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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ED, MW | 2008-01-17 13:50 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | 1.8 V operation Power Amplifier IC for Bluetooth Class 1 utilizing p+-GaAs Gate Hetero-junction FET Fumio Harima, Yasunori Bito, Hidemasa Takahashi, Naotaka Iwata (NEC Electronics)  ED2007-221 MW2007-152 |
We have developed a power amplifier IC for Bluetooth Class 1 operating at single low voltage of 1.8 V. We can realize it... [more] | ED2007-221 MW2007-152 pp.83-86 |
| RECONF | 2007-09-21 09:30 |
Shiga | Ritsumeikan Univ. Biwako Kusatsu Campus (Shiga) | Hardware/Software Partitioning for SoPC based Embedded Systems Kenichi Shimada (NEC Electronics), Masaru Fukushi, Susumu Horiguchi (Tohoku Univ.) RECONF2007-23 |
(Advance abstract in Japanese is available) [more] | RECONF2007-23 pp.47-52 |
| ICD | 2007-04-12 10:40 |
Oita | Device Technology for embedded DRAM utilizing stacked MIM(Metal-Insulator-Metal) Capacitor Takaho Tanigawa, Yasushi Yamagata, Hiroki Shirai, Hirotoshi Sugimura, Tomoko Wake, Ken Inoue, Takashi Sakoh, Masato Sakao (NECEL) ICD2007-4 |
This paper presents embedded DRAM device technology utilizing stacked MIM(Metal-Insulator-Metal) capacitor. Targeted for... [more] | ICD2007-4 pp.17-22 |
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| ICD, SIP, IE, IPSJ-SLDM | 2006-10-26 13:55 |
Miyagi | [Invited Talk]
Media Processing LSI Architectures for Automotives
-- Challenges and Future Trends -- Ichiro Kuroda (NEC Electronics) |
[more] | SIP2006-93 ICD2006-119 IE2006-71 pp.57-62 |
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| ICD, SDM | 2006-08-17 10:55 |
Hokkaido | Hokkaido University | A 1-ps resolution on-chip sampling oscilloscope with 64:1 tunable sampling range based on ramp waveform division scheme Kenichi Inagaki (Univ. of Tokyo), Danardono Dwi Antono (SONY), Makoto Takamiya (Univ. of Tokyo), Shigetaka Kumashiro (NEC Electronics), Takayasu Sakurai (Univ. of Tokyo) |
An on-chip sampling oscilloscope with 1ps timing resolution is realized in 90nm CMOS process based on a proposed ramp wa... [more] | SDM2006-129 ICD2006-83 pp.25-30 |
| EMCJ, EMD | 2006-07-28 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Simulation of Electromagnetic Emissions from LSIs on Printed Circuit Boards Fumikazu Ga, Takeshi Watanabe, Yuuichi Iizuka (NEC Electronics Co.) EMCJ2006-40 EMD2006-20 |
A practical technique of PCB-level EMI simulation has been developed. In this report, analyzed results of high-frequency... [more] | EMCJ2006-40 EMD2006-20 pp.25-28 |
| ICD | 2005-12-15 11:20 |
Kochi | Scalable Bus Interface for HSDPA Co-processor Extension Toshiki Takeuchi, Hiroyuki Igura (NEC), Takeshi Hashimoto (NECEL), Soichi Tsumura, Naoki Nishi (NEC) |
This paper presents a scalable bus developed for HSDPA co-processor extension of W-CDMA digital baseband processors. The... [more] | ICD2005-184 pp.7-11 |
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| ICD, SDM | 2005-08-18 14:55 |
Hokkaido | HAKODATE KOKUSAI HOTEL | Monitoring Scheme for Minimizing Power Consumption by Means of Supply and Threshold Voltage Control in Active and Standby Modes Yoshifumi Ikenaga, Masahiro Nomura, Koichi Takeda, Yoetsu Nakazawa (NEC), Yoshiharu Aimoto (NECEL), Yasuhiko Hagihara (NEC) |
(Advance abstract in Japanese is available) [more] | SDM2005-139 ICD2005-78 pp.67-72 |
| ICD, CPM | 2005-01-27 13:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Evaluation of LVP observability in 90nm devices, and development of on-chip elements for LVP measurement Junpei Nonaka, Shinichi Wada (NEC Electronics) |
For devices after 90nm generation, LVP measurement will be difficult, because transistor sizes are less than laser diffr... [more] | CPM2004-156 ICD2004-201 pp.7-12 |
| ICD, CPM | 2005-01-27 14:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Observation of completed LSI after building-in defect using Laser-SQUID microscopy Tetsuya Sakai, Kiyoshi Nikawa (NEC Electronics) |
[more] | CPM2004-158 ICD2004-203 pp.19-24 |
| ICD, CPM | 2005-01-28 11:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Improvement of RTL Fault Diagnosis Technology for Practical Use Masafumi Nikaido, Yukihisa Funatsu (NEC Electronics Corporation) |
RTL (Register Transfer Level) fault diagnosis technique based on backtracking the node in Assignment Decision Diagrams (... [more] | CPM2004-166 ICD2004-211 pp.25-30 |
| ICD, CPM | 2005-01-28 11:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | On Observability Quantification for Fault Diagnosis of VLSI Circuits Naoya Toyota, Seiji Kajihara, Xiaoqing Wen (KIT), Masaru Sanada (NEC Electoronics) |
In most fault diagnosis, logic values can be observed at primary outputs and scan flip-flops as observation points. Howe... [more] | CPM2004-167 ICD2004-212 pp.31-34 |
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