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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 12 of 12  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2012-07-19
14:30
Tokyo Kikai-Shinko-Kaikan Bldg. A Study of the optimal selection of parts to reduce the power ground plane resonance
Hiroyasu Sano (TIRI), Yoshiaki Maruyama (NIS), Akihiro Tokikawa (SANRITZ) EMCJ2012-35
(To be available after the conference date) [more] EMCJ2012-35
pp.19-21
VLD 2012-03-06
14:00
Oita B-con Plaza A loop pipeling method for irregular nested loops
Takashi Takenaka, Kazutoshi Wakabayashi (NEC), Yuka Nakagoshi (NIS) VLD2011-126
This paper presents a behavioral synthesis method for pipelining
irregular nested loops. An irregular nested loop is ... [more]
VLD2011-126
pp.37-42
PRMU, IBISML, IPSJ-CVIM [detail] 2011-09-06
11:00
Hokkaido   Object detection based on Multiple Instance LVQ
Toshinori Hosoi, Hiroyoshi Miyano, Eiki Ishidera (NEC Infomatec Systems) PRMU2011-74 IBISML2011-33
This report presents a classifier's training method "Multiple Instance LVQ" which can be trained by roughly labeled dat... [more] PRMU2011-74 IBISML2011-33
pp.145-150
IBISML, PRMU, IPSJ-CVIM [detail] 2010-09-06
11:10
Fukuoka Fukuoka Univ. Learning Vector Quantization Using a Heavy-tailed Distribution Ansatz
Hiroyoshi Miyano, Eiki Ishidera (NEC Informatec Systems) PRMU2010-81 IBISML2010-53
This paper presents a novel Lerning Vector Quantization (LVQ) algorithm using a heavy-tailed distribution ansatz. LVQ is... [more] PRMU2010-81 IBISML2010-53
pp.185-192
SDM 2009-11-13
10:50
Tokyo Kikai-Shinko-Kaikan Bldg. Carrier Transport Analysis of Strained SiGe/Si-pMOSFETs using Full-band Device Simulation
Hiroshi Takeda (NEC Electronics Corp.), Michihito Kawada (NEC Informatec Systems), Kiyoshi Takeuchi, Masami Hane (NEC Electronics Corp.) SDM2009-144
Transport characteristics of strained-SiGe on Si channel pMOSFETs is analyzed in detail by full-band device simulation. ... [more] SDM2009-144
pp.49-53
PRMU 2008-02-21
15:30
Ibaraki Univ. of Tsukuba [Special Talk] Toward new development in character recognition
Jun Tsukumo (NEC Information Systems,Ltd.) PRMU2007-226
Important problems were discussed for character recognition research in the beginning of 1990’s. I would like to introdu... [more] PRMU2007-226
pp.69-74
SDM, VLD 2007-10-30
15:25
Tokyo Kikai-Shinko-Kaikan Bldg. Analysis of strain-dependent hole transport characteristics in bulk Ge-pMOSFETs
Hiroshi Takeda (NEC), Takeo Ikezawa, Michihito Kawada (NIS), Masami Hane (NEC) VLD2007-58 SDM2007-202
Self-consistent full-band Monte Carlo (with multi-subbands) device simulations were performed to clarify the mechanism o... [more] VLD2007-58 SDM2007-202
pp.37-41
SDM, VLD 2007-10-31
15:25
Tokyo Kikai-Shinko-Kaikan Bldg. Modeling of Floating-Body Effect in SOI-MOSFET with Complete Surface-Potential Description
Takahiro Murakami, Makoto Ando, Norio Sadachika (Hiroshima Univ.), Takaki Yoshida (NIS), Mitiko Miura-Mattausch (Hiroshima Univ.) VLD2007-68 SDM2007-212
 [more] VLD2007-68 SDM2007-212
pp.41-45
IT, ISEC, WBS 2007-03-16
10:45
Gunma Gunma Univ. (Kiryu Campus) Proposal of P2P network architechture where data acquisition can be controlled
Naoki Sasamura, Hidehiko Tanaka (iisec)
 [more] IT2006-98 ISEC2006-153 WBS2006-95
pp.75-80
SDM, VLD 2006-09-26
16:15
Tokyo Kikai-Shinko-Kaikan Bldg. To be announced
Masami Hane, Takeo Ikezawa, Michihito Kawada (NEC), Tatsuya Ezaki (Hiroshima Univ.), Toyoji Yamamoto (MIRAI-ASET)
Simulation analysis of channel-orientation effects on strained silicon MOSFETs based on a full-band Monte Carlo method c... [more] VLD2006-50 SDM2006-171
pp.65-69
EMCJ, MW 2005-10-28
11:10
Akita Akita University Analysis of Multilayered Power-Distribution Planes with Via Structures Using SPICE
Naoki Kobayashi, Takashi Harada (NEC), Takahiro Yaguchi (NEC Informatec Systems)
We describe a new circuit model of multilayered power-distribution planes with via structures used to calculate the volt... [more] EMCJ2005-97 MW2005-103
pp.25-30
EMCJ 2005-04-22
16:30
Kanagawa Shonan Campus, Tokai University Power Distribution System Analysis of Printed Circuit Boards Using Circuit Model Including LSI Power Pin Model
Takashi Harada, Hiroshi Wabuka, Naoki Kobayashi (NEC), Kenichi Higashiura (AICA), Takahiro Yaguchi (NIS)
 [more] EMCJ2005-8
pp.41-45
 Results 1 - 12 of 12  /   
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