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Technical Committee on Electromechanical Devices (EMD) (Searched in: 2011)
Search Results: Keywords 'from:2011-05-20 to:2011-05-20'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD | 2011-05-20 13:05 |
Miyagi | Tohoku Univ. Cyber-Science Center | Contact Capacitance of 10-1000 Microfarads in Parallel with Contact Resistances between Closed Metal Electrodes Eisuke Takano (Consultant)  EMD2011-1 |
The contact capacitance was investigated by measuring the phase shift between the alternating contact voltage and curren... [more] | EMD2011-1 pp.1-6 |
| EMD | 2011-05-20 13:30 |
Miyagi | Tohoku Univ. Cyber-Science Center | Fundamental study on a high-frequency equivalent circuit of a connector with loose contact Kazuki Matsuda, Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMD2011-2 |
[more] | EMD2011-2 pp.7-10 |
| EMD | 2011-05-20 13:55 |
Miyagi | Tohoku Univ. Cyber-Science Center | Contention resolution technique using output port reservation for input-queueing ATM switches Ryousuke Kino, Hitoshi Obara (Akita Univ.) EMD2011-3 |
The reciprocal scheduling control, a new contention resolution technique for input-queueing ATM switches, is described. ... [more] | EMD2011-3 pp.11-14 |
| EMD | 2011-05-20 14:35 |
Miyagi | Tohoku Univ. Cyber-Science Center | A study on rotation characteristics of speckle patterns observed in an output light spot from an optical fiber (II) Yusuke Takahashi, Muneki Kawahara, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) EMD2011-4 |
When coherent light beams (laser beams) are incident on one end of an optical fiber, transmitted to another end to exit ... [more] | EMD2011-4 pp.15-20 |
| EMD | 2011-05-20 15:00 |
Miyagi | Tohoku Univ. Cyber-Science Center | An experimental study on an evaluation system of a contact surface profile with an optical cross-section method (II) Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) EMD2011-5 |
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] | EMD2011-5 pp.21-26 |
| EMD | 2011-05-20 15:25 |
Miyagi | Tohoku Univ. Cyber-Science Center | Influence of Source Voltage on Electrode Mass Change of AgNi Contacts for Electromagnetic Contactor
-- Various characteristics of contactor with only break arc -- Kiyoshi Yoshida (NIT), Koichiro Sawa (Keio Univ.), Kenji Suzuki, Masaaki Watanabe, Hideki Daijima (Fuji Electric) EMD2011-6 |
Tests at several source voltages were carried out to clarify the influence of the voltage on various characteristics, ar... [more] | EMD2011-6 pp.27-32 |
| EMD | 2011-05-20 15:50 |
Miyagi | Tohoku Univ. Cyber-Science Center | Degrdation phenomenon of electrical contacts using hammering oscillating mechanism and micro-sliding mechanism
-- Contact resistance -- Shin-ichi Wada, Saindaa Norovling, Keiji Koshida, Masahiro Kawanobe, Hiroaki Kubota (TMC), Koichiro Sawa (NIT) EMD2011-7 |
Authors have studied the influence on contact resistance by micro-oscillation to electrical contacts using hammering osc... [more] | EMD2011-7 pp.33-38 |
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