ken-system: - All Technical Committee Conferences

IEICE Technical Committee Submission System
Conference Schedule

Online Proceedings
[Sign in]
Tech. Rep. Archives

[Japanese] / [English]

(

Committee/Place/Topics

) --Press->

(

Paper Keywords: / Column:Title Auth. Affi. Abst. Keyword

) --Press->

All Technical Committee Conferences (Searched in: All Years)

Search Results: Conference Papers

Conference Papers (Available on Advance Programs) (Sort by: Date Descending)

Committee	Date Time	Place		Paper Title / Authors	Abstract	Paper #
EMD	2014-01-31 13:35	Tokyo		An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board(4) -- Natural Frequency and Damping Ratio -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-136	Authors have obtained the steady-state responses using theoretical inputs developed by Fourier series and the analytical... [more]	EMD2013-136 pp.1-6
EMD	2013-12-20 14:55	Tokyo	Kikai-Shinko-Kaikan Bldg.	An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board (3) -- Properties of the Responses using Rectangular Wave & Sinusoidal one as Input -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013-133	Authors have designed and developed the mechanism which gives vibration to electrical contacts by transient force using ... [more]	EMD2013-133 pp.11-16
EMD	2013-11-16 09:30	Overseas	Huazhong University of Science and Technology, Wuhan, P.R.China	An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board -- Properties of the Responses using Rectangular Wave and Sinusoidal one as an Input -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-78	Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more]	EMD2013-78 pp.15-18
EMD	2013-11-16 09:45	Overseas	Huazhong University of Science and Technology, Wuhan, P.R.China	An Evaluating Method for Fundamental Dynamical Parameters of Objects on a Printed Circuit Board -- Natural Frequency and Damping Ratio (2) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2013-79	Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more]	EMD2013-79 pp.19-22
EMCJ, EMD	2013-07-12 10:35	Tokyo	Kikai-Shinko-Kaikan Bldg.	Degradation Phenomenon of Electrical Contacts using a Hammering Oscillation Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillation mechanism (28) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2013-39 EMD2013-24	Authors have studied the effect on electrical contacts by actual micro-oscillation using the hammering oscillation mecha... [more]	EMCJ2013-39 EMD2013-24 pp.1-6
EMD, CPM, OME	2013-06-21 14:40	Tokyo	Kikai-Shinko-Kaikan Bldg.	Degradation Phenomenon of Electrical Contacts by using a Hammering Oscillating Mechanism or a Micro-Sliding Mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (27) -- Shin-ichi Wada, Keiji Koshida, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2013-17 CPM2013-32 OME2013-40	Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more]	EMD2013-17 CPM2013-32 OME2013-40 pp.55-60
NLP	2013-04-25 10:25	Aichi	Nagoya campus, Chukyo University	Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (4) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) NLP2013-2	Authors have developed some mechanisms which give real vibration to electrical contacts and have studied the influences ... [more]	NLP2013-2 pp.7-12
NLP	2013-03-14 13:50	Chiba	Nishi-Chiba campus, Chiba Univ.	Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism -- Modeling about Fluctuation of Contact Resistance (3) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (Nippon Inst. of Thech.) NLP2012-152	Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more]	NLP2012-152 pp.43-48
EMD	2013-01-25 15:25	Kanagawa	Hitachi, Ltd., (Totsuka, Yokohama)	Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms -- Anallysis of Time-Sequential Fluctuation Data (27) -- Shin-ichi Wada, Keiji Koshida (TMC), Shoko Nagai (Keio), Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-99	Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more]	EMD2012-99 pp.9-14
EMD	2012-12-21 15:45	Tokyo	Kikai-Shinko-Kaikan Bldg.	Degradation Phenomenon of Electrical Contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the hammering oscillating mechanism (26) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling (TMC), Naoki Masuda (TCT), Kunio Yanagi, Hiroaki Kubota (TMC), Masashi Terasaki (TCT), Koichiro Sawa (NIT) EMD2012-95	Authors have studied the influence on electrical contacts by actual micro-oscillation using some oscillating mechanisms ... [more]	EMD2012-95 pp.27-32
EMD	2012-12-01 14:30	Chiba	Chiba Institute of Technology	Degradation phenomenon of electrical contacts using a hammering oscillating mechanism -- A fundamental study on the performance of the oscillating mechanism (25) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2012-86	Authors developed the mechanism which gives real vibration to electrical contacts by hammering oscillation in the vertic... [more]	EMD2012-86 pp.125-131
EMCJ, EMD	2012-07-20 12:50	Tokyo	Kikai-Shinko-Kaikan Bldg.	Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism (23) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Kouki Takeda, Naoki Masuda, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-41 EMD2012-16	Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more]	EMCJ2012-41 EMD2012-16 pp.1-6
EMCJ, EMD	2012-07-20 13:15	Tokyo	Kikai-Shinko-Kaikan Bldg.	Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (24) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMCJ2012-42 EMD2012-17	Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more]	EMCJ2012-42 EMD2012-17 pp.7-12
EMD, CPM, OME	2012-06-22 17:25	Tokyo	Kikai-Shinko-Kaikan Bldg.	Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- A fundamental study on the performance of the oscillating mechanism(22) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-15 CPM2012-32 OME2012-39	Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more]	EMD2012-15 CPM2012-32 OME2012-39 pp.41-46
NLP	2012-05-29 10:30	Akita	Akita City Exchange Plaza	Degradation Phenomenon of Electrical Contacts using some Oscillating Mechanisms -- Modeling about Fluctuation of Contact Resistance (2) -- Shin-ichi Wada, Keiji Koshida, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) NLP2012-35	Authors have developed some mechanisms which give real vibration to electrical contacts and studied the influences of a ... [more]	NLP2012-35 pp.49-54
EMD	2012-05-25 14:20	Miyagi	Tohoku Bunka Gakuen Univ.	Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its Model (21) -- Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2012-3	Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more]	EMD2012-3 pp.13-18
EMD	2012-01-20 13:35	Kanagawa		Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (20) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-112	Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more]	EMD2011-112 pp.1-6
EMD	2011-12-16 13:55	Tokyo	NIT Kanda Camps	Degradation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism -- Contact Resistance and its model (19) -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Naoki Masuda, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-108	Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more]	EMD2011-108 pp.11-16
EMD	2011-11-18 16:15	Akita	Akita Univ. Tegata Campus	Degradation Phenomenon of Electrical Contacts using a Micro-Sliding Mechanism -- Minimal Sliding Amplitudes estimated under some conditions by the Mechanism (18) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC System), Koichiro Sawa (Nippon Inst. of Tech.) EMD2011-102	Authors have developed the mechanism which gives damping vibration to electrical contacts by the reciprocal hammering-os... [more]	EMD2011-102 pp.189-194
EMD	2011-10-21 12:35	Tokyo	Tachikawa-Shiminn-kaikan	Degradation Phenomenon of Electrical Contacts by hammering Oscillating mechanism and micro-sliding mechanism -- Contact Resistance (17) -- Shin-ichi Wada, Keiji Koshida, Masahiro Kawanobe, Saindaa Norovling, Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-57	Authors have studied the influence on contact resistance by actual micro-oscillation to electrical contacts using some o... [more]	EMD2011-57 pp.1-6

Copyright and reproduction : All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

[Return to Top Page]

[Return to IEICE Web Page]

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan