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Committee Date Time Place Paper Title / Authors Abstract Paper #
PRMU, HIP 2010-03-16
08:55		 Kagoshima Kagoshima Univ. Fault Detection of Human-Operated Systems Based on Whitening and Linear Prediction Analysis
Shinsaku Ozaki, Toshikazu Wada (Wakayama Univ.), Shunji Maeda, Hisae Shibuya (Hitachi) PRMU2009-280 HIP2009-165		 This report presents a method for fault detection of human-operated systems. Industrial plants and other systems can be ... [more] PRMU2009-280 HIP2009-165
pp.275-279
OFT 2010-01-21
17:25		 Okinawa   Basic study of 3D-CSP module for 10 Gbps Ooptical Access System -- Module fabrication and its Transmitter/Receiver characteristics --
Ken'ichi Tanaka, Yasunobu Matsuoka, Kazuhiko Hosomi, Misuzu Sagawa, Toshiki Sugawara (Hitachi, CRL), Yukio Sakikawa, Toshiaki Takai, Shohei Hata (Hitachi, PERL.) OFT2009-75		 We propose 3 Dimension Chip Scale Package(3D-CSP) Bi-directional optical module, as a very small interface with a simple... [more] OFT2009-75
pp.73-76
PRMU 2009-03-14
16:00		 Miyagi Tohoku Institute of Technology Defect detection based on self reference for wafer inspection
Tetsuya Asami, Toshikazu Wada (Wakayama Univ.), Kaoru Sakai, Shunji Maeda (Hitachi, LTD.) PRMU2008-283		  [more] PRMU2008-283
pp.287-292
DC, CPSY 2008-04-23
15:00		 Tokyo Tokyo Univ. Current Status of Impacts and Countermeasures in Environmental Neutron Induced Failures in Electric Systems
Eishi Ibe (PERL) CPSY2008-7 DC2008-7		 Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in
semicon... [more]		 CPSY2008-7 DC2008-7
pp.37-42
ICD 2008-04-18
11:15		 Tokyo   [Invited Talk] Current Status of Impact and Countermeasures in Environmental Neutron Induced Failures in Electric Systems -- Evolution of Multi-Node Upset Issues --
Eishi Ibe (PERL) ICD2008-10		 Environmental neutrons is being widely recognized as the most significant source of a variety of error modes in semicond... [more] ICD2008-10
pp.51-56
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