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Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, CPM 2005-01-28
16:15		 Tokyo Kikai-Shinko-Kaikan Bldg. New SoC Testing technologies for beyond 65nm process rule -- New Failure Analysis and Testing methodologies for low-k/Cu Interconnect technique --
Makoto Yamazaki, Yasuo Furukawa (ADVANTEST) 		To solve the problems such as the yield improvements and securing the test quality in the SoC devices made efficient, th... [more] CPM2004-173 ICD2004-218
pp.65-70
IE, SIP, ICD, IPSJ-SLDM 2004-10-22
10:10		 Yamagata   An Image Recognition Processor Using Dynamically Reconfigurable ALU
Naoto Miyamoto, Koji Kotani (Tohoku University), Kazuyuki Maruo (Advantest), Tadahiro Ohmi (Tohoku University) 		An image recognition processor implementing phase only correlation (POC) algorithm is proposed. Arithmetic logical unit ... [more] SIP2004-91 ICD2004-123 IE2004-67
pp.13-18
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