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Committee Date Time Place Paper Title / Authors Abstract Paper #
CPM, ICD 2008-01-18
14:55
Tokyo Kikai-Shinko-Kaikan Bldg Chip Thinning Technologies Realizing High Chip Strength
Shinya Takyu, Tetsuya Kurosawa, Noriko Shimizu, Susumu Harada (Toshiba Co.) CPM2007-145 ICD2007-156
Accompanying the rapid progress of the digital network information society, there is strong demand for high functionalit... [more] CPM2007-145 ICD2007-156
pp.99-103
ICD 2007-04-13
14:20
Oita   25nm SONOS-type Memory Device usinh Double Tunnel Junction
Ryuji Ohba, Yuichiro Mitani, Naoharu Sugiyama, Shinobu Fujita (Toshiba Co.) ICD2007-16
When a nano meter scale conductive island is lying between two tunnel resistance, this structure is called "Double junct... [more] ICD2007-16
pp.89-93
ICD 2006-04-14
09:55
Oita Oita University High Performance 16Mb MRAM for Portable Applications
Yuui Shimizu, Yoshihisa Iwata, Kenji Tsuchida, Tsuneo Inaba, Ryosuke Takizawa, Yoshihiro Ueda, Kiyotaro Itagaki, Yoshiaki Asao, Takeshi Kajiyama, Keiji Hosotani, Sumio Ikegawa, Tadashi Kai, Masahiko Nakayama, Hiroaki Yoda (Toshiba Co.)
 [more] ICD2006-13
pp.69-73
ICD 2006-04-14
14:20
Oita Oita University Floating Gate Type Planar MOSFET Memory with 35 nm Gate Length using Double Junction Tunneling
Ryuji Ohba, Yuichiro Mitani, Naoharu Sugiyama, Shinobu Fujita (Toshiba)
 [more] ICD2006-19
pp.103-107
MW 2005-12-16
09:25
Hiroshima   Development of a High Efficiency OFDM Power Amplifier with a pre-distortion circuit that uses Temperature Compensation in the 7GHz band
Kazuhisa Haeiwa (Hiroshima City Univ.), Tohru Abe, Izuru Murasaki (NHK), Tetsuo Yoshida, Jyunichi Togashi (Toshiba Co.)
We developed a high efficiency power amplifier with a pre-distortion circuit that uses temperature compensation in the I... [more] MW2005-129
pp.7-12
SIP, ICD, IE, IPSJ-SLDM 2005-10-20
15:50
Miyagi Ichinobo, Sakunami-Spa DFT Technique for Memory Macro with Built-in ECC
Keiichi Kushida, Nobuaki Otsuka, Osamu Hirabayashi, Yasuhisa Takeyama (Toshiba Co.)
DFT techniques to implement ECC circuitry on
memory macro with no additional test cost are
proposed. New methodology t... [more]
SIP2005-111 ICD2005-130 IE2005-75
pp.95-100
 Results 21 - 26 of 26 [Previous]  /   
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