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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2016-03-25 15:45 |
Nagasaki |
Fukue Bunka Hall/Rodou Fukushi Center |
A consideration on variation correction for fail prediction in LSI test Ryo Ogawa (NAIST), Yoshiyuki Nakamura (Renesas Semiconductor Package & Test Solutions), Michiko Inoue (NAIST) CPSY2015-158 DC2015-112 |
Recently, a test cost reduction using data mining has been attracted. It is expected to reduce the cost by predicting fa... [more] |
CPSY2015-158 DC2015-112 pp.271-276 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2014-11-28 15:10 |
Oita |
B-ConPlaza |
A Method of Burn-in Fail Prediction of LSIs Based on Supervised Learning Using Cluster Analysis Shogo Tetsukawa, Seiya Miyamoto, Satoshi Ohtake (Oita Univ.), Yoshiyuki Nakamura (Renesas) VLD2014-110 DC2014-64 |
Production test of LSIs consists of several test phases such as wafer test phase, package test phase, burn-in test phase... [more] |
VLD2014-110 DC2014-64 pp.251-256 |
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