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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD, SDM, ITE-IST [detail] | 2020-08-06 09:30 |
Online | Online | [Invited Talk]
SoC compatible 1T1C FeRAM memory array based on ferroelectric Hf0.5Zr0.5O2
-- Report on 2020 IEEE VLSI Symposia -- Jun Okuno, Takafumi Kunihiro, Kenta Konishi, Fumitaka Sugaya, Yusuke Shuto, Hideki Maemura, Masanori Tsukamoto, Taku Umebayashi (SSS)  SDM2020-1 ICD2020-1 |
[more] | SDM2020-1 ICD2020-1 p.1 |
| SDM | 2020-02-07 16:25 |
Tokyo | Tokyo University-Hongo | [Invited Talk]
Nanophotonics contributions to state-of-the-art CMOS Image Sensors Sozo Yokogawa (SSS) SDM2019-97 |
Recent progress of Back-illuminated CMOS image sensor (BI-CIS), focusing on their pixel improvements with design of opti... [more] | SDM2019-97 pp.39-43 |
| CPSY, DC, IPSJ-ARC (Joint) [detail] |
2018-08-01 18:30 |
Kumamoto | Kumamoto City International Center | Takeharu Ikezoe, Hideharu Amano (Keio Univ.), Junya Akaike, Kimiyoshi Usami, Masaru Kudo (SIT), Keizo Hiraga, Yusuke Shuto, Kojiro Yagami (Sony SS) CPSY2018-32 |
[more] | CPSY2018-32 pp.229-234 |
| VLD, HWS (Joint) |
2018-03-02 10:30 |
Okinawa | Okinawa Seinen Kaikan | Implementation of Reconfigurable Accelerator Cool Mega-Array Using MTJ-based Nonvolatile Flip-Flop Enabling to Verify Stored Data Junya Akaike, Kimiyoshi Usami, Masaru Kudo (SIT), Hideharu Amano, Takeharu Ikezoe (Keio Univ.), Keizo Hiraga, Yusuke Shuto, Kojiro Yagami (Sony SS) VLD2017-122 |
As a method of reducing the power consumption of the flip-flop circuit, there is a nonvolatile flip-flop (NVFF) that ena... [more] | VLD2017-122 pp.199-204 |
| SDM, ICD, ITE-IST [detail] | 2017-07-31 11:15 |
Hokkaido | Hokkaido-Univ. Multimedia Education Bldg. | [Invited Talk]
A Cross Point Cu-ReRAM with a Novel OTS Selector for Storage Class Memory Applications Shuichiro Yasuda, Kazuhiro Ohba, Tetsuya Mizuguchi, Hiroaki Sei, Masayuki Shimuta, Katsuhisa Aratani, Tsunenori Shiimoto, Tetsuya Yamamoto, Takeyuki Sone, Seiji Nonoguchi, Jun Okuno, Akira Kouchiyama, Wataru Otsuka, Keiichi Tsutsui (Sony Semiconductor Solutions) SDM2017-34 ICD2017-22 |
(To be available after the conference date) [more] | SDM2017-34 ICD2017-22 pp.17-20 |
| IMQ | 2017-05-19 13:30 |
Tokyo | Seikei Univ. | Report on Image Quality and System Performance XIV Toshiya Nakaguchi (Chiba Univ.), Mitsuru Maeda (Canon), Shinichiro Saito (Sony) IMQ2017-1 |
Image Quality and System Performance (IQSP) is held at Electronic Imaging, which is an annual comprehensive internationa... [more] | IMQ2017-1 pp.1-7 |
| ICD | 2017-04-21 14:15 |
Tokyo | [Invited Talk]
A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions) ICD2017-18 |
[more] | ICD2017-18 pp.95-98 |
|
| SDM | 2016-10-26 14:00 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
Controlling Metallic Contamination in Advanced ULSI Processing Koichiro Saga (Sony) SDM2016-69 |
Metal impurities dissolved in silicon can cause “recombination centers”, which degrade retention characteristics of DRAM... [more] | SDM2016-69 pp.1-8 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 09:15 |
Osaka | Central Electric Club | [Invited Talk]
Accelerating the Sensing World through Imaging Evolution Yusuke Oike, Hayato Wakabayashi, Tetuo Nomoto (Sony Semiconductor Solutions) SDM2016-48 ICD2016-16 |
This presentation introduces the evolution of image sensors and the future prospect of sensing applications utilizing th... [more] | SDM2016-48 ICD2016-16 p.1 |
| ICD, SDM, ITE-IST [detail] | 2016-08-01 15:25 |
Osaka | Central Electric Club | [Invited Lecture]
A 0.7V 1.5-to-2.3mW GNSS Receiver with 2.5-to-3.8dB NF in 28nm FD-SOI Ken Yamamoto, Kenichi Nakano, Gaku Hidai, Yuya Kondo, Hitoshi Tomiyama, Hideyuki Takano, Fumitaka Kondo, Yusuke Shinohe, Hidenori Takeuchi, Nobuhisa Ozawa (SSS), Shingo Harada, Shinichiro Eto, Mari Kishikawa, Daisuke Ide, Hiroyasu Tagami (Sony LSI Design) SDM2016-52 ICD2016-20 |
[more] | SDM2016-52 ICD2016-20 pp.45-48 |
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