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Technical Committee on Electromechanical Devices (EMD) (Searched in: 2009)
Search Results: Keywords 'from:2010-02-19 to:2010-02-19'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD, R | 2010-02-19 12:35 |
Osaka | Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- Modeling of the oscillating mechanism (7) -- Shin-ichi Wada, Keiji Koshida, Taketo Sonoda, Saindaa Norovling, Mitsuo Kikuchi, Hiroaki Kubota (TMC System Co.Ltd.), Koichiro Sawa (former Keio Univ/Nippon Inst. of Tech.)  R2009-50 EMD2009-117 |
The authors have developed the mechanism which gives vibration to electrical contacts by hammering oscillation and studi... [more] | R2009-50 EMD2009-117 pp.1-6 |
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| EMD, R | 2010-02-19 13:00 |
Osaka | A Study on Improvement for Seal property of Electromechanical Devices
-- The behavior of One-Part Epoxy Resin in a narrow gap -- Osamu Otani, Seiji Nakajima, Tomohiro Fukuhara (OMRON Corp.) R2009-51 EMD2009-118 |
Generally, one-part epoxy resin consists of liquid epoxy monomer, solid curing agent, and filler as a packing agent and ... [more] | R2009-51 EMD2009-118 pp.7-11 |
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| EMD, R | 2010-02-19 13:25 |
Osaka | An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts (III) Makoto Hasegawa (Chitose Inst. of Sci. and Tech.), Yoshiyuki Kohno (Kaneka Corp.) R2009-52 EMD2009-119 |
Influences of vapors evaporated from a newly-developed acryl-based polymeric material (containing no silicone components... [more] | R2009-52 EMD2009-119 pp.13-18 |
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| EMD, R | 2010-02-19 14:00 |
Osaka | Optical Beam Profiler using Perturbation Interruption Method Seiichi Onoda, Keiichi Inoue, Koji Aita, Masayuki Nakano (Watanabe Co., Ltd) R2009-53 EMD2009-120 |
Optical beam profiler using perturbation interruption method has been investigated, and verified to be useful as a conve... [more] | R2009-53 EMD2009-120 pp.19-24 |
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| EMD, R | 2010-02-19 14:25 |
Osaka | Accuracy Improvement of BOF/DWPR Temperature Sensing Using a Reference BOF Yasutoshi Komatsu, Ryuji Nagai, Keiichi Inoue, Seiichi Onoda (Watanabe Co., Ltd) R2009-54 EMD2009-121 |
When an optical fiber sensor using a BOF (Band-pass filter On fiber-end) is applied to a DWPR (Dual Wavelength Push-pull... [more] | R2009-54 EMD2009-121 pp.25-30 |
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| EMD, R | 2010-02-19 14:50 |
Osaka | Cut Set Analysis of Fault Tree with Priority AND Gates Taijirou Yoneda, Tetsushi Yuge, Nobuyuki Tamura, Shigeru Yanagi (NDA) R2009-55 EMD2009-122 |
We propose a method for calculating the exact top event probability of a fault tree with priority AND gates using the mi... [more] | R2009-55 EMD2009-122 pp.31-36 |
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| EMD, R | 2010-02-19 15:20 |
Osaka | Observation of wear status of tin plating for automotive connector at initial stage of sliding Shigeru Sawada, Terutaka Tamai (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd.), Kazuo Iida (Mie Univ.) R2009-56 EMD2009-123 |
Tin plated contacts are widely used for common electrical contact due to the inexpensive and reliability. On the other h... [more] | R2009-56 EMD2009-123 pp.37-42 |
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| EMD, R | 2010-02-19 15:45 |
Osaka | Physical characteristics of oxide film grown on tin plated contact surface of connectors under high temperatures in the air and its effect on contact resistance Yuya Nabeta, Shigeru Sawada, Yasushi Saitoh (Mie Univ.), Atsushi Shimizu, Yasuhiro Hattori (AutoNet Tech.), Terutaka Tamai (Mie Univ.) R2009-57 EMD2009-124 |
Tin plated surface used for contact surface such as connectors is usually covered with the oxide vfilm in the atmosphere... [more] | R2009-57 EMD2009-124 pp.43-48 |
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| EMD, R | 2010-02-19 16:10 |
Osaka | A Study on growth of hair silver Sadanori Ito (Formerly OMRON), Takahumi Sasaki (OMRON), Hiroki Yamaguchi (OMRON RELAY AND DEVUCE) R2009-58 EMD2009-125 |
We reported about hair silver product elongation in view of two product elongation mechanism caused by reduction and ele... [more] | R2009-58 EMD2009-125 pp.49-52 |
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| EMD, R | 2010-02-19 16:35 |
Osaka | Measurement Of Electrical Property Of Sn Oxide Layer Using Liquid Metal Tomoki Yonekawa, Yasushi Saitoh, Kazuo Iida, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech. Ltd) R2009-59 EMD2009-126 |
Sn is a material often used as a plating material of electric contact, but the oxide layer is formed by exposure to air.... [more] | R2009-59 EMD2009-126 pp.53-57 |
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