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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 28 of 28 [Previous]  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2009-12-04
11:20
Nara NAIST Characteristics of hot hole injection, trapping, and detrapping in gate oxide of poly-Si TFTs
Yoshinari Kamakura (Osaka Univ.), Takashi Himukashi (Osaka Univ./Kansai Univ.), Hiroshi Tsuji, Kenji Taniguchi (Osaka Univ.) SDM2009-157
The hysteresis observed in the transfer characteristics of n-channel poly-Si TFTs are experimentally investigated and po... [more] SDM2009-157
pp.35-38
SDM 2009-11-12
14:40
Tokyo Kikai-Shinko-Kaikan Bldg. Surface-Potential-Based Drain Current Model for Thin-Film Transistors
Hiroshi Tsuji (Osaka Univ/JST), Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.) SDM2009-138
A new surface-potential-based drain current model for polycrystalline silicon thin-film transistors (poly-Si TFTs) is pr... [more] SDM2009-138
pp.19-22
SDM 2009-11-13
10:00
Tokyo Kikai-Shinko-Kaikan Bldg. Impact of Self-Heating Effect on the Electrical Characteristics of Nanoscale Transistors
Yoshinari Kamakura, Nobuya Mori (Osaka Univ./JST), Kenji Taniguchi (Osaka Univ.) SDM2009-142
Hot phonon generation and its impact on the current conduction in nanoscale Si-MOSFETs are investigated using numerical ... [more] SDM2009-142
pp.39-44
SDM [detail] 2008-11-14
15:00
Tokyo Kikai-Shinko-Kaikan Bldg. A Quantum Mechanical Study of Effect of Single Attractive Ions on Electron Transport in Nanoscale Transistors
Yoshinari Kamakura, Gennady Mil'nikov, Nobuya Mori (Osaka Univ.), Tatsuya Ezaki (Hiroshima Univ.) SDM2008-179
A comprehensive and rigorous study of the impact of single attractive ion in undoped channel MGFETs is presented by usin... [more] SDM2008-179
pp.61-66
SDM 2007-12-14
11:00
Nara Nara Institute Science and Technology Analysis of Capacitance-Voltage Characteristics of Poly-Si TFTs using Device Simulation
Tsuyoshi Kuzuoka, Hiroshi Tsuji, Masaharu Kirihara, Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.) SDM2007-225
Capacitance-voltage characteristics of short channel Poly-Si TFTs containing only a single grain boundary were investiga... [more] SDM2007-225
pp.15-18
SDM, VLD 2007-10-30
10:00
Tokyo Kikai-Shinko-Kaikan Bldg. Simulation on the electric conduction of semiconductor with arrayed dopant
Tomohide Terunuma, Takanobu Watanabe (Waseda Univ.), Takahiro Shinada (ASMeW), Yoshinari Kamakura, Kenji Taniguchi (Osaka Univ.), Iwao Ohdomari (Waseda Univ.) VLD2007-50 SDM2007-194
 [more] VLD2007-50 SDM2007-194
pp.1-4
SDM, VLD 2007-10-30
10:50
Tokyo Kikai-Shinko-Kaikan Bldg. Coarse-grain quantum transport simulation of ultra-small MOSFETs
Gennady Mil'nikov, Nobuya Mori, Yoshinari Kamakura (Osaka Univ.), Tatsuya Ezaki (Hiroshima Univ.) VLD2007-52 SDM2007-196
 [more] VLD2007-52 SDM2007-196
pp.11-14
SDM, VLD 2007-10-30
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. Validation of the Effect of Full Stress Tensor in HoleTransport in Strained 65nm-node pMOSFETs
Eiji Tsukuda (Renesas), Yoshinari Kamakura (Osaka Univ.), Hiroyuki Takashino, Takeshi Okagaki, Tetsuya Uchida, Takashi Hayashi, Motoaki Tanizawa, Katsumi Eikyu, Shoji Wakahara, Kiyoshi Ishikawa, Osamu Tsuchiya, Yasuo Inoue (Renesas), Kenji Taniguchi (Osaka Univ.) VLD2007-59 SDM2007-203
We have developed a system consisting of a full-3D process simulator for stress calculation and k·pband calculation... [more] VLD2007-59 SDM2007-203
pp.43-46
 Results 21 - 28 of 28 [Previous]  /   
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