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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| SDM, ICD, ITE-IST [detail] | 2019-08-07 16:30 |
Hokkaido | Hokkaido Univ., Graduate School /Faculty of Information Science and | [Invited Talk]
High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SGMONOS flash memory for security applications Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics)  SDM2019-39 ICD2019-4 |
Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] | SDM2019-39 ICD2019-4 pp.15-19 |
| SDM, ICD, ITE-IST [detail] | 2019-08-09 10:50 |
Hokkaido | Hokkaido Univ., Graduate School /Faculty of Information Science and | [Invited Talk]
A 28nm 600MHz Automotive Flash Microcontroller with Virtualization-Assisted Processor for Next-Generation Automotive Architecture supporting ISO26262 ASIL-D Naoto Okumura, Sugako Otani, Norimasa Otsuki, Yasufumi Suzuki, Shohei Maeda, Tomonori Yanagita, Takao Koike, Masao Ito, Minoru Uemura, Yasuhisa Shimazaki, Toshihiro Hattori, Noriaki Sakamoto, Hiroyuki Kondo (Renesas Electronics Corp.) SDM2019-47 ICD2019-12 |
Along with the rapid progress of automotive Electrical/Electronic(E/E) architecture, further integration of multiple ele... [more] | SDM2019-47 ICD2019-12 pp.67-71 |
| CAS, CS | 2019-03-08 15:00 |
Kanagawa | Shonan Institute of Technology | [Special Invited Talk]
The latest trends of Automotive Ethernet Tomofumi Hokari, Nobukatsu Kitajima (Renesas) CAS2018-145 CS2018-113 |
To support Autonomous driving and Connected car applications, Automotive Ethernet has been adopted widely around the wor... [more] | CAS2018-145 CS2018-113 p.39 |
| DC | 2019-02-27 09:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Variational Autoencoder-Based Efficient Test Escape Detection Michihiro Shintani (NAIST), Kouichi Kumaki (Renesas Electronics Corporation), Michiko Inoue (NAIST) DC2018-72 |
[more] | DC2018-72 pp.7-12 |
| DC | 2019-02-27 14:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | FF Toggle Control Point Selection Methods for Fault Detection Enhancement under Multi-cycle Testing Tomoki Aono, Hanan T.Al-Awadhi, Senling Wang, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Yoichi Maeda, Jun Matsushima (Renesas) DC2018-79 |
Multi-cycle Test is a promising way to reduce the test volume of Logic-BIST (Logic Built-in Self-Test) based POST (Power... [more] | DC2018-79 pp.49-54 |
| SDM | 2019-01-29 13:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Highly Reliable Ferroelectric Hf0.5Zr0.5O2 Film with Al Nanoclusters Embedded by Sub-Monolayer Doping Technique Tadashi Yamaguchi, Tiantian Zhang, Kazuyuki Omori, Yasuhiro Shimada, Yorinobu Kunimune, Takashi Ide, Masao Inoue, Masazumi Matsuura (Renesas) SDM2018-86 |
Highly reliable ferroelectric (FE) Hf0.5Zr0.5O2 (HZO) film with Al nanoclusters embedded by sub-monolayer doping techniq... [more] | SDM2018-86 pp.21-26 |
| HWS (2nd) |
2018-12-13 15:05 |
Tokyo | Tokyo Univ. Takeda Bldg. Takeda Hall | Issues in industrial equipment installed in the factory and Renesas' initiatives Tsukasa Yobo (Renesas Electronics) |
(Advance abstract in Japanese is available) [more] | |
| SDM | 2018-11-08 09:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
SISPAD 2018 Review Kenichiro Sonoda (Renesas Electronics) SDM2018-64 |
2018 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) was held on September 24-26,... [more] | SDM2018-64 pp.1-6 |
| SDM | 2018-10-17 14:00 |
Miyagi | Niche, Tohoku Univ. | [Invited Talk]
Fin-FET MONOS for Next Generation Automotive-MCU Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Yasuo Yamaguchi, Tomohiro Yamashita (Renesas) SDM2018-52 |
[more] | SDM2018-52 pp.1-5 |
| SDM, ICD, ITE-IST [detail] | 2018-08-08 13:15 |
Hokkaido | Hokkaido Univ., Graduate School of IST M Bldg., M151 | [Invited Lecture]
A Highly Symmetrical 10T 2-Read/Write Dual-port SRAM Bitcell Design In 28nm High-k/Metal-gate Planar Bulk CMOS Technology Yuichiro Ishii, Miki Tanaka, Makoto Yabuuchi, Yohei Sawada, Shinji Tanaka, Koji Nii (Renesas), Tien Yu Lu, Chun Hsien Huang, Shou Sian Chen, Yu Tse Kuo, Ching Cheng Lung, Osbert Cheng (UMC) SDM2018-40 ICD2018-27 |
We propose a highly symmetrical 10T 2-read/write (2RW) dual-port (DP) SRAM bitcell in 28-nm high-k/metal-gate planar bul... [more] | SDM2018-40 ICD2018-27 pp.83-88 |
| SDM, ICD, ITE-IST [detail] | 2018-08-09 12:45 |
Hokkaido | Hokkaido Univ., Graduate School of IST M Bldg., M151 | Study of Impact of BTI's Local Layout Effect Including Recovery Effect on Various Standard-Cells in 10nm FinFET Mitsuhiko Igarashi, Yuuki Uchida, Yoshio Takazawa, Yasumasa Tsukamoto, Koji Shibutani, Koji Nii (Renesas) SDM2018-47 ICD2018-34 |
[more] | SDM2018-47 ICD2018-34 pp.109-113 |
| SDM, ICD, ITE-IST [detail] | 2018-08-09 13:10 |
Hokkaido | Hokkaido Univ., Graduate School of IST M Bldg., M151 | 12-nm Fin-FET 3.0G-search/s 80-bit x 128-entry Dual-port Ternary CAM Makoto Yabuuchi, Masao Morimoto, Koji Nii, Shinji Tanaka (Renesas) SDM2018-48 ICD2018-35 |
[more] | SDM2018-48 ICD2018-35 pp.115-120 |
| ICD | 2018-04-20 10:20 |
Tokyo | [Invited Lecture]
An Implementation of 2RW Dual-Port SRAM using 65 nm Silicon-on-Thin-Box (SOTB) for Smart IoT Yohei Sawada, Yoshiki Yamamoto, Takumi Hasegawa, Hiroki Shinkawata, Makoto Yabuuchi (REL), Yoshihiro Shinozaki, Kyoji Ito (NSW), Shinji Tanaka, Nii Koji, Shiro Kamohara (REL) ICD2018-8 |
[more] | ICD2018-8 pp.29-32 |
|
| ICD | 2018-04-20 10:45 |
Tokyo | [Invited Lecture]
A Dynamic Power Reduction in Synchronous 2RW 8T Dual-Port SRAM by Adjusting Wordline Pulse Timing with Same/Different Row Access Mode Yoshisato Yokoyama, Yuichiro Ishii, Haruyuki Okuda, Koji Nii (REL) ICD2018-9 |
(To be available after the conference date) [more] | ICD2018-9 pp.33-38 |
|
| SDM | 2018-01-30 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
Reliability and Scalability of FinFET Split-Gate MONOS Array with Tight Vth Distribution for 16/14nm-node Embedded Flash Shibun Tsuda, Tomoya Saito, Hirokazu Nagase, Yoshiyuki Kawashima, Atsushi Yoshitomi, Shinobu Okanishi, Tomohiro Hayashi, Takuya Maruyama, Masao Inoue, Seiji Muranaka, Shigeki Kato, Takuya Hagiwara, Hirokazu Saito, Tadashi Yamaguchi, Masaru Kadoshima, Takahiro Maruyama, Tatsuyoshi Mihara, Hiroshi Yanagita, Kenichiro Sonoda, Tomohiro Yamashita, Yasuo Yamaguchi (renesas) SDM2017-94 |
Reliability and scalability of split-gate metal-oxide nitride oxide silicon (SG-MONOS) are discussed for 16/14nm-node em... [more] | SDM2017-94 pp.13-16 |
| IPSJ-ARC, VLD, CPSY, RECONF, IPSJ-SLDM [detail] | 2018-01-19 16:40 |
Kanagawa | Raiosha, Hiyoshi Campus, Keio University | Mutant Generation of Performance Tests for LLVM Back-Ends Kenji Tanaka, Nagisa Ishiura (Kwansei Gakuin Univ.), Masanari Nishimura, Akiya Fukui (Renesas) VLD2017-88 CPSY2017-132 RECONF2017-76 |
This article presents a method of testing optimization capability of LLVM back-ends by generating functionally equivalen... [more] | VLD2017-88 CPSY2017-132 RECONF2017-76 pp.169-174 |
| SDM | 2017-11-09 13:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Simple and efficient approach to improve hot carrier immunity of a p-LDMOSFET Atsushi Sakai, Katsumi Eikyu (REL), Fujii Hiroki, Takahiro Mori (RSMC), Yutaka Akiyama, Yasuo Yamaguchi (REL) SDM2017-63 |
This paper proposes a simple and efficient method to improve hot carrier (HC) immunity of p-channel LDMOSFET without deg... [more] | SDM2017-63 pp.11-14 |
| SDM | 2017-11-10 15:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Invited Talk]
A SPICE-compatible SG-MONOS model for 28nm embedded flash macro design considering the parasitic resistance caused by trapped charges Risho Koh, Mitsuru Miyamori, Katsumi Tsuneno, Tetsuya Muta, Yoshiyuki Kawashima (Renesas electronics) SDM2017-71 |
A SPICE-compatible model which reproduces the read current of split-gate MONOS (SG-MONOS) non-volatile memory cell has b... [more] | SDM2017-71 pp.53-58 |
| VLD, DC, CPSY, RECONF, CPM, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2017-11-06 14:55 |
Kumamoto | Kumamoto-Kenminkouryukan Parea | An Approach to Selection of Classifiers and their Thresholds for Machine Learning Based Fail Chip Prediction Daichi Yuruki, Satoshi Ohtake (Oita Univ), Yoshiyuki Nakamura (Renesas Electronics) VLD2017-36 DC2017-42 |
Today, semiconductor technologies have developed and advance the integration density of LSI circuits. A technique which... [more] |
VLD2017-36 DC2017-42 pp.55-60 |
| SDM | 2017-10-26 13:00 |
Miyagi | Niche, Tohoku Univ. | [Invited Lecture]
High-temperature stable Physical Unclonable Functions with error-free readout scheme based on 28nm SG-MONOS flash memory for security applications Takahiro Shimoi, Tomoya Saito, Hirokazu Nagase, Masayuki Izuna, Akihiko Kanda, Takashi Ito, Takashi Kono (Renesas Electronics) SDM2017-58 |
Highly reliable Physical Unclonable Functions (PUF) based on 28nm Split-Gate MONOS (SG-MONOS) embedded flash memory is d... [more] | SDM2017-58 pp.45-49 |
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