IEICE Technical Committee Submission System
Advance Program
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top  Go Back   Prev R Conf / Next R Conf [HTML] / [HTML(simple)] / [TEXT]  [Japanese] / [English] 


Technical Committee on Reliability (R) [schedule] [select]
Chair Mitsuhiro Kimura (Hosei Univ.)
Vice Chair Hiroyasu Mawatari (NTT)
Secretary Akira Asato (Fujitsu), Hiroyuki Okamura (Hiroshima Univ.)
Assistant Nobuyuki Tamura (Hosei Univ.), Maratt Zanikef (Kyushu Inst. of Tech.)

Conference Date Thu, Nov 14, 2013 14:00 - 16:30
Topics  
Conference Place  
Sponsors This conference is co-sponsored by IEEE Reliability Society Japan Chapter. This conference is technical co-sponsored by Reliability Engineering Association of Japan.
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Thu, Nov 14 PM 
14:00 - 16:30
(1) 14:00-14:25 Newest non-destructive X-ray inspection technology of conducting research and development and failure analysis
-- It introduces from the foundation to application. --
R2013-74
Masahito Natsuhara (shimadzu)
(2) 14:25-14:50 Effective non-destructive defect localization by using Enhanced Lock-In Thermography R2013-75 Toshinobu Nagatomo (DCG Systems)
(3) 14:50-15:15 Effect of Plate-Shape Ni-Sn IMC on the Growth Mechanism of Tin Whisker under Thermal Shock Stress R2013-76 Akira Saito, Akira Okamoto, Yoshihiro Iwahori, Makoto Ogawa (Mutrata MFG), Akihiro Motoki (Sabae Mutrata MFG)
(4) 15:15-15:40 A Study on Sn-whisker growth by thermal cycle R2013-77 Sadanori Itou (Itoken office)
(5) 15:40-16:05 Bayesian Reliability Analysis for Software Debugging Processes Based on Remaining Errors R2013-78 Toru Kaise (Univ. of Hyogo)
(6) 16:05-16:30 Issues and Perspectives of Dependable LSI Design Koichiro Takayama, Akira Asato (Fujitsu)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Akira Asato (FUJITSU)
E-: a 


Last modified: 2013-09-25 15:02:06


Notification: Mail addresses are partially hidden against SPAM.

[Download Paper's Information (in Japanese)] <-- Press download button after click here.
 

[On-Site Price List of Paper Version of Proceedings (Technical Report)] (in Japanese)
 
[Presentation and Participation FAQ] (in Japanese)
 
[Cover and Index of IEICE Technical Report by Issue]
 

[Return to R Schedule Page]   /  
 
 Go Top  Go Back   Prev R Conf / Next R Conf [HTML] / [HTML(simple)] / [TEXT]  [Japanese] / [English] 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan