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Technical Committee on Electromechanical Devices (EMD) (Searched in: 2010)
Search Results: Keywords 'from:2011-02-18 to:2011-02-18'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD, R | 2011-02-18 13:05 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Peculiar Phenomena for Increase in Friction Coefficient due to Application of Lubrication Terutaka Tamai, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AN Lab.)  R2010-42 EMD2010-143 |
For tin plated connector contacts, it was found that friction coefficient at lubricated contacts was higher than the fri... [more] | R2010-42 EMD2010-143 pp.1-6 |
| EMD, R | 2011-02-18 13:30 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Direct Viewing of Current in Contact Area used by Light Emission Diode Shigeki Tsukiji, Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AN-Tech), Kazuo Iida (Mie Univ.) R2010-43 EMD2010-144 |
[more] | R2010-43 EMD2010-144 pp.7-12 |
| EMD, R | 2011-02-18 13:55 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | An experimental study on contact resistance characteristics of relay contacts in evaporated vapor atmospheres Makoto Hasegawa, Nanae Kobayashi (Chitose. Inst. of Sci. & Tech.), Yoshiyuki Kohno (Kaneka) R2010-44 EMD2010-145 |
Influences of vapors evaporated from an acryl-based non-silicone-type polymeric cured product and conventional silicone-... [more] | R2010-44 EMD2010-145 pp.13-18 |
| EMD, R | 2011-02-18 14:20 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Measurement of Contact Resistance Distribution on Electrical Contact Surfaces Eroded by Break Arcs Yohei Yamanashi, Katsuyoshi Miyaji, Junya Sekikawa (Shizuoka Univ.), Takayoshi Kubono (Prof. Emeritus of Shizuoka Univ.) R2010-45 EMD2010-146 |
[more] | R2010-45 EMD2010-146 pp.19-24 |
| EMD, R | 2011-02-18 15:00 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Detection of degradation sign of LSI operation using IDDQ Shunsuke Sakamoto, Masaru Sanada (KUT) R2010-46 EMD2010-147 |
VDD supply current (IDDQ) information has been applied to detect LSI evaluation technology, IDDQ which has high fault de... [more] | R2010-46 EMD2010-147 pp.25-30 |
| EMD, R | 2011-02-18 15:25 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Logic stabilization of unstable logic circuit with open fault Taiki Yasutomi, Masaru Sanada (KUT) R2010-47 EMD2010-148 |
An experiment for stabilization of output logic brought by floating gate fault with unsuitable electric value has been e... [more] | R2010-47 EMD2010-148 pp.31-36 |
| EMD, R | 2011-02-18 15:50 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Statistical Quality Control based on Early Life Failure Rate for Electronic Components Toshinari Matsuoka (MELCO) R2010-48 EMD2010-149 |
Basically, a manufacturing process of electronic components is complex and demanding.Therefore, in order to achieve a qu... [more] | R2010-48 EMD2010-149 pp.37-42 |
| EMD, R | 2011-02-18 16:15 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Thermal imaging method with Phase Microscopy Tomonori Nakamura, Hidenao Iwai, Toyohiko Yamauchi (HPK CRL), Hirotoshi Terada (HPK) R2010-49 EMD2010-150 |
[more] | R2010-49 EMD2010-150 pp.43-48 |
| EMD, R | 2011-02-18 16:40 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | A Study on Plating Element and Solderbility for Ni/Sn Lath-like Intermetallic Sadanori Itou (itoken), Masafumi Suzuki (omron) R2010-50 EMD2010-151 |
[more] | R2010-50 EMD2010-151 pp.49-52 |
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