fault Injection into Cryptographic Modules Using Continuous Sinusoidal Waves with Controlled Frequency, Amplitude and Phase
Hikaru Nishiyama, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) HWS2021-43 ICD2021-17
A fault injection attack based on an intentional electromagnetic interference (IEMI) using a continuous sinusoidal wave ... [more] HWS2021-43 ICD2021-17
EMD 2021-03-08
Online Online Fundamental Study on Effect of Surface Roughness of Contact Boundary and Torque Value on High-Frequency Characteristics of Connectors
Hiroyuki Ueda, Shugo Kaji, Daisuke Fujimoto, Youngwoo Kim, Yuichi Hayashi (NAIST) EMD2020-37
Wear occurs on the contact surface due to sliding and vibration of the connector. This increases the contact resistance,... [more] EMD2020-37
EMCJ 2021-01-22
Online Online Construction of 3D Analysis Model due to Signal Transmission Evaluation in Connector
Taiki Kitazawa (NIT,Nagano College), Hiroyuki Ueda, Fujimoto Daisuke, Youngwoo Kim, Hayashi Yuichi (NAIST), Kasuga Takashi (NIT,Nagano College) EMCJ2020-67
As high-speed transmission of big data progresses, Signal Integrity (SI) degradation and Electromagnetic Interference (E... [more] EMCJ2020-67
EMD 2020-12-04
Online Online Analysis of HDMI Mated Connector Electrical Performance Impacts on a Signal Integrity of the High-speed Digital System
Kim Youngwoo (NAIST) EMD2020-23
 [more] EMD2020-23
EMD 2020-12-04
Online Online Fundamental Evaluation of Impedance Variations in the Connector Caused by High-Frequency Noise Propagation
Hiroyuki Ueda, Shugo Kaji, Youngwoo Kim, Daisuke Fujimoto (NAIST), Taiki Kitazawa, Takashi Kasuga (NIT,Nagano College)), Yuichi Hayashi (NAIST) EMD2020-24
As the operating frequency of information devices increases, the noise generated by the device is also becoming broadban... [more] EMD2020-24
 Results 1 - 8 of 8  /   
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