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Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Hideaki Sone (Tohoku Univ.)
Vice Chair Makoto Hasegawa (Chitose Inst. of Science and Tech.), Ryo Nagase (NTT)
Secretary Kiyoshi Yoshida (Nippon Inst. of Tech.), Toru Kawai (JAE)
Assistant Junya Sekikawa (Shizuoka Univ.)

Technical Committee on Reliability (R) [schedule] [select]
Chair Shigeru Yanagi (National Defense Academy)
Vice Chair Kazuaki Wakai (NHK)
Secretary Tetsushi Yuge (National Defense Academy), Mitsuhiro Kimura (Hosei Univ.)
Assistant Naoto Kaio (Hiroshima Shudo Univ.), Hisoyasu Mawatari (NTT)

Conference Date Fri, Feb 15, 2008 10:30 - 17:15
Topics  
Conference Place  
Contact
Person
077-565-5459
Sponsors This conference is co-sponsored by EEE Reliability Society Japan Chapter and Reliability Engineering Association of Japan.
Copyright
and
reproduction
以下の論文すべての著作権はIEICEに帰属します.(許諾番号:10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Fri, Feb 15 AM 
10:30 - 16:20
  10:30-10:40 Opening Address ( 10 min. )
(1) 10:40-11:05 Development of Simple ESD Checker and it's Application
-- Detection of ESD Checker and it's Application --
R2007-59 EMD2007-114
Norio Yamasaki, Masaru Sanada (KUT)
(2) 11:05-11:30 Reliability design and applications for the Non power supply type optical transmission unit R2007-60 EMD2007-115 Yoshikazu Toba (Seikoh Giken), Kazuaki Wakai (ITEC)
  11:30-13:00 Lunch ( 90 min. )
(3) 13:00-13:25 Decomposition process of silicone and electrical contact failure
-- Influence of silicone contamination on contact devices --
R2007-61 EMD2007-116
Terutaka Tamai (Mie Univ.), Yasuhiro Hattori, Hirosaka Ikeda (ANT)
(4) 13:25-13:50 Degradation phenomenon of electrical contacts by 3-D oscillating mechanism
-- 3-D oscillating mechanism for trial --
R2007-62 EMD2007-117
Shin-ichi Wada, Hiroshi Amao, Hiroto Minegishi, Keiji Koshida, Taketo Sonoda, Mitsuo Kikuchi, Hiroaki Kubota (TMC), Koichiro Sawa (Keio Univ.)
(5) 13:50-14:15 Contact Resistance Characteristics of Tin Plated Contacts with Switching Operation and Surface Observation R2007-63 EMD2007-118 Shinya Nakamura, Yuji Yamashita, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetwork)
(6) 14:15-14:40 Study of Behavior of Contact Resistance of Fretting Corrosion R2007-64 EMD2007-119 Naoyuki Sato, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (AutoNetworks)
  14:40-14:55 Break ( 15 min. )
(7) 14:55-15:20 Accuracy Improvement of Dual Wavelength Push-pull Reflectometry (DWPR) Using a Total Reflector R2007-65 EMD2007-120 Yasutoshi Komatsu, Keiichi Inoue, Seiichi Onoda (Watanabe Co.,Ltd.,), Nobuo Tsukamoto (DSP Technology Associaetes, Inc.)
(8) 15:20-15:45 The investigation of the material for hermetic sealing
-- About gas permeation of materials --
R2007-66 EMD2007-121
Tetsuo Hayase, Ichizo Sakamoto (OC.)
(9) 15:45-16:10 Reliability of Optical Connector Assembled with Instant Adhesive R2007-67 EMD2007-122 Shuichi Yanagi, Shinsuke Matsui, Shigeru Hosono, Ryo Nagase (NTT)
  16:10-16:20 Break ( 10 min. )
Fri, Feb 15  
16:20 - 17:15
(10) 16:20-17:10 [Special Talk]
Holography and Its Application to Reliability Evaluation of the Electromechnical Devices R2007-68 EMD2007-123
Masanari Taniguchi (Tohoku Bunka Gakuen University)
  17:10-17:15 Closing Address ( 5 min. )

Contact Address and Latest Schedule Information
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Toru Kawai(JAE)
TEL (042) 549-9262、FAX (042) 549-9583
E-: itjae
Kiyoshi Yoshida(NIT)
TEL (0480) 33-7668、FAX (0480) 33-7680
E-: t
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tjkipc 
Announcement Latest information will be presented on the homepage: http://www.ieice.org/es/emd/jpn/
R Technical Committee on Reliability (R)   [Latest Schedule]
Contact Address Tetsushi Yuge (National Defense Academy)
TEL +81-46-841-3810
FAX +81-46-844-5903
E-: gen 


Last modified: 2007-12-13 18:53:35


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