Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM, ED |
2011-02-23 13:30 |
Hokkaido |
Hokkaido Univ. |
[Invited Talk]
Toward Silicide-based solar cells and spintronics Takashi Suemasu, Takanobu Saito, Atsushi Okada, Katsuaki Tou, M. Ajmal Khan, Du Weijie, Kenji Makabe, Keita Ito, Kazunori Harada (Univ. Tsukuba), Noritaka Usami (Tohoku Univ.) ED2010-192 SDM2010-227 |
[more] |
ED2010-192 SDM2010-227 pp.1-5 |
SDM, ED |
2011-02-23 14:10 |
Hokkaido |
Hokkaido Univ. |
A novel refrigerator using a single-electron-pump operation fabricated from semiconductor materials Hiroya Ikeda, Faiz Salleh (Shizuoka Univ.) ED2010-193 SDM2010-228 |
We propose a novel single-electron-refrigerator which consists of a single-electron box and a single-electron pump. Its ... [more] |
ED2010-193 SDM2010-228 pp.7-12 |
SDM, ED |
2011-02-23 14:35 |
Hokkaido |
Hokkaido Univ. |
Theoretical Estimation of Seebeck Coefficient in P-Doped Si Ultrathin Si Films Faiz Salleh, Hiroya Ikeda (Shizuoka Univ.) ED2010-194 SDM2010-229 |
[more] |
ED2010-194 SDM2010-229 pp.13-17 |
SDM, ED |
2011-02-23 15:15 |
Hokkaido |
Hokkaido Univ. |
Room-Temperature Operation of Planar-Type Ferromagnetic Tunnel Junctions Fabricated by Stepwise Feedback-Controlled Electromigration Ryutarou Yasutake, Takato Watanabe, Shunsuke Ueno, Jun Kitagawa, Jun-ichi Shirakashi (Tokyo Univ. of Agr. & Tech.) ED2010-195 SDM2010-230 |
[more] |
ED2010-195 SDM2010-230 pp.19-23 |
SDM, ED |
2011-02-23 15:40 |
Hokkaido |
Hokkaido Univ. |
Development of Miniaturized Electron Optical Column in micro scale and its Application to Mask-less Lithography Yoichiro Neo, Yasuo Takagi, Takahiro Fujino, Akifumi Koike (Shizuoka Univ. RIE), Masayoshi Nagao, Tomoya Yoshida, Takashi Nishi (ASIT), Hidekazu Murata, Kentaro Sakai (Meijo Univ.), Toru Aoki, Hidenori Mimura (Shizuoka Univ. RIE) ED2010-196 SDM2010-231 |
[more] |
ED2010-196 SDM2010-231 pp.25-29 |
SDM, ED |
2011-02-23 16:05 |
Hokkaido |
Hokkaido Univ. |
Characterization of carbon nanotube thin-film transistors by scanning probe microscopy Yuki Okigawa, Yutaka Ohno (Nagoya Univ.), Shigeru Kishimoto (Nagoya Univ./VBL, Nagoya Univ.), Takashi Mizutani (Nagoya Univ.) ED2010-197 SDM2010-232 |
The electrical properties of CNT-FETs fabricated using PECVD were studied by scanning probe microscopy. The measured res... [more] |
ED2010-197 SDM2010-232 pp.31-36 |
SDM, ED |
2011-02-23 16:30 |
Hokkaido |
Hokkaido Univ. |
A Study on Precise FinFET High Frequency Characteristic Evaluation Method Hideo Sakai (Keio Univ.), Shinichi Ouchi, Takashi Matsukawa, Kazuhiko Endo, Yongxun Liu, Junichi Tsukada, Yuki Ishikawa, Tadashi Nakagawa, Toshihiro Sekigawa, Hanpei Koike, Kunihiro Sakamoto, Meishoku Masahara (AIST), Hiroki Ishikuro (Keio Univ.) ED2010-198 SDM2010-233 |
In recent years, different research groups have been focusing on FinFET transistor research as an excellent replacement ... [more] |
ED2010-198 SDM2010-233 pp.37-42 |
SDM, ED |
2011-02-23 16:55 |
Hokkaido |
Hokkaido Univ. |
Capacitance measurements of sub-micron Al junctions using SQUID resonance Kento Kikuchi, Masataka Moriya, Hiroshi Shimada, Yoshinao Mizugaki (Univ. of Electro-Comm.) ED2010-199 SDM2010-234 |
It is necessary to extract the capacitances, resistances and inductances experimentally for fabrication sub-micron Al ju... [more] |
ED2010-199 SDM2010-234 pp.43-48 |
SDM, ED |
2011-02-24 09:30 |
Hokkaido |
Hokkaido Univ. |
Fabrication of GaAs-based Nanowire CCD Controlled by Schottky Wrap Gates and Characterization of Its Charge Transfer Operation Yuki Nakano, Kensuke Miura, Yuta Shiratori (Hokkaido Univ.), Seiya Kasai (Hokkaido Univ./JST) ED2010-200 SDM2010-235 |
For synchronization of nanowire-based integrated circuits,a GaAs nanowire charge-coupled device (CCD) controlled by Scho... [more] |
ED2010-200 SDM2010-235 pp.49-52 |
SDM, ED |
2011-02-24 09:55 |
Hokkaido |
Hokkaido Univ. |
A Traveling Wave Amplifier Based on Resonant Tunneling Diode Pairs Employing Composite Right/Left Handed Transmission Line Configuration Koichi Maezawa, Koji Kasahara, Jie Pan, Masayuki Mori (Univ. Toyama) ED2010-201 SDM2010-236 |
This paper proposes a traveling wave amplifier based on transmission
lines (TLs) periodically loaded with resonant tu... [more] |
ED2010-201 SDM2010-236 pp.53-56 |
SDM, ED |
2011-02-24 10:20 |
Hokkaido |
Hokkaido Univ. |
Single-Electron Transfer between Two Donors in Thin Nanoscale Silicon Transistors Daniel Moraru, Earfan Hamid, Juli Cha Tarido, Sakito Miki, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-202 SDM2010-237 |
[more] |
ED2010-202 SDM2010-237 pp.57-62 |
SDM, ED |
2011-02-24 10:45 |
Hokkaido |
Hokkaido Univ. |
Electrical Characteristics of Si Single-Electron Transistor with Single-Carrier Trap Formed by Photo-Irradiation Michito Shinohara, Yuki Kato, Kei Mikami, Masashi Arita (Hokkaido Univ), Akira Fujiwara (NTT), Yasuo Takahashi (Hokkaido Univ) ED2010-203 SDM2010-238 |
It is well known that step-like current jumps are observed when huge vertical electric field are applied to a Si single-... [more] |
ED2010-203 SDM2010-238 pp.63-66 |
SDM, ED |
2011-02-24 11:10 |
Hokkaido |
Hokkaido Univ. |
Current Intermittency in SOI-FETs under Light Illumination Arief Udhiarto, Daniel Moraru, Ryusuke Nakamura, Takeshi Mizuno, Michiharu Tabe (Shizuoka Univ.) ED2010-204 SDM2010-239 |
We investigate the effects of continuous light illumination on single-electron transport via quantum dots in silicon-on-... [more] |
ED2010-204 SDM2010-239 pp.67-72 |
SDM, ED |
2011-02-24 11:35 |
Hokkaido |
Hokkaido Univ. |
Stochastic resonance using single electrons Katsuhiko Nishiguchi, Akira Fujiwara (NTT) ED2010-205 SDM2010-240 |
We demonstrate stochastic resonance (SR) with single electrons (SEs) using nanoscale metal-oxide-semiconductor field-eff... [more] |
ED2010-205 SDM2010-240 pp.73-77 |
SDM, ED |
2011-02-24 12:00 |
Hokkaido |
Hokkaido Univ. |
Characterization of Single-Electron Stochastic Resonance in A Quantum Dot and Its Parallel Network Seiya Kasai (Hokkaido Univ./JST), Yuta Shiratori, Kensuke Miura, Yuki Nakano (Hokkaido Univ.) ED2010-206 SDM2010-241 |
We investigate the effect of physical variation on single-electron stochastic resonance (SE-SR) in the quantum-dot paral... [more] |
ED2010-206 SDM2010-241 pp.79-82 |