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Technical Committee on Integrated Circuits and Devices (ICD)  (Searched in: 2017)

Search Results: Keywords 'from:2017-04-20 to:2017-04-20'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 18 of 18  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD 2017-04-20
10:10
Tokyo   [Invited Lecture] Voltage-Control Spintronics Memory(VoCSM) Having Potentials of Ultra-Low Energy-Consumption and High-Density
Hiroaki Yoda, Naoharu Simomura, Yuichi Osawa, Satoshi Shiratori, Yushi Kato, Iguchi Tomoaki, Yuzou Kamiguchi, Buyandalai Altansargai, Yoshiaki Saito, Katsuhiko Koi, Sugiyama Hideyuki, Souichi Oikawa, Shimizu Mariko, Miaue Ishikawa, Kazutaka Ikegami (Toshiba) ICD2017-1
 [more] ICD2017-1
pp.1-4
ICD 2017-04-20
10:35
Tokyo   [Invited Lecture] Sub-3 ns pulse with sub-100 uA switching of 1x-2x nm perpendicular MTJ for high-performance embedded STT-MRAM towards sub-20 nm CMOS
Daisuke Saida, Saori Kashiwaad, Megumi Yakabe, Tadaomi Daibou, Junichi Ito, Hiroki Noguchi, Keiko Abe, Shinobu Fujita (Toshiba), Miyoshi Fukumoto, Shinji Miwa, Yoshishige Suzuki (Osaka Univ.) ICD2017-2
 [more] ICD2017-2
pp.5-9
ICD 2017-04-20
11:00
Tokyo   [Invited Talk] A 4Gb LPDDR2 STT-MRAM with Compact 9F2 1T1MTJ Cell and Hierarchical Bitline Architecture
Kenji Tsuchida (Toshiba), Kwangmyoung Rho, Dongkeun Kim (SK hynix), Yutaka Shirai (Toshiba), Jihyae Bae (SK hynix), Tsuneo Inaba, Hiromi Noro (Toshiba), Hyunin Moon, Sungwoong Chung (SK hynix), Kazumasa Sunouchi (Toshiba), Jinwon Park, Kiseon Park (SK hynix), Akihito Yamamoto (Toshiba), Seoungju Chung, Hyeongon Kim (SK hynix) ICD2017-3
The experimental 4-Gbit STT-MRAM with 9F2 1T1MTJ cell of 90nm by 90nm is presented. Hierarchical bit line architecture a... [more] ICD2017-3
pp.11-16
ICD 2017-04-20
13:00
Tokyo   [Invited Talk] Study on Nano-Dot Structure Permanent Memory
Tsuyoshi Watanabe, Noriyuki Miura, Shijia Liu, Shigeki Imai, Makoto Nagata (Kobe Univ.) ICD2017-4
We propose a permanent digital memory system in which data is saved by a presence of metal nano-dot at interconnects of ... [more] ICD2017-4
pp.17-22
ICD 2017-04-20
13:50
Tokyo   [Invited Lecture] A 1.0 V Operation NAND Flash Memory Program Voltage Generator Fabricated with Standard CMOS Process and NAND Flash Process for IoT Local Devices
Kota Tsurumi, Masahiro Tanaka, Ken Takeuchi (Chuo Univ.) ICD2017-5
NAND flash memory is considered as candidates for data storage of IoT local devices. The NAND flash memory program volta... [more] ICD2017-5
pp.23-28
ICD 2017-04-20
14:15
Tokyo   [Invited Lecture] TLC NAND Flash Memory Control Techniques to Reduce Errors of Read-Hot and Cold Data for Data Centers
Toshiki Nakamura, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2017-6
In cloud data centers, NAND flash memory stores both read-hot and cold data. This paper describes that the threshold vol... [more] ICD2017-6
pp.29-34
ICD 2017-04-20
14:55
Tokyo   [Invited Lecture] First demonstration of FinFET Split-Gate MONOS for High-Speed and Highly-Reliable Embedded Flash in 16/14nm-node and beyond
Shibun Tsuda, Yoshiyuki Kawashima, Kenichiro Sonoda, Atsushi Yoshitomi, Tatsuyoshi Mihara, Shunichi Narumi, Masao Inoue, Seiji Muranaka, Takahiro Maruyama, Tomohiro Yamashita, Yasuo Yamaguchi (Renesas Electronics), Digh Hisamoto (Hitachi) ICD2017-7
FinFET split-gate metal-oxide nitride oxide silicon (SG-MONOS) Flash memories have been fabricated and operated for the ... [more] ICD2017-7
pp.35-38
ICD 2017-04-20
15:20
Tokyo   [Invited Talk] Embedded Flash Technology for Automotive Applications
Masaya Nakano, Takashi Ito, Tadaaki Yamauchi, Yasuo Yamaguchi, Takashi Kono, Hideto Hidaka (Renesas Electronics) ICD2017-8
Higher fuel-efficient engine and advanced driver assistance system (ADAS) require the further progress of embedded Flash... [more] ICD2017-8
pp.39-44
ICD 2017-04-20
16:10
Tokyo   [Invited Talk] A 512Gb 3b/Cell Flash Memory on 64-Word-Line-Layer BiCS Technology
Ryuji Yamashita, Sagar Magia (WDC), Tsutomu Higuchi, Kazuhide Yoneya, Toshio Yamamura (Toshiba), Hiroyuki Mizukoshi, Shingo Zaitsu, Minoru Yamashita, Shunichi Toyama, Norihiro Kamae, Juan Lee, Shuo Chen, Jiawei Tao, William Mak, Xiaohua Zhang (WDC) ICD2017-9
A 512Gb 3b/cell flash has been developed on a 64-WL-layer BiCS technology. By using a four-block-EOC row decoding approa... [more] ICD2017-9
pp.45-50
ICD 2017-04-21
09:35
Tokyo   [Invited Lecture] Architectures and energy performance of nonvolatile SRAM for core-level nonvolatile power-gating
Daiki Kitagata, Yusuke Shuto, Shuu'ichirou Yamamoto, Satoshi Sugahara (Tokyo Inst. of Tech.) ICD2017-10
Architectures and energy performance of nonvolatile SRAM (NV-SRAM) are demonstrated for nonvolatile power-gating (NVPG) ... [more] ICD2017-10
pp.51-56
ICD 2017-04-21
10:00
Tokyo   [Invited Lecture] A 55nm Ultra Low Leakage Deeply Depleted Channel Technology Optimized for Energy Minimization in Subthreshold SRAM and Logic
Harsh N. Patel, Abhishek Roy, Farah B. Yahya, Ningxi Liu, Benton Calhoun (UVA), Akihiko Harada (FEA), Kazuyuki Kumeno, Makoto Yasuda, Taiji Ema (MIFS) ICD2017-11
This paper presents an Ultra-Low Leakage (ULL) 55nm Deeply Depleted Channel (DDC) process technology. The 6T SRAM array ... [more] ICD2017-11
pp.57-61
ICD 2017-04-21
10:25
Tokyo   [Invited Lecture] A 6.05-Mb/mm2 16-nm FinFET Double Pumping 1W1R 2-port SRAM with 313ps Read Access Time
Yohei Sawada, Makoto Yabuuchi, Masao Morimoto (REL), Toshiaki Sano (RSD), Yuichiro Ishii, Shinji Tanaka (REL), Miki Tanaka (RSD), Koji Nii (REL) ICD2017-12
 [more] ICD2017-12
pp.63-65
ICD 2017-04-21
11:00
Tokyo   [Invited Lecture] Highly reliable Cu atom switch using thermally tolerant Polymer-solid Electrolyte (TT-PSE) for Nonvolatile Programmable Logic
Koichiro Okamoto, Munehiro Tada, Naoki Banno, Noriyuki Iguchi, Hiromitsu Hada, Toshitsugu Sakamoto, Makoto Miyamura, Yukihide Tsuji, Ryusuke Nebashi, Ayuka Morioka, Xu Bai, Tadahiko Sugibayashi (NEC) ICD2017-13
Robust Cu atom switch with higher operation reliability has been developed featuring an over-400C thermally tolerant pol... [more] ICD2017-13
pp.67-72
ICD 2017-04-21
11:25
Tokyo   [Invited Lecture] A 2x Logic Density Programmable Logic Array using Atom Switch
Yukihide Tsuji, Xu Bai, Ayuka Morioka, Miyamura Makoto, Ryusuke Nebashi, Toshitsugu Sakamoto, Munehiro Tada, Naoki Banno, Koichiro Okamoto, Noriyuki Iguchi, Hiromitsu Hada, Tadahiko Sugibayashi (NEC) ICD2017-14
(To be available after the conference date) [more] ICD2017-14
pp.73-78
ICD 2017-04-21
13:00
Tokyo   [Invited Lecture] High-Density User-Programmable Logic Array Based on Adjacent Integration of Pure-CMOS Crossbar Antifuse into Logic CMOS Circuits
Shinichi Yasuda, Masato Oda, Mari Matsumoto, Kosuke Tatsumura, Koichiro Zaitsu, Ying-Hao Ho, Mizuki Ono (Toshiba) ICD2017-15
 [more] ICD2017-15
pp.79-83
ICD 2017-04-21
13:25
Tokyo   [Invited Lecture] Demonstration of HfO2-Based Ferroelectric Tunnel Junction (FTJ)
Marina Yamaguchi, Shosuke Fujii, Yuuichi Kamimuta, Tsunehiro Ino, Riichiro Takaishi, Yasushi Nakasaki, Masumi Saitoh (Toshiba) ICD2017-16
In recent years, two remarkable progresses have been made on ferroelectric materials and devices. One is the demonstrati... [more] ICD2017-16
pp.85-88
ICD 2017-04-21
13:50
Tokyo   [Invited Lecture] Embedded Memory and ARM Cortex-M0 Core Using 60-nm CAAC-IGZO FET Integrated with 65-nm Si CMOS
Tatsuya Onuki, Atsuo Isobe, Yoshinori Ando, Satoru Okamoto, Kiyoshi Kato (Semiconductor Energy Laboratory), T R Yew, Chen Bin Lin, J Y Wu, Chi Chang Shuai, Shao Hui Wu (United Microelectronics Corporation), James Myers (ARM), Klaus Doppler (Nokia Technologies), Masahiro Fujita (The Univ. of Tokyo), Shunpei Yamazaki (Semiconductor Energy Laboratory) ICD2017-17
 [more] ICD2017-17
pp.89-93
ICD 2017-04-21
14:15
Tokyo   [Invited Talk] A 1/2.3in 20Mpixel 3-Layer Stacked CMOS Image Sensor with DRAM
Tsutomu Haruta, Tsutomu Nakajima, Jun Hashizume, Taku Umebayashi, Hiroshi Takahashi, Kazuo Taniguchi, Masami Kuroda, Hiroshi Sumihiro, Koji Enoki (Sony Semiconductor Solutions), Takatsugu Yamasaki (Sony Semiconductor Manufacturing), Katsuya Ikezawa, Atsushi Kitahara, Masao Zen, Masafumi Oyama, Hiroki Koga (Sony Semiconductor Solutions) ICD2017-18
 [more] ICD2017-18
pp.95-98
 Results 1 - 18 of 18  /   
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