IEICE Technical Committee Submission System
Conference Schedule
Online Proceedings
[Sign in]
Tech. Rep. Archives
    [Japanese] / [English] 
( Committee/Place/Topics  ) --Press->
 
( Paper Keywords:  /  Column:Title Auth. Affi. Abst. Keyword ) --Press->

All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 4 of 4  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
LQE 2016-12-16
11:40
Tokyo Kikai-Shinko-Kaikan Bldg. [Memorial Lecture] Determination of internal quantum efficiency and recombination lifetime by simultaneous photo-acoustic and photoluminescence measurements in GaN
Kohei Kawakami, Takashi Nakano, Atsushi A. Yamaguchi (Kanazawa Inst. Tech.) LQE2016-99
Internal quantum efficiency (IQE) is usually estimated from temperature dependence of photoluminescence (PL) intensity b... [more] LQE2016-99
pp.15-20
ED, LQE, CPM 2015-11-26
15:30
Osaka Osaka City University Media Center Analysis of radiative and non-radiative lifetimes in GaN using accurate internal-quantum-efficiency values estimated by simultaneous photoluminescence and photo-acoustic measurements
Kohei Kawakami, Takashi Nakano, Atsushi A Yamaguchi (KIT) ED2015-77 CPM2015-112 LQE2015-109
Radiative and non-radiative recombination lifetimes in III-nitride semiconductors are usually estimated from time-resolv... [more] ED2015-77 CPM2015-112 LQE2015-109
pp.49-52
ED, LQE, CPM 2015-11-26
15:55
Osaka Osaka City University Media Center Determination of internal quantum efficiency in GaN by simultaneous measurements of photoluminescence and photo-acoustic signals
Takashi Nakano, Kouhei Kawakami, Atsushi A. Yamaguchi (KIT) ED2015-78 CPM2015-113 LQE2015-110
Internal quantum efficiency (IQE) is usually estimated from temperature dependence of photoluminescence (PL) intensity b... [more] ED2015-78 CPM2015-113 LQE2015-110
pp.53-58
LQE, CPM, EMD, OPE, R 2012-08-23
10:25
Miyagi Tohoku Univ. Random-Number-Generation Using a VCSEL's Frequency Noise Characteristic
Kohei Kawakami, Shinya Maehara, Kohei Doi, Hideaki Arai, Takanobu Kondo, Naoya Shimizu, Takashi Sato, Shuichi Sakamoto, Yasuo Ohdaira, Masashi Ohkawa (Niigata Univ.) R2012-22 EMD2012-28 CPM2012-53 OPE2012-60 LQE2012-26
The pseudo-random number is normally used for large-scale simulation and encryption of communication. On the other hand,... [more] R2012-22 EMD2012-28 CPM2012-53 OPE2012-60 LQE2012-26
pp.9-12
 Results 1 - 4 of 4  /   
Choose a download format for default settings. [NEW !!]
Text format pLaTeX format CSV format BibTeX format
Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan