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Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2007-09-14
13:40		 Kochi Kochi Univ. of Technology An expanded Per-Test X-Fault Diagnosis Method for LSI Circuits
Yusuke Nakamura, Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), K. K. Saluja (Univ. of Wisconsin) R2007-33		 The behavior of defects has become complex and more than one defects often occur in a single circuit due to shrinking fe... [more] R2007-33
pp.23-28
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