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All Technical Committee Conferences  (Searched in: All Years)

Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 206  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2024-04-11
14:30
Kanagawa
(Primary: On-site, Secondary: Online)
[Invited Lecture] A 40 nm 2 kb MTJ-Based Non-Volatile SRAM Macro with Novel Data-Aware Store Architecture for Normally Off Computing
Kenta Suzuki, Keizo Hiraga, Bessho Kazuhiro (Sony), Kimiyoshi Usami (SIT), Taku Umebayashi (Sony)
 [more]
SDM 2024-02-21
15:50
Tokyo Tokyo University-Hongo-Engineering Bldg.4
(Primary: On-site, Secondary: Online)
[Invited Talk] Recent Studies of WoW and CoW Cu-Cu Hybrid Bonding
Yoshihisa Kagawa, Yukako Ikegami, Takahiro Kamei, Hayato Iwamoto (SSS) SDM2023-87
In recent years, a variety of 3D stacked devices have been proposed. The Cu-Cu hybrid bonding that can realize high dens... [more] SDM2023-87
pp.31-35
AP 2024-02-16
14:00
Mie Sinfonia Technology Hibiki Hall Ise
(Primary: On-site, Secondary: Online)
[Invited Lecture] Energy Harvest of Electromagnetic Wave Noise from near electrical equipment -- Toward the realization of an ecological society --
Yoshitaka Yoshino (SonySS) AP2023-195
While environmental issues are attracting attention for the sustainable development of society, efforts to reduce enviro... [more] AP2023-195
pp.41-45
SDM 2024-01-31
15:20
Tokyo KIT Toranomon Graduate School
(Primary: On-site, Secondary: Online)
[Invited Talk] A highly reliable 1.8 V 1 Mb Hf0.5Zr0.5O2-based 1T1C FeRAM Array with 3-D Capacitors -- Report on IEDM2023 --
Jun Okuno, Takafumi Kunihiro, Yusuke Shuto, Tsubasa Yonai, Ryo Ono (Sony Semiconductor Solutions Corp.), Ruben Alcala (NaMLab), Maximilian Lederer, Konrad Seidel (Fraunhofer IPMS), Thomas Mikolajick, Uwe Schroeder (NaMLab), Taku Umebayashi (Sony Semiconductor Solutions Corp.) SDM2023-79
 [more] SDM2023-79
pp.20-23
RECONF, VLD 2024-01-29
17:00
Kanagawa AIRBIC Meeting Room 1-4
(Primary: On-site, Secondary: Online)
Derivation of an Evaluation Chip Spec suitable for Tester and Data Analysis -- Toward comparative evaluation of latch-based and flip-flop-based circuits --
Tadaaki Tanimoto, Keizo Hiraga, Toshihiko Katou, Kazuhiro Bessho, Toshimasa Shimizu (Sony Semiconductor Solutions) VLD2023-90 RECONF2023-93
As a synchronous logic circuit, it is often argued that latch-based circuits are superior to flip-flop circuits in terms... [more] VLD2023-90 RECONF2023-93
pp.59-64
RECONF, VLD 2024-01-29
17:25
Kanagawa AIRBIC Meeting Room 1-4
(Primary: On-site, Secondary: Online)
Comparison of latch-based circuit and flip-flop-based circuit in actual device
Kenji Takahashi, Tadaaki Tanimoto, Keizo Hiraga, Masayuki Hayashi, Takato Inoue, Kazuhiro Bessho, Toshimasa Shimizu (Sony Semiconductor Solutions) VLD2023-91 RECONF2023-94
The comparison results of current consumption, maximum operating frequency (Fmax) characteristics and minimum operating ... [more] VLD2023-91 RECONF2023-94
pp.65-70
UWT
(2nd)
2024-01-29
16:05
Tokyo Tokai University Shinagawa Campus
(Primary: On-site, Secondary: Online)
Measurement of Lateral Waves Along Seabed Using Spherical-Electrode Half Sheath Antennas
Takashi Kawamura, Takuma Matsushita, Yukio Kaneko, Nobuaki Kawai, Yasuhiro Matsui, Akihiro Horii (Sony Group), Hiroshi Yoshida (JAMSTEC)
 [more]
QIT
(2nd)
2023-12-17
17:30
Okinawa OIST
(Primary: On-site, Secondary: Online)
How to Map Linear Differential Equations to Schr"{o}dinger Equations via Carleman and Koopman-von Neumann Embeddings for Quantum Algorithms
Yuki Ito (Osaka Univ.), Yu Tanaka (Sony Group), Keisuke Fujii (Osaka Univ./RIKEN)
Solving differential equations with large degrees of freedom is an important task for scientific and industrial applicat... [more]
LQE, ED, CPM 2023-12-01
09:55
Shizuoka   Simultaneous microscopic PA/PL line-scan measurements in InGaN-quantum wells on a stripe-core GaN Substrate
Syoki Jinno, Atsushi A. Yamaguchi, Keito Mori-Tamamura (Kanazawa Inst. of Tech.), Susumu Kusanagi, Yuya Kanitani, Shigetaka Tomiya, Yoshihiro Kudo (Sony Semiconductor Solutions Corp.) ED2023-25 CPM2023-67 LQE2023-65
Accurate measurement of internal quantum efficiency (IQE) is necessary for a comprehensive understanding of the electron... [more] ED2023-25 CPM2023-67 LQE2023-65
pp.52-55
LQE, ED, CPM 2023-12-01
10:20
Shizuoka   Polarization control of surface emission from c-plane InGaN quantum wells and determination of deformation potential in InGaN alloy materials
Keito Mori-Tamamura, Atsushi A. Yamaguchi (Kanazawa Inst. Tech), Tomohiro Makino, Maho Ohara, Tatsushi Hamaguchi, Rintaro Koda (Sony Semiconductor Solutions) ED2023-26 CPM2023-68 LQE2023-66
InGaN-quantum-well (QW) based vertical-cavity surface-emitting lasers (VCSELs), which are usually fabricated on the c-pl... [more] ED2023-26 CPM2023-68 LQE2023-66
pp.56-59
SDM 2023-11-10
11:20
Tokyo
(Primary: On-site, Secondary: Online)
[Invited Talk] Self-Consistent Monte Carlo Device Simulation of Capture-Excitation Processes of Carriers
Futo Hashimoto, Toma Suzuki, Hideki Minari, Nobuya Nakazaki, Jun Komachi (Sony Semiconductor Solutions), Nobuyuki Sano (Univ. of Tsukuba) SDM2023-69
The capture-excitation processes of carriers are implemented in self-consistent Monte Carlo device simulations. The car... [more] SDM2023-69
pp.31-34
ITE-IDY, EID, SID-JC [detail] 2023-08-04
16:10
Online Online (Zoom) [Invited Talk] 360-degree Transparent Light Field Display with Highly-Directional Holographic Screens for Fully Volumetric 3D Video Experience
Tomoharu Nakamura, Yuriko Imai, Yuta Yoshimizu, Koji Kuramoto, Noriyuki Kato, Hiroshi Suzuki, Yuji Nakahata, Kazumasa Nomoto (Sony)
 [more]
SDM, ICD, ITE-IST [detail] 2023-08-02
10:45
Hokkaido Hokkaido Univ. Multimedia Education Bldg. 3F
(Primary: On-site, Secondary: Online)
[Invited Talk] The Image Sensor Technology: Building the Foundation for Information Sensing Societies
Hayato Wakabayashi (Sony Semiconductor Solutions)
 [more]
MRIS, ITE-MMS 2023-06-08
15:50
Miyagi Tohoku Univ. (RIEC)
(Primary: On-site, Secondary: Online)
Development of CoPtCr-oxide granular typed sputtered tape with oxygen deficiency compensation from Co oxide-added composite target
Junichi Tachibana, HIroyuki Kobayashi, Teruo Sai, Takashi Aizawa (Sony Storage Media Solutions), Shin Saito (Tohoku Univ.) MRIS2023-4
The oxidization in the granular recording layer controlled by changing the amount of Co3O4 added to the CoPtCr-SiO2 comp... [more] MRIS2023-4
pp.21-26
PRMU, IBISML, IPSJ-CVIM [detail] 2023-03-02
14:30
Hokkaido Future University Hakodate
(Primary: On-site, Secondary: Online)
[Invited Talk] --
Masato Ishii (Sony) PRMU2022-86 IBISML2022-93
 [more] PRMU2022-86 IBISML2022-93
p.148
SANE, SAT
(Joint)
2023-03-02
10:30
Okinawa
(Primary: On-site, Secondary: Online)
Evaluation of the communication quality with Forward Error Correction and Delay Tolerant Networking
Hiromitsu Komatsu, Kai Suzuki (Sony CSL), Kiyohisa Suzuki, Yu Morinaga (JAXA) SAT2022-58
Non-terrestrial networks (NTN) using satellites and stratospheric platforms are required to expand Internet coverage and... [more] SAT2022-58
pp.17-21
HWS, VLD 2023-03-01
11:25
Okinawa
(Primary: On-site, Secondary: Online)
Pass/Fail Threshold Determination Based on Gaussian Process Regression in LSI Test
Daisuke Goeda (KIT), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (SCK), Michihiro Shintani (KIT) VLD2022-74 HWS2022-45
 [more] VLD2022-74 HWS2022-45
pp.7-12
HWS, VLD 2023-03-02
13:25
Okinawa
(Primary: On-site, Secondary: Online)
[Memorial Lecture] Wafer-Level Characteristic Variation Modeling Considering Systematic Discontinuous Effects
Takuma Nagao (NAIST), Tomoki Nakamura, Masuo Kajiyama, Makoto Eiki (Sony Semiconductor Manufacturing), Michiko Inoue (NAIST), Michihiro Shintani (Kyoto Institute of Technology) VLD2022-91 HWS2022-62
Statistical wafer-level variation modeling is an attractive method for reducing the measurement cost in large-scale inte... [more] VLD2022-91 HWS2022-62
p.109
EST 2023-01-26
13:50
Okinawa
(Primary: On-site, Secondary: Online)
Basic Study of Electrio Magnetic Field Analysis of PCB based on DDM Type Parallel Finite Element Method
Kanta Nishijima (UoM), Sota Goto, Toshio Murayama (Sony GM&O), Amane Takei (UoM) EST2022-81
In this study, we will verify the applicability of parallel high-frequency electromagnetic field analysis based on the e... [more] EST2022-81
pp.39-42
NS, NWS
(Joint)
2023-01-26
13:50
Yamaguchi Hybrid Meeting (Yamaguchi Prefecture)
(Primary: On-site, Secondary: Online)
[Encouragement Talk] Wireless LAN Quality Estimation Using Federated Learning with Privacy Protection and Large-Scale Learning
Koki Horita, Masanobu Jimbo, Thomas Carette (Sony), Akihiro Nakao (UTokyo) NS2022-155
Switching network algorithm of a smartphone between WLAN and cellular is not based on the quality of the communication c... [more] NS2022-155
pp.31-36
 Results 1 - 20 of 206  /  [Next]  
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