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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2021-02-05
14:25		 Online Online Fault Coverage Estimation Method in Multi-Cycle Testing
Norihiro Nakaoka, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas Electronics Corp.) DC2020-75		  [more] DC2020-75
pp.36-41
DC 2020-02-26
11:35		 Tokyo   Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing
Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89		 For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] DC2019-89
pp.19-24
VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC
(Joint) [detail]		 2019-11-14
16:10		 Ehime Ehime Prefecture Gender Equality Center Analysis of Fault Detection Degradation Issue in Multi-cycle Test Scheme using Probabilistic Evaluation Method
Norihiro Nakaoka, Tomoki Aono, Sohshi Kudoh, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) VLD2019-45 DC2019-69		 In order to ensure the functional safety of advanced autonomous driving systems, a power-on self-test
(POST) is require... [more]		 VLD2019-45 DC2019-69
pp.145-150
DC 2019-02-27
14:05		 Tokyo Kikai-Shinko-Kaikan Bldg. FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing
Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79		 Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] DC2018-79
pp.49-54
OPE, MW, MWP, EMT, EST, IEE-EMT [detail] 2011-07-22
09:55		 Hokkaido   Frequency Response Measurement of Half-Wave Voltage and Chirp Parameter of LiNbO3 Intensity Modulators in Low Frequency Range
Kimihiro Toki, Dai Uesaka, Takahiro Yamazaki, Hiroyuki Iwata, Masahisa Yoshikawa, Hiroyuki Toda (Doshisha Univ.), Tetsuya Kawanishi (NICT) MW2011-56 OPE2011-43 EST2011-42 MWP2011-24		  [more] MW2011-56 OPE2011-43 EST2011-42 MWP2011-24
pp.105-108
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