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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| ICD, SDM | 2012-08-02 13:00 |
Hokkaido | Sapporo Center for Gender Equality, Sapporo, Hokkaido | [Invited Lecture]
Silicon on Thin Buried Oxide (SOTB) Technology for Ultralow-Power (ULP) Applications Nobuyuki Sugii, Toshiaki Iwamatsu, Yoshiki Yamamoto, Hideki Makiyama, Takaaki Tsunomura, Hirofumi Shinohara, Hideki Aono, Hidekazu Oda, Shiro Kamohara, Yasuo Yamaguchi (LEAP/Renesas), Tomoko Mizutani, Toshiro Hiramoto (IIS, The University of Tokyo)  SDM2012-68 ICD2012-36 |
Needs for low-power CMOS devices are still increasing. Ultralow-voltage-operation (ULV) CMOS with maximum power efficien... [more] | SDM2012-68 ICD2012-36 pp.29-32 |
| ICD, SDM | 2012-08-02 13:25 |
Hokkaido | Sapporo Center for Gender Equality, Sapporo, Hokkaido | Reduced Drain Current Variability in Fully Depleted Silicon-on-Thin-BOX (SOTB) MOSFETs Tomoko Mizutani (Univ. of Tokyo), Yoshiki Yamamoto, Hideki Makiyama, Takaaki Tsunomura, Toshiaki Iwamatsu, Hidekazu Oda, Nobuyuki Sugii (LEAP), Toshiro Hiramoto (Univ. of Tokyo) SDM2012-69 ICD2012-37 |
Drain current variability in silicon-on-thin-BOX (SOTB) MOSFETs by 65nm technology is analyzed and compared with convent... [more] | SDM2012-69 ICD2012-37 pp.33-36 |
| ICD, SDM | 2012-08-02 15:15 |
Hokkaido | Sapporo Center for Gender Equality, Sapporo, Hokkaido | [Invited Talk]
STT-MRAM Development and Its Integration with BEOL Process for Embedded Applications Toshihiro Sugii, Yoshihisa Iba, Masaki Aoki, Hideyuki Noshiro, Koji Tsunoda, Akiyoshi Hatada, Masaaki Nakabayashi, Yuuichi Yamazaki, Atsushi Takahashi, Chikako Yoshida (LEAP) SDM2012-73 ICD2012-41 |
[more] | SDM2012-73 ICD2012-41 pp.55-58 |
| ICD, SDM | 2012-08-03 09:25 |
Hokkaido | Sapporo Center for Gender Equality, Sapporo, Hokkaido | [Invited Talk]
Nanocarbon Interconnects
-- Aiming to replace ultra-fine metal interconnects -- Akihiro Kajita, Makoto Wada, Tatsuro Saito, Masayuki Kitamura, Yuichi Yamazaki, Masayuki Katagiri, Ban Ito, Daisuke Nishide, Takashi Matsumoto, Atsunobu Isobayashi, Mariko Suzuki, Atsuko Sakata, Masahito Watanabe, Naoshi Sakuma, Tadashi Sakai (LEAP) SDM2012-78 ICD2012-46 |
The width of interconnects has been shrinking toward 10nm in accordance with LSI devices shrinkage. The resistivity of s... [more] | SDM2012-78 ICD2012-46 pp.83-87 |
| SDM, ED (Workshop) |
2012-06-29 09:45 |
Okinawa | Okinawa Seinen-kaikan | [Invited Talk]
Silicon on Thin Buried Oxide (SOTB) Technology for Ultralow-Power (ULP) Applications Nobuyuki Sugii, Toshiaki Iwamatsu, Yoshiki Yamamoto, Hideki Makiyama, Takaaki Tsunomura, Hirofumi Shinohara, Hideki Aono, Hidekazu Oda, Shiro Kamohara, Yasuo Yamaguchi (LEAP/Renesas), Tomoko Mizutani, Toshiro Hiramoto (IIS, Univ. of Tokyo) |
Needs for low-power CMOS devices are still increasing. Ultralow-voltage-operation CMOS with maximum power efficiency can... [more] | |
| SDM | 2012-03-05 10:05 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Keynote Address]
Development of Ultra Low Voltage Devices utilizing BEOL Process Shin'ichiro Kimura (LEAP) SDM2011-176 |
Resistive-change non-volatile devices, in which variable resistance materials are embedded during Back-end of Line proce... [more] | SDM2011-176 pp.1-5 |
| ICD | 2011-04-18 15:20 |
Hyogo | Kobe University Takigawa Memorial Hall | [Invited Talk]
Trend in Phase Change Memory and activity in TIA Norikatsu Takaura (LEAP) ICD2011-6 |
This paper reports on trend in phase change memory (PCM) and research activity in Tsukuba Innovation Arena (TIA) . We di... [more] | ICD2011-6 pp.33-36 |
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