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| Chair |
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Tomohiro Yoneda (NII) |
| Vice Chair |
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Seiji Kajihara (Kyushu Inst. of Tech.) |
| Secretary |
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Masato Kitagami (Chiba Univ.), Michinobu Nakao (Renesas) |
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| Conference Date |
Mon, Feb 14, 2011 10:00 - 16:30 |
| Topics |
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| Conference Place |
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| Transportation Guide |
http://www.jspmi.or.jp/mapright.htm |
Copyright
and
reproduction |
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034) |
Mon, Feb 14 AM
10:00 - 10:50 |
| (1) |
10:00-10:25 |
The development of the DDR3 memory module tester used on memory test processor  DC2010-59 |
Takeshi Asakawa, Satoshi Matsuno (Tokai Univ.), Hidekazu Tsuchiya (Hitachi), Tatsuya Seki, Shinichi Kmazawa (Techinica) |
| (2) |
10:25-10:50 |
Capture-Safety Checking Based on Transition-Time-Relation for At-Speed Scan Test Vectors DC2010-60 |
Ryota Sakai, Kohei Miyase, Xiaoqing Wen (Kyushu Inst. of Tech.), Masao Aso, Hiroshi Furukawa (RMS), Yuta Yamato (Fukuoka Ind. Sci & Tech/Fundation FIST), Seiji Kajihara (Kyushu Inst. of Tech.) |
| |
10:50-11:00 |
Break ( 10 min. ) |
Mon, Feb 14 AM
11:00 - 12:15 |
| (3) |
11:00-11:25 |
An Analysis of Critical Paths for Field Testing with Process Variation Consideration DC2010-61 |
Satoshi Kashiwazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushuu Univ) |
| (4) |
11:25-11:50 |
Variation Aware Test Methodology Based on Statistical Static Timing Analysis DC2010-62 |
Michihiro Shintani, Kazumi Hatayama, Takashi Aikyo (STARC) |
| (5) |
11:50-12:15 |
A Pattern Generation Method to Uniform Initial Temperature of Test Application DC2010-63 |
Emiko Kosoegawa, Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (NAIST/JST) |
| |
12:15-13:45 |
Lunch Break ( 90 min. ) |
Mon, Feb 14 PM
13:45 - 15:00 |
| (6) |
13:45-14:10 |
Test Pattern Generation for Highly Accurate Delay Testing DC2010-64 |
Keigo Hori (NAIST), Tomokazu Yoneda, Michiko Inoue, Hideo Fujiwara (NAIST/JST) |
| (7) |
14:10-14:35 |
A Test Generation Method for Datapath Circuits Using Functional Time Expansion Models DC2010-65 |
Teppei Hayakawa, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) |
| (8) |
14:35-15:00 |
Test Pattern Selection for Defect-Aware Test DC2010-66 |
Hiroshi Furutani, Takao Sakai, Yoshinobu Higami, Hiroshi Takahashi (Ehime Univ.) |
| |
15:00-15:15 |
Break ( 15 min. ) |
Mon, Feb 14 PM
15:15 - 16:30 |
| (9) |
15:15-15:40 |
An Extended 2-D FPGA Array for CIP Circuit DC2010-67 |
Jiang Li, Kenichi Takahashi, Hakaru Tamukoh, Masatoshi Sekine (TUAT) |
| (10) |
15:40-16:05 |
Dual Edge Triggered Flip-Flops for Blocking Noise Pulses on Data Signal Lines DC2010-68 |
Yukiya Miura (Tokyo Metropolitan Univ.) |
| (11) |
16:05-16:30 |
Note on Area Overhead Reduction for Reconfigurable On-Chip Debug Circui DC2010-69 |
Masayuki Arai, Yoshihiro Tabata, Kazuhiko Iwasaki (Tokyo Metro. Univ.) |
| Announcement for Speakers |
| General Talk | Each speech will have 20 minutes for presentation and 5 minutes for discussion. |
| Contact Address and Latest Schedule Information |
| DC |
Technical Committee on Dependable Computing (DC) [Latest Schedule]
|
| Contact Address |
Masato Kitakami
Graduate School of Advanced Integration Science,
Chiba University
1-33 Yayoi-cho Inage-ku, Chiba 263-8522 JAPAN
TEL/FAX +43.290.3039
E- :    f ulty  ba-u |
Last modified: 2011-01-21 09:46:15
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