Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
EMCJ |
2010-07-15 11:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Evaluation of immunity characteristics for power supply terminal of RF components Fujiyuki Nakamoto, Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.) EMCJ2010-21 |
[more] |
EMCJ2010-21 pp.1-4 |
EMCJ |
2010-07-15 11:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Proposal of Near-Field-Measurement Technique in Complex Complex Toshihiro Takatsu, Fengchao Xiao (Univ. of Electro-comm.), Kimitoshi Murano (Tokai Univ.), Yoshio Kami (Univ. of Electro-comm.) EMCJ2010-22 |
A method and network for measuring complex electromagnetic (EM) fields is proposed. The method is based on a network of... [more] |
EMCJ2010-22 pp.5-10 |
EMCJ |
2010-07-15 11:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Measurement of Cole-Cole Plot for Wine with an Open Ended Coaxial Probe Yusuke Sato, Yusuke Kazama, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2010-23 |
[more] |
EMCJ2010-23 pp.11-14 |
EMCJ |
2010-07-15 13:20 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Estimation of Whole-Body Average SARs in Human for Vertical Polarized Far-Field Exposure at Frequencies over 1 GHz Using Spatially Averaged Squares of Induced Currents Tokio Suzuki, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.), Tomoaki Nagaoka, Soichi Watanabe (NICT) EMCJ2010-24 |
In this study, to validate whole body average SARs in human volunteers for over 1GHz vertically polarized far-field expo... [more] |
EMCJ2010-24 pp.15-19 |
EMCJ |
2010-07-15 13:45 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Evaluation Method for EMI of an Implanted Device by Wireless Devices Using Near-field EMF Satoshi Ishihara, Takahiro Iyama, Teruo Onishi, Yoshiaki Tarusawa (NTT DOCOMO) EMCJ2010-25 |
The objective of this study is to establish electromagnetic interference (EMI) evaluation techniques for wireless device... [more] |
EMCJ2010-25 pp.21-26 |
EMCJ |
2010-07-15 14:10 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Estimation of Current Sources Magnitude Using Improved SPM Method Yuan Zhen, Jerdvisanop Chakarothai, Qiang Chen, Kunio Sawaya (Tohoku Univ.) EMCJ2010-26 |
To suppress the electromagnetic wave which is leaked from electrical circuits and devices, it is necessary to know the l... [more] |
EMCJ2010-26 pp.27-31 |
EMCJ |
2010-07-15 14:35 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Examination of Reduction Technique for Radiation noise from the power suppy layers in PCB
-- Power supply layers shape -- Hitoshi Takakura, Shinichi Sasaki (Saga Univ.) EMCJ2010-27 |
[more] |
EMCJ2010-27 pp.33-38 |
EMCJ |
2010-07-15 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Effective Position of Decoupling Inductor Taking Parasitic Capacitances on Power Distribution Network Traces into Account Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) EMCJ2010-28 |
High-frequency current caused by simultaneous switching of digital gates can be increased with decoupling capacitors,bec... [more] |
EMCJ2010-28 pp.39-44 |
EMCJ |
2010-07-15 15:40 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Selection of position of equivalent current source in LSI linear macro-model using Norton equivalent circuit in transient domain Teruyoshi Yamasaki, Hiroshi Tanaka, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2010-29 |
The authors have developed an EMC macro-model called LECCS model composed of a linear equivalent circuit and internal eq... [more] |
EMCJ2010-29 pp.45-50 |
EMCJ |
2010-07-15 16:05 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Relationship between Contact Point Distribution and Common-Mode Current on Connector with Contact Failure Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2010-30 |
[more] |
EMCJ2010-30 pp.51-54 |
EMCJ |
2010-07-15 16:30 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
Time Domain Analysis of Single Conductor Line Using Propagating Line Current Yoshinobu Wada, Takashi Hisakado, Osami Wada (Kyotu Univ.) EMCJ2010-31 |
Today some well-known methods are used to analyze integrated electric circuits, such as the lamped element model, the di... [more] |
EMCJ2010-31 pp.55-60 |