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Committee Date Time Place Paper Title / Authors Abstract Paper #
SDM 2017-11-09
13:05		 Tokyo Kikai-Shinko-Kaikan Bldg. Simple and efficient approach to improve hot carrier immunity of a p-LDMOSFET
Atsushi Sakai, Katsumi Eikyu (REL), Fujii Hiroki, Takahiro Mori (RSMC), Yutaka Akiyama, Yasuo Yamaguchi (REL) SDM2017-63		 This paper proposes a simple and efficient method to improve hot carrier (HC) immunity of p-channel LDMOSFET without deg... [more] SDM2017-63
pp.11-14
SDM 2017-10-26
13:30		 Miyagi Niche, Tohoku Univ. Pinning Voltage Control of CMOS Image Sensor by measuring sheet resistance at micro test structure in scribe line
Yotaro Goto (RSMC), Tadasihi Yamaguchi, Masazumi Matsuura (REL), Koji Iizuka (RSMC) SDM2017-59		  [more] SDM2017-59
pp.51-55
SDM 2015-11-06
14:30		 Tokyo Kikai-Shinko-Kaikan Bldg. [Invited Talk] Impacts of the 4H-SiC/SiO2 Interface States on the Switching Operation of Power MOSFETs
Atsushi Sakai, Katsumi Eikyu, Kenichiro Sonoda (REL), Kenichi Hisada, Koichi Arai, Yoichi Yamamoto (RSMC), Motoaki Tanizawa, Yasuo Yamaguchi (REL) SDM2015-91		  [more] SDM2015-91
pp.39-43
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