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Technical Committee on Integrated Circuits and Devices (ICD)  (Searched in: 2016)

Search Results: Keywords 'from:2016-12-15 to:2016-12-15'
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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 20 of 49  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
ICD, CPSY 2016-12-15
10:05		 Tokyo Tokyo Institute of Technology 56-Level Programmable Voltage Detector in Steps of 50mV for Battery Management
Teruki Someya (Univ. of Tokyo), Kenichi Matsunaga, Hiroki Morimura (NTT), Takayasu Sakurai, Makoto Takamiya (Univ. of Tokyo) ICD2016-51 CPSY2016-57		 A programmable voltage detector (PVD) for the battery management is developed for the first time. In battery management ... [more] ICD2016-51 CPSY2016-57
pp.1-5
ICD, CPSY 2016-12-15
10:30		 Tokyo Tokyo Institute of Technology An Interectual Property for Wireless Inductive Coupling Through Chip Interface
Yusuke Matsushita, Koichiro Masuyama, Akio Nomura, Junichiro Kadomoto, Tsunaaki Shidei, Tadahiro Kuroda, Hideharu Amano (Keio Univ.) ICD2016-52 CPSY2016-58		  [more] ICD2016-52 CPSY2016-58
pp.7-12
ICD, CPSY 2016-12-15
10:55		 Tokyo Tokyo Institute of Technology Proposal of anonymization methods for secondary use considering data properties
Yuichi Nakamura, Takahiro Hosoe, Hiroaki Nishi (Keio Univ.) ICD2016-53 CPSY2016-59		 Applications for secondary use of data, which is a usage that is not same as an original purpose to obtain the data, hav... [more] ICD2016-53 CPSY2016-59
pp.13-18
ICD, CPSY 2016-12-15
11:20		 Tokyo Tokyo Institute of Technology A Variable Pipeline Reconfigurable Accelerator in 3-D stack implementation
Naoki Ando, Koichiro Masuyama, Hideharu Amano (Keio Univ.) ICD2016-54 CPSY2016-60		 (To be available after the conference date) [more] ICD2016-54 CPSY2016-60
pp.19-24
ICD, CPSY 2016-12-15
13:00		 Tokyo Tokyo Institute of Technology [Invited Talk] Circuit and System Design using Flexible Sensor with Cross-Sectoral Cooperation
Shusuke Yoshimoto (Osaka Univ.) ICD2016-55 CPSY2016-61		  [more] ICD2016-55 CPSY2016-61
pp.25-28
ICD, CPSY 2016-12-15
13:50		 Tokyo Tokyo Institute of Technology [Invited Talk] Computer Infrastructure for Utilizing Big Data
Hiroki Matsutani (Keio Univ.) ICD2016-56 CPSY2016-62		 (To be available after the conference date) [more] ICD2016-56 CPSY2016-62
pp.29-32
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology ICD2016-57 CPSY2016-63 (To be available after the conference date) [more] ICD2016-57 CPSY2016-63
p.33
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation]
Kazutoshi Hirose, Shinya Takamaeda, Masayuki Ikebe, Testuya Asai, Masato Motomura (Hokkaido Univ.) ICD2016-58 CPSY2016-64		 (To be available after the conference date) [more] ICD2016-58 CPSY2016-64
p.35
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology ICD2016-59 CPSY2016-65  [more] ICD2016-59 CPSY2016-65
p.37
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation]
Itaru Hida, Shinya Takamaeda, Masayuki Ikebe, Masato Motomura, Tetsuya Asai (Hokkaido Univ.) ICD2016-60 CPSY2016-66		 In this paper, we propose a Bayesian branch prediction circuit consisting of an instruction-feature extractor and a naiv... [more] ICD2016-60 CPSY2016-66
p.39
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] A nonlinear image-prosessing algorithm generating edge-guided textures and its FPGA implementation
Aoi Tanibata, Miho Ushida, Shinya Takamaeda, Masayuki Ikebe, Masato Motomura, Tetsuya Asai (Hokkaido Univ.) ICD2016-61 CPSY2016-67		  [more] ICD2016-61 CPSY2016-67
p.41
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Pressure Sensor for Artificial Knee Joint Replacement
Fumika Tanabe, Shusuke Yoshimoto, Yuki Noda, Teppei Araki, Takafumi Uemura, Yoshinori Takeuchi, Masaharu Imai, Tsuyoshi Sekitani (Osaka Univ.) ICD2016-62 CPSY2016-68		  [more] ICD2016-62 CPSY2016-68
p.43
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Study of the capacitor ratio adjustment method that takes into account the parasitic capacitance of MOS switch in Capacitor-DAC
Yoshiharu Miyake, Masahiro Sasaki (SIT) ICD2016-63 CPSY2016-69		 In recent years, C-DAC (Capacitor Digital to Analog Converter) is often used as a reference voltage source in a successi... [more] ICD2016-63 CPSY2016-69
p.45
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Analysis of Current Source Transition Timing and Output Current for Glitch Reduction of Current-Steering DAC
Akihiro Usuki, Masahiro Sasaki (SIT) ICD2016-64 CPSY2016-70		 In the current-steering DAC (Digital to Analog Converter), it is a serious problem that high frequency spike noise calle... [more] ICD2016-64 CPSY2016-70
p.47
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Optimal Program Conditions of ReRAM
Atsuna Hayakawa, Kazuki Maeda, Ken Takeuchi (Chuo Univ.) ICD2016-65 CPSY2016-71		  [more] ICD2016-65 CPSY2016-71
p.49
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Analysis of Read Disturb Error in NAND Flash Memory
Hikaru Watanabe, Atsuro Kobayashi, Ken Takeuchi (Chuo Univ.) ICD2016-66 CPSY2016-72		 Recently, as cloud computing technology and Social Networking Service spread, the applications whose data is read locall... [more] ICD2016-66 CPSY2016-72
p.51
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] High-Speed Operation of Program Voltage Generator for Low-voltage ReRAM
Kenta Suzuki, Masahiro Tanaka, Kota Tsurumi, Ken Takeuchi (Chuo Univ.) ICD2016-67 CPSY2016-73		 Resistive random access memory (ReRAM) is considered as one of the next generation non-volatile memories due to its high... [more] ICD2016-67 CPSY2016-73
p.53
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Performance Evaluation of Storage Class Memory based SSD in Consideration of Reliability
Yutaka Adachi, Hirofumi Takishita, Ken Takeuchi (Chuo Univ.) ICD2016-68 CPSY2016-74		 The future Storage Class Memory (SCM) is equivalent to NAND Flash in terms of cost. SCM is high performance compared wit... [more] ICD2016-68 CPSY2016-74
p.55
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Error Pattern Analysis among Scaled Generations of NAND Flash Memories
Yukiya Sakaki, Yusuke Yamaga, Ken Takeuchi (Chuo Univ.) ICD2016-69 CPSY2016-75		 The capacity of NAND flash memory can be expanded by memory cell scaling. However, bit-errors are increased by memory ce... [more] ICD2016-69 CPSY2016-75
p.57
ICD, CPSY 2016-12-15
15:30		 Tokyo Tokyo Institute of Technology [Poster Presentation] Error Tendency Analysis of Endurance in ReRAM
Shouhei Fukuyama, Kazuki Maeda, Ken Takeuchi (Chuo Univ.) ICD2016-70 CPSY2016-76		 Resistive random access memory (ReRAM) attracts attention as one of the storage class memory (SCM) because of its high s... [more] ICD2016-70 CPSY2016-76
p.59
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