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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 21 - 40 of 79 [Previous]  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2017-12-15
15:55
Tokyo Kikai-Shinko-Kaikan Bldg. R2017-60 Plenary meeting of IEC TC 56 “Dependability” was held in Tokyo this year. Firstly, Mr. Mori (METI) welcomed the TC 56 an... [more] R2017-60
pp.25-30
SDM 2017-11-09
13:05
Tokyo Kikai-Shinko-Kaikan Bldg. Simple and efficient approach to improve hot carrier immunity of a p-LDMOSFET
Atsushi Sakai, Katsumi Eikyu (REL), Fujii Hiroki, Takahiro Mori (RSMC), Yutaka Akiyama, Yasuo Yamaguchi (REL) SDM2017-63
This paper proposes a simple and efficient method to improve hot carrier (HC) immunity of p-channel LDMOSFET without deg... [more] SDM2017-63
pp.11-14
SDM 2017-10-26
13:30
Miyagi Niche, Tohoku Univ. Pinning Voltage Control of CMOS Image Sensor by measuring sheet resistance at micro test structure in scribe line
Yotaro Goto (RSMC), Tadasihi Yamaguchi, Masazumi Matsuura (REL), Koji Iizuka (RSMC) SDM2017-59
 [more] SDM2017-59
pp.51-55
ICD 2017-04-21
10:25
Tokyo   [Invited Lecture] A 6.05-Mb/mm2 16-nm FinFET Double Pumping 1W1R 2-port SRAM with 313ps Read Access Time
Yohei Sawada, Makoto Yabuuchi, Masao Morimoto (REL), Toshiaki Sano (RSD), Yuichiro Ishii, Shinji Tanaka (REL), Miki Tanaka (RSD), Koji Nii (REL) ICD2017-12
 [more] ICD2017-12
pp.63-65
EMD, R 2017-02-17
16:40
Shiga Omuron Kusatsu Factory Effect of various resin materials on arc duration under magnetic field
Daisuke Okazaki (OMRON), Masayuki Noda (OMRON Relay and Device) R2016-70 EMD2016-97
Various methods for arc extinction are used in DC switching device. One of them is the means that outgassing resin locat... [more] R2016-70 EMD2016-97
pp.59-63
EMD, R 2017-02-17
17:00
Shiga Omuron Kusatsu Factory Report on thermal simulation technique to analyze effect of contact bounce arc.
Kazua Murakami, Takeshi Nishida (Omron), Tetsuo Shinkai (OER) R2016-71 EMD2016-98
We report a thermal analysis method to quantify the melting phenomenon of the contact which causes the contact welding p... [more] R2016-71 EMD2016-98
pp.65-70
ED 2016-12-20
09:25
Miyagi RIEC, Tohoku Univ Non-Destructive Inspection of Bills by Terahertz Spectroscopic Imaging
Tadao Tanabe, Takashi Kimura, Kensaku Maeda (Tohoku Univ.), kouichi Goi (LAUREL BANK MACHINES), Yutaka Oyama (Tohoku Univ.) ED2016-88
Terahertz wave has high permeability for non-polar materials, which is expected to be used as non-destructive for bills.... [more] ED2016-88
pp.47-48
R 2016-10-21
13:55
Okinawa Okinawaken Seinenkaikan History and positioning of service reliability terms up to the JIS Z 8115 draft amendment
Akihiko Masuda (R7 Practical Studio) R2016-43
Service-related quality and reliability terms, as a rule, are not included in the current JIS Z 8115:2000 Dependability ... [more] R2016-43
pp.7-12
R 2016-07-29
15:20
Hokkaido Otaru Chamber of Commerce and Industry Trend of reliability test term in JIS Z 8115 draft revision considering the integrity of the IEC 60050-192 Dependability
Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor), Fumiaki Harada (FXAT) R2016-17
 [more] R2016-17
pp.25-30
OPE, MW, EMT, MWP, EST, IEE-EMT [detail] 2016-07-21
17:05
Hokkaido   EMT2016-17 MW2016-48 OPE2016-29 EST2016-18 MWP2016-19 In recent years, traffic demand for mobile communications continues to increase, which causes the necessity of developin... [more] EMT2016-17 MW2016-48 OPE2016-29 EST2016-18 MWP2016-19
pp.67-70
ET 2016-06-11
13:50
Aichi Nagoya Institute of Technology Developing Educational Embbededd Programming Material Through Academia-Industry Collaboration
Ryota Morisaki (Okayama Prefectural Univ.), Norihiro Yoshida (Nagoya Univ.), Sousuke Amasaki (Okayama Prefectural Univ.), Yoshifumi Karube (Afrel), Hiroaki Takada (Nagoya Univ.) ET2016-14
 [more] ET2016-14
pp.37-40
SR, RCC, MICT, RCS, SRW
(Joint)
(2nd)
2016-05-16
- 2016-05-17
Overseas Hotel Lasaretti, Oulu, Finland [Technology Exhibit] Modular Multi-Wireless-Technology Enabled IoT Research Platform
Konstantin Mikhaylov, Juha Petajajarvi, Marko Makelainen, Anton Paatelma, Tuomo Hanninen (CWC)
The exhibit demonstrates to the audience the new flexible research and development platform for Wireless Sensor and Actu... [more]
SR, RCC, MICT, RCS, SRW
(Joint)
(2nd)
2016-05-16
- 2016-05-17
Overseas Hotel Lasaretti, Oulu, Finland [Poster Presentation] Knife-edge and Slit Diffraction Measurements in the Terahertz Band
Perttu Rintanen, Joonas Kokkoniemi, Janne Lehtomaki, Markku Juntti (CWC, Univ. Oulu)
Measurement results on diffraction in the THz band from 0.1 THz to approximately 4 THz are reported. The measurements fo... [more]
SR, RCC, MICT, RCS, SRW
(Joint)
(2nd)
2016-05-16
- 2016-05-17
Overseas Hotel Lasaretti, Oulu, Finland [Poster Presentation] A Comparison of Short/Medium Range Communications Technologies
Ville Niemela, Matti Hamalainen, Jari Iinatti (CWC)
This poster presents comparisons of different wireless communications technologies targeted for short range communicatio... [more]
SR, RCC, MICT, RCS, SRW
(Joint)
(2nd)
2016-05-16
- 2016-05-17
Overseas Hotel Lasaretti, Oulu, Finland [Poster Presentation] Surface Reflection and Scattering Measurements in the Terahertz Band
Joonas Kokkoniemi, Janne Lehtomaki, Markku Juntti (CWC, Univ. Oulu)
Measurement results on the surface scattering and reflections in the THz band from 0.1 THz to approximately 4 THz are re... [more]
SR, RCC, MICT, RCS, SRW
(Joint)
(2nd)
2016-05-16
- 2016-05-17
Overseas Hotel Lasaretti, Oulu, Finland [Requested Talk] Future business ecosystem for mobile communications in the changing spectrum regulatory environment
Marja Matinmikko (CWC, Univ. Oulu)
This presentation will build upon the recent developments in the spectrum regulatory environment occurring globally and ... [more]
RCS, CCS, SR, SRW
(Joint)
2016-03-03
15:40
Tokyo Tokyo Institute of Technology [Invited Talk] Smart Spectrum for Future IoT
Takeo Fujii (AWCC) CCS2015-69 RCS2015-372 SR2015-106 SRW2015-98
 [more] CCS2015-69 RCS2015-372 SR2015-106 SRW2015-98
p.15(CCS), p.229(RCS), p.105(SR), p.157(SRW)
EMD, R 2016-02-19
15:35
Shizuoka Azarea,Shizuoka Latest Trends of JIS Z8115 DependabilityTerminology amendment drafts -- Focus on relevant terms of failure and fault --
Fumiaki Harada (FXAT), AKihiko Masuda (R7 Studio), Tateki NIsh (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental motor) R2015-70 EMD2015-98
 [more] R2015-70 EMD2015-98
pp.31-36
CS 2015-11-13
10:50
Hokkaido Hotel Taisetsu (Sounkyo Spa, Hokkaido) A consideration on performance evaluation of linear/rectangular array LOS-MIMO systems
Toshihisa Yamada, Daisuke Umehara, Kouichiro Wakasugi (KIT), Takanori Iwamatsu (FUJITSU WIRELESS SYSTEMS) CS2015-55
LOS-MIMO (Line Of Sight - Multiple-Input Multiple-Output) systems can increase a channel capacity without increasing the... [more] CS2015-55
pp.59-64
IA 2015-11-12
10:00
Chiba NARITA VIEW HOTEL (No Manuscript in IEICE Tech. Report) Supporting emegerncy relief for Nepal through Facebook community by a humanitarian worker
Masahiro Taniguchi (WFP)
 [more]
 Results 21 - 40 of 79 [Previous]  /  [Next]  
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