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Technical Committee on Electromechanical Devices (EMD) (Searched in: 2008)
Search Results: Keywords 'from:2009-02-20 to:2009-02-20'
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| EMD, R | 2009-02-20 09:50 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Contact resistance analysis of electric contact with tin or silver plated layer Shigeru Sawada (Mie Univ.), Kaori Shimizu, Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.)  R2008-44 EMD2008-120 |
[more] | R2008-44 EMD2008-120 pp.1-6 |
| EMD, R | 2009-02-20 10:15 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Growth Law of the Oxide Film Formed on the tin Plated Contact Surface and Its Contact Resistance Characteristic
-- Study applied by ellipsometry -- Yuya Nabeta, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Terutaka Tamai (Mie Univ.) R2008-45 EMD2008-121 |
[more] | R2008-45 EMD2008-121 pp.7-12 |
| EMD, R | 2009-02-20 10:40 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Influence of Aging on Contact Resistance Characteristics of Tin Plated Contacts Yuichi Tominaga, Takuya Yamanaka, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.) R2008-46 EMD2008-122 |
We kept tin plated specimens in the aging chamber heated at 100 ℃ in order to grow oxidation film. Then we measured cont... [more] | R2008-46 EMD2008-122 pp.13-18 |
| EMD, R | 2009-02-20 11:05 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Influence of Fretting Corrosion on Lifetime of Tin Plated Connectors Daiji Ito, Hirosaka Ikeda, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.), Tetsuya Ito, Yasuhiro Hattori (Auto Networks Tech, Ltd) R2008-47 EMD2008-123 |
Recently years, according to downsizing of connectors which applied to automobile, reductions of contact load in connect... [more] | R2008-47 EMD2008-123 pp.19-24 |
| EMD, R | 2009-02-20 12:30 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Microscopy Study of Fretting Corrosion of the Tin Plated Contacts Tetsuya Ito, Shigeru Sawada, Yoshiyuki Nomura (ANTAutoNetworks Tech, Ltd.), Yasuhiro Hattori (AutoNetworks Tech, Ltd.), Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ.) R2008-48 EMD2008-124 |
[more] | R2008-48 EMD2008-124 pp.25-30 |
| EMD, R | 2009-02-20 12:55 |
Mie | Sumitomo Wiring Systems LTD., Head Office | An experimental study on evaluation system for contact surraces with an optical-cross method Makoto Kashiwakura, Shunsuke Kudo, Asuka Sudo, Makoto Hasegawa (Chitose Inst. of Sci. & Tech.) R2008-49 EMD2008-125 |
Contact surfaces of mechanical relays and switches are often damaged by arc discharges and/or mechanical wear during swi... [more] | R2008-49 EMD2008-125 pp.31-36 |
| EMD, R | 2009-02-20 13:20 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Degradation phenomenon of electrical contacts by hammering oscillating mechanism
-- for Contact Resistance (IV) -- Shin-ichi Wada, Taketo Sonoda, Keiji Koshida, Mitsuo Kikuchi, Hiroaki Kubota (TMC System), Koichiro Sawa (Keio Univ.) R2008-50 EMD2008-126 |
The authors have developed the hammering oscillating mechanism which could give real vibration to electrical contacts an... [more] | R2008-50 EMD2008-126 pp.37-42 |
| EMD, R | 2009-02-20 13:45 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Pull strength analysis of Pb free solder at a connected point Taku Hashiguchi, Yuta Nasukawa, Kazunori Hiraoka (Salesian Polytecn.) R2008-51 EMD2008-127 |
Pull strength of Pb free solder at a connected point is tested and analyzed. Experiments are performed with various p... [more] |
R2008-51 EMD2008-127 pp.43-48 |
| EMD, R | 2009-02-20 14:25 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Evaluation of electric contact trouble caused by silicone.
-- Evaluation test with new environmental examination device -- Makito Morii, Hiroyuki Moriwaki (OMRON), Hideki Tanaka, Yoshitaka Ueki, Kenji Suzuki, Kimio Yoshizumi, Masanobu Nishikawa (espec) R2008-52 EMD2008-128 |
The phenomenon of the point of contact's becoming a loose connection with the gas generated from the compound of the org... [more] | R2008-52 EMD2008-128 pp.49-52 |
| EMD, R | 2009-02-20 14:50 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Dependency of Occurrence of Contact Failure due to Silicone Contamination on Electrical Load Conditions Terutaka Tamai (Mie Univ.) R2008-53 EMD2008-129 |
[more] | R2008-53 EMD2008-129 pp.53-58 |
| EMD, R | 2009-02-20 15:15 |
Mie | Sumitomo Wiring Systems LTD., Head Office | An experimental study on influences of silicone-type and non-silicone-type polymeric materials on contact resistance characteristics of relay contacts Makoto Hasegawa, Takuma Matsuto (Chitose Inst. of Sci. & Tech.), Yoshiyuki Kohno, Hiroshi Ando (Kaneka Corp.) R2008-54 EMD2008-130 |
Silicone contamination is one of well-known reasons of contact failures. It has been reported that siloxane component e... [more] | R2008-54 EMD2008-130 pp.59-64 |
| EMD, R | 2009-02-20 15:55 |
Mie | Sumitomo Wiring Systems LTD., Head Office | * Sadanori Ito (Itoken office) R2008-55 EMD2008-131 |
Ｔｈｉｓ ｐａｐｅｒ ｄｅｓｃｒｉｂｅｓ ｅｆｆｅｃｔ ｏｆ ｉｎｏｒｇａｎｉｃ ｐｈｏｓｐｈａｔｅ ｉｎ ｒｅｓｉｎ ｆｏｒ ＥＭＣ．Ｔｈｅ ｒｅｓｕｌｔｓ ｉｎｄｉｃａｔｅｄ ｔｈａｔ ｈｉｇｈ ｔｅｍｐｅｒａｔｕｒｅ／ｈｕｍｉｄｉｔｙ... [more] | R2008-55 EMD2008-131 pp.65-68 |
| EMD, R | 2009-02-20 16:20 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Avoidance for lightning damages on the stray metal portion of the broadcasting system Kazuaki Wakai (Daiichi Univ.), Yuji Sawaguri (SGC) R2008-56 EMD2008-132 |
We have quite a bit of experience for the broadcasting transmitting system, which are designing, management, maintenance... [more] | R2008-56 EMD2008-132 pp.69-76 |
| EMD, R | 2009-02-20 16:45 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Reliability test results for SC and MU connectors installed on outside plant Yoshiteru Abe, Shuichi Yanagi, Shuichiro Asakawa, Ryo Nagase (NTT) R2008-57 EMD2008-133 |
Optical connector is an essential component of optical network systems. In fiber to the home (FTTH) systems, the optical... [more] | R2008-57 EMD2008-133 pp.77-81 |
| EMD, R | 2009-02-20 17:10 |
Mie | Sumitomo Wiring Systems LTD., Head Office | Development of undressing detection system of uniforms by human body communication. Akinori Kondo (TMCIT), Sayumi Kamata (TMCAE), Masaki Fujikawa (Chuo Univ.), Kenji Furusawa (Mitsuya Lab.), Masakatsu Nishigaki (Shizuoka Univ.), Masasumi Yoshizawa (TMCIT) |
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