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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ, IEE-EMC |
2010-12-10 14:55 |
Aichi |
Chukyo Univ. Toyoda Campus |
Quantification of Small Devices using EMI Test Instrument with Microstripline Structure Erika Kawabata (PPL), Kazuyuki Sakiyama, Toru Yamada (Panasonic), Toshihiko Taniguchi (PPL) EMCJ2010-94 |
Recently, a great demand for the execution of EMC tests to electric small devices has increased. In this paper, novel me... [more] |
EMCJ2010-94 pp.75-80 |
EMCJ, MW, IEE-MAG |
2009-10-23 10:50 |
Iwate |
Iwate Univ. |
EMS Test Instrument with Stripline Structure Suitable for Applying High-Electric Field to Small Devices Erika Kawabata (Panasonic Photo & Lighting Co., Ltd.), Koichi Ogawa (Panasonic Co., Ltd.) EMCJ2009-63 MW2009-112 |
[more] |
EMCJ2009-63 MW2009-112 pp.111-116 |
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