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Technical Committee on Electromechanical Devices (EMD) [schedule] [select]
Chair Kiyoshi Yoshida (Nippon Inst. of Tech.)
Vice Chair Makoto Hasegawa (Chitose Inst. of Science and Tech.)
Secretary Junya Sekikawa (Shizuoka Univ.), Nobuhiro Kuga (Yokohama National Univ.)
Assistant Yasuhiro Hattori (Sumitomo Denso)

Conference Date Fri, Jan 28, 2011 13:00 - 16:30
Topics Electromechanical Devices 
Conference Place Japan Aviation Electronics Industry,Limited 
Address 1-1, Musashino 3-chome, Akishima-shi, Tokyo 196-8555, Japan
Transportation Guide http://www.jae.co.jp/intro/mp_akisima.html
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)

Fri, Jan 28 PM 
13:00 - 16:30
(1) 13:00-13:25 A Discussion on Carbon Arc V-I Characteristics EMD2010-135 Keiichi Suhara (TNCT)
(2) 13:25-13:50 Three-Dimensional Micro-Structural Study of Tin Plated Fretting Contacts EMD2010-136 Tetsuya Ito, Shigeru Ogihara, Yasuhiro Hattori (ANT)
(3) 13:50-14:15 Measurement of Contact Resistance Distribution in Fretting Corrosion Track for the Tin Plated Contacts EMD2010-137 Soushi Masui, Shigeru Sawada, Terutaka Tamai (Mie Univ), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ)
(4) 14:15-14:40 Fretting characteristics about the shape and weight of tin-plated contacts EMD2010-138 Tomishige Tai, Tetsuya Komoto (JAE)
  14:40-14:50 Break ( 10 min. )
(5) 14:50-15:15 Design of Optical Rotary Link Joint Using Coaxial Multi-core Plastic Optical Fiber EMD2010-139 Kazuya Kaba, Makoto Kawashima (Chubu Univ), Shunsuke Kawabata (Ihara Electronic), Seiji Sashou (Asahi Kasei E-materials)
(6) 15:15-15:40 Effects of resin-clay nanocomposites on the ionic migration inhibitors in Ag-printed circuits EMD2010-140 Yasuyuki Ohtani, Shin-ichiro Nakajima (JAE)
(7) 15:40-16:05 Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (1) --
EMD2010-141
Shin-ichi Wada, Keiji Koshida, Saindaa Norovling, Masahiro Kawanobe, Daiki Ishizuka, Kunio Yanagi, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT)
(8) 16:05-16:30 Degradation phenomenon of electrical contacts by a tapping device
-- A tapping device for trial (2) --
EMD2010-142
Keiji Koshida, Shin-ichi Wada, Saindaa Norovling, Masahiro Kawanobe, Masayoshi Kotabe, Hiroaki Kubota (TMC), Nobuhiro Kuga (Yokohama Nat'l Univ.), Koichiro Sawa (NIT)

Announcement for Speakers
General TalkEach speech will have 20 minutes for presentation and 5 minutes for discussion.

Contact Address and Latest Schedule Information
EMD Technical Committee on Electromechanical Devices (EMD)   [Latest Schedule]
Contact Address Makoto Hasegawa(Chitose Inst. of Science and Technorogy)
TEL (0123)27-6059、FAX (0123)27-6059
E-: pn
Junya Sekikawa (Shizuoka Univ.)
TEL (053) 478-1618、FAX (053) 478-1618
E-: tjkipc
Yasuhiro Hattori(Sumitomo Wiring Systems, Ltd.)
TEL (059)382-8970、FAX (059)382-8591
E-: -tsws 
Announcement Latest information will be presented on the homepage:
http://www.ieice.org/es/emd/jpn/


Last modified: 2011-01-25 18:31:18


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