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Chair |
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Shigeru Yanagi |
Vice Chair |
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Kazuaki Wakai |
Secretary |
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Tetsushi Yuge, Mitsuhiro Kimura |
Assistant |
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Naoto Kaio, Hisoyasu Mawatari |
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Conference Date |
Fri, Sep 14, 2007 10:30 - 15:50 |
Topics |
For LSI, evaluation, fault diagnosis, physical analysis and quality |
Conference Place |
Kochi University of Technology |
Address |
Miyanokuchi 185,Tosayamada-cho,Kami-shi,Kochi,782-8502,JAPAN |
Transportation Guide |
http://www.kochi-tech.ac.jp/kut_J/access/index.html |
Contact Person |
Prof. Masaru Sanada
0887-57-2118 |
Sponsors |
This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan.
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Copyright and reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Fri, Sep 14 AM 10:30 - 15:50 |
(1) |
10:30-10:55 |
Material Processing by Microplasma in SEM R2007-29 |
Hidenori Ohi, Yasuaki Okazaki, Tomoyoshi Takahashi, Akimitsu Hatta (Kochi Univ. Technol.) |
(2) |
10:55-11:20 |
Fault logic trace by Using Transistor Operating Point Analysis
-- Diagnosis of Feed Back Fault with Oscillating Phenomenon -- R2007-30 |
Masaru Sanada, Tonoya Nakamura, Keishi Hashida (KUT) |
(3) |
11:20-11:45 |
An idea of fault model by RC network, and the transistor level fault diagnosis trial. R2007-31 |
Yutaka Yoshizawa (NEC Electoronics) |
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11:45-13:10 |
Lunch Break ( 85 min. ) |
(4) |
13:10-13:40 |
[Invited Talk]
The Latest Trend of Defect Modeling in LSI Diagnosis
-- Tutorial -- R2007-32 |
Yasuo Sato (Hitachi) |
(5) |
13:40-14:05 |
An expanded Per-Test X-Fault Diagnosis Method for LSI Circuits R2007-33 |
Yusuke Nakamura, Yuta Yamato, Xiaoqing Wen, Kohei Miyase, Seiji Kajihara (KIT), K. K. Saluja (Univ. of Wisconsin) |
(6) |
14:05-14:30 |
Evaluation of transmission line for LSI tester and simulation modeling R2007-34 |
Hidekazu Tsuchiya, Takeshi Asakawa (Tokai univ.), Masayuki Sato (Genesis technology) |
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14:30-15:00 |
Break ( 30 min. ) |
(7) |
15:00-15:25 |
The failure analyses and the article of good quality analysis of the electronic component
-- The efforts for the reliability improvement of the electronic component which is for automobile use -- R2007-35 |
Yasuo Imai, Daiki Tanaka (OEG) |
(8) |
15:25-15:50 |
Structural analysis as quality evaluation of LSI manufacturing. R2007-36 |
Masahito Kajinuma, Akira Mizoguchi, Koichirou Takeuchi (MELCO) |
Announcement for Speakers |
General Talk (25) | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
Contact Address and Latest Schedule Information |
R |
Technical Committee on Reliability (R) [Latest Schedule]
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Contact Address |
Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E-: gen |
Last modified: 2007-08-27 09:13:42
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