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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SANE |
2023-12-08 13:30 |
Overseas |
Surakarta, Indonesia (Primary: On-site, Secondary: Online) |
Multiple Scattering Effect Analysis of Circularly Polarized Radar for Volcanic Lava Observation Yuki Yoshimoto (SMM/Chiba Univ.), Motoyuki Naito (SMM), Josaphat Tetuko Sri Sumantyo (Chiba Univ./UNS) SANE2023-80 |
Estimation of eruption size is important for mitigation of eruption hazards, and for this purpose, it is necessary to cl... [more] |
SANE2023-80 pp.110-115 |
ED, SDM |
2010-07-02 10:50 |
Tokyo |
Tokyo Inst. of Tech. Ookayama Campus |
Characterization of deep electron levels of AlGaN grown by MOVPE Kimihito Ooyama (Hokkaido Univ./SMM), Katsuya Sugawara (Hokkaido Univ.), Hiroyuki Taketomi, Hideto Miyake, Kazumasa Hiramatsu (Mie Univ.), Tamotsu Hashizume (Hokkaido Univ./JST) ED2010-107 SDM2010-108 |
Deep electronic levels of Al_xGa_{1-x}N (0.25 <x < 0.60) were investigated by using deep level transient spectroscopy (D... [more] |
ED2010-107 SDM2010-108 pp.249-252 |
PRMU, HIP |
2010-03-16 15:05 |
Kagoshima |
Kagoshima Univ. |
Structural Pattern Recognition of Aggregated Dot Patterns based on Density Gradient Kenji Satou (SMM), Takeki Yamada, Hidenori Takauji, Shun'ichi Kaneko (Hokkaido Univ.) PRMU2009-314 HIP2009-199 |
In this paper, we name the images obtained by mapping dots from defect inspections as secondary images. We propose a met... [more] |
PRMU2009-314 HIP2009-199 pp.477-482 |
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