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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2006-01-16
11:30
Fukuoka Kyushu University S-parametesr Modeling Method for Immunity Noise Test Instrumentations
Masahito Hirayama, Noboru Maeda (SOKEN), Kouji Ichikawa, Masashi Inagaki, Yukihiko Sakurai (DENSO)
 [more] EMCJ2005-128
pp.7-10
EMCJ 2004-12-10
16:15
Aichi Nagoya Institute of Technology A Study on Measurement of LSI Immunity for PCB Analysis
Kouji Ichikawa, Yukihiko Sakurai, Masashi Inagaki, Takeshi Matsui (DENSO), Yuichi Mabuchi (Hitachi), Atsushi Nakamura, Toru Hayashi (Renesas Technology)
We have been developing an LSI model for EMS simulation in automotive electronic control units.
PCB immunity was analyz... [more]
EMCJ2004-115
pp.77-82
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