Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2012-07-19 14:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Study of the optimal selection of parts to reduce the power ground plane resonance Hiroyasu Sano (TIRI), Yoshiaki Maruyama (NIS), Akihiro Tokikawa (SANRITZ) EMCJ2012-35 |
(To be available after the conference date) [more] |
EMCJ2012-35 pp.19-21 |
VLD |
2012-03-06 14:00 |
Oita |
B-con Plaza |
A loop pipeling method for irregular nested loops Takashi Takenaka, Kazutoshi Wakabayashi (NEC), Yuka Nakagoshi (NIS) VLD2011-126 |
This paper presents a behavioral synthesis method for pipelining
irregular nested loops. An irregular nested loop is ... [more] |
VLD2011-126 pp.37-42 |
PRMU, IBISML, IPSJ-CVIM [detail] |
2011-09-06 11:00 |
Hokkaido |
|
Object detection based on Multiple Instance LVQ Toshinori Hosoi, Hiroyoshi Miyano, Eiki Ishidera (NEC Infomatec Systems) PRMU2011-74 IBISML2011-33 |
This report presents a classifier's training method "Multiple Instance LVQ" which can be trained by roughly labeled dat... [more] |
PRMU2011-74 IBISML2011-33 pp.145-150 |
IBISML, PRMU, IPSJ-CVIM [detail] |
2010-09-06 11:10 |
Fukuoka |
Fukuoka Univ. |
Learning Vector Quantization Using a Heavy-tailed Distribution Ansatz Hiroyoshi Miyano, Eiki Ishidera (NEC Informatec Systems) PRMU2010-81 IBISML2010-53 |
This paper presents a novel Lerning Vector Quantization (LVQ) algorithm using a heavy-tailed distribution ansatz. LVQ is... [more] |
PRMU2010-81 IBISML2010-53 pp.185-192 |
SDM |
2009-11-13 10:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Carrier Transport Analysis of Strained SiGe/Si-pMOSFETs using Full-band Device Simulation Hiroshi Takeda (NEC Electronics Corp.), Michihito Kawada (NEC Informatec Systems), Kiyoshi Takeuchi, Masami Hane (NEC Electronics Corp.) SDM2009-144 |
Transport characteristics of strained-SiGe on Si channel pMOSFETs is analyzed in detail by full-band device simulation. ... [more] |
SDM2009-144 pp.49-53 |
PRMU |
2008-02-21 15:30 |
Ibaraki |
Univ. of Tsukuba |
[Special Talk]
Toward new development in character recognition Jun Tsukumo (NEC Information Systems,Ltd.) PRMU2007-226 |
Important problems were discussed for character recognition research in the beginning of 1990’s. I would like to introdu... [more] |
PRMU2007-226 pp.69-74 |
SDM, VLD |
2007-10-30 15:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Analysis of strain-dependent hole transport characteristics in bulk Ge-pMOSFETs Hiroshi Takeda (NEC), Takeo Ikezawa, Michihito Kawada (NIS), Masami Hane (NEC) VLD2007-58 SDM2007-202 |
Self-consistent full-band Monte Carlo (with multi-subbands) device simulations were performed to clarify the mechanism o... [more] |
VLD2007-58 SDM2007-202 pp.37-41 |
SDM, VLD |
2007-10-31 15:25 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Modeling of Floating-Body Effect in SOI-MOSFET with Complete Surface-Potential Description Takahiro Murakami, Makoto Ando, Norio Sadachika (Hiroshima Univ.), Takaki Yoshida (NIS), Mitiko Miura-Mattausch (Hiroshima Univ.) VLD2007-68 SDM2007-212 |
[more] |
VLD2007-68 SDM2007-212 pp.41-45 |
IT, ISEC, WBS |
2007-03-16 10:45 |
Gunma |
Gunma Univ. (Kiryu Campus) |
Proposal of P2P network architechture where data acquisition can be controlled Naoki Sasamura, Hidehiko Tanaka (iisec) |
[more] |
IT2006-98 ISEC2006-153 WBS2006-95 pp.75-80 |
SDM, VLD |
2006-09-26 16:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
To be announced Masami Hane, Takeo Ikezawa, Michihito Kawada (NEC), Tatsuya Ezaki (Hiroshima Univ.), Toyoji Yamamoto (MIRAI-ASET) |
Simulation analysis of channel-orientation effects on strained silicon MOSFETs based on a full-band Monte Carlo method c... [more] |
VLD2006-50 SDM2006-171 pp.65-69 |
EMCJ, MW |
2005-10-28 11:10 |
Akita |
Akita University |
Analysis of Multilayered Power-Distribution Planes with Via Structures Using SPICE Naoki Kobayashi, Takashi Harada (NEC), Takahiro Yaguchi (NEC Informatec Systems) |
We describe a new circuit model of multilayered power-distribution planes with via structures used to calculate the volt... [more] |
EMCJ2005-97 MW2005-103 pp.25-30 |
EMCJ |
2005-04-22 16:30 |
Kanagawa |
Shonan Campus, Tokai University |
Power Distribution System Analysis of Printed Circuit Boards Using Circuit Model Including LSI Power Pin Model Takashi Harada, Hiroshi Wabuka, Naoki Kobayashi (NEC), Kenichi Higashiura (AICA), Takahiro Yaguchi (NIS) |
[more] |
EMCJ2005-8 pp.41-45 |