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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
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Committee Date Time Place Paper Title / Authors Abstract Paper #
EMD, R 2017-02-17
14:00		 Shiga Omuron Kusatsu Factory Effect of Hardness on Wear and Abrasion Resistance of Silver Plating on Copper Alloy
Shigeru Sawada (SEI), Song-zhu Kure-chu, Rie Nakagawa, Toru Ogasawara, Hitoshi Yashiro (Iwate Uni.), Yasushi Saitoh (AN-Tech) R2016-63 EMD2016-90		 This study is aimed at clarifying the mechanism of wear process for Ag plating with different hardness. The samples of A... [more] R2016-63 EMD2016-90
pp.19-24
EMD 2016-11-03
16:15		 Hyogo Awaji Yumebutai International Conference Center Effect of hardness on wear and abrasion resistance of Silver plating on copper alloy
Shigeru Sawada (AN-Tech), Song-zhu Kure-chu, Rie Nakagawa, Toru Ogasawara, Hitoshi Yashiro (Iwate Uni.), Yasushi Saitoh (AN-Tech) EMD2016-57		 This study is aimed at clarifying the mechanism of wear process for Ag plating. The samples of different hardness Ag pla... [more] EMD2016-57
pp.41-46
EMD 2011-03-04
13:30		 Saitama Nippon Institute of Technology Evaluation of Contact Probe for Contact Resistance Measurement
Satoru Oohira, Soushi Masui, Shigeru Sawada, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (AN-Tech) EMD2010-157		  [more] EMD2010-157
pp.21-24
EMD, R 2011-02-18
13:30		 Shizuoka Shizuoka Univ. (Hamamatsu) Direct Viewing of Current in Contact Area used by Light Emission Diode
Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.) R2010-43 EMD2010-144		  [more] R2010-43 EMD2010-144
pp.7-12
EMD 2011-01-28
13:50		 Tokyo Japan Aviation Electronics Industry,Limited Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts
Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ) EMD2010-137		 It is observed that contact resistance for tin plated contact in automotive connectors increased due to fretting corrosi... [more] EMD2010-137
pp.11-16
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