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Technical Committee on Electromagnetic Compatibility (EMCJ)  (Searched in: 2010)

Search Results: Keywords 'from:2010-07-15 to:2010-07-15'

[Go to Official EMCJ Homepage] 
Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 11 of 11  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMCJ 2010-07-15
11:05
Tokyo Kikai-Shinko-Kaikan Bldg. Evaluation of immunity characteristics for power supply terminal of RF components
Fujiyuki Nakamoto, Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.) EMCJ2010-21
 [more] EMCJ2010-21
pp.1-4
EMCJ 2010-07-15
11:30
Tokyo Kikai-Shinko-Kaikan Bldg. A Proposal of Near-Field-Measurement Technique in Complex Complex
Toshihiro Takatsu, Fengchao Xiao (Univ. of Electro-comm.), Kimitoshi Murano (Tokai Univ.), Yoshio Kami (Univ. of Electro-comm.) EMCJ2010-22
A method and network for measuring complex electromagnetic (EM) fields is proposed. The method is based on a network of... [more] EMCJ2010-22
pp.5-10
EMCJ 2010-07-15
11:55
Tokyo Kikai-Shinko-Kaikan Bldg. Measurement of Cole-Cole Plot for Wine with an Open Ended Coaxial Probe
Yusuke Sato, Yusuke Kazama, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.) EMCJ2010-23
 [more] EMCJ2010-23
pp.11-14
EMCJ 2010-07-15
13:20
Tokyo Kikai-Shinko-Kaikan Bldg. Estimation of Whole-Body Average SARs in Human for Vertical Polarized Far-Field Exposure at Frequencies over 1 GHz Using Spatially Averaged Squares of Induced Currents
Tokio Suzuki, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.), Tomoaki Nagaoka, Soichi Watanabe (NICT) EMCJ2010-24
In this study, to validate whole body average SARs in human volunteers for over 1GHz vertically polarized far-field expo... [more] EMCJ2010-24
pp.15-19
EMCJ 2010-07-15
13:45
Tokyo Kikai-Shinko-Kaikan Bldg. Evaluation Method for EMI of an Implanted Device by Wireless Devices Using Near-field EMF
Satoshi Ishihara, Takahiro Iyama, Teruo Onishi, Yoshiaki Tarusawa (NTT DOCOMO) EMCJ2010-25
The objective of this study is to establish electromagnetic interference (EMI) evaluation techniques for wireless device... [more] EMCJ2010-25
pp.21-26
EMCJ 2010-07-15
14:10
Tokyo Kikai-Shinko-Kaikan Bldg. Estimation of Current Sources Magnitude Using Improved SPM Method
Yuan Zhen, Jerdvisanop Chakarothai, Qiang Chen, Kunio Sawaya (Tohoku Univ.) EMCJ2010-26
To suppress the electromagnetic wave which is leaked from electrical circuits and devices, it is necessary to know the l... [more] EMCJ2010-26
pp.27-31
EMCJ 2010-07-15
14:35
Tokyo Kikai-Shinko-Kaikan Bldg. Examination of Reduction Technique for Radiation noise from the power suppy layers in PCB -- Power supply layers shape --
Hitoshi Takakura, Shinichi Sasaki (Saga Univ.) EMCJ2010-27
 [more] EMCJ2010-27
pp.33-38
EMCJ 2010-07-15
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. Effective Position of Decoupling Inductor Taking Parasitic Capacitances on Power Distribution Network Traces into Account
Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.) EMCJ2010-28
High-frequency current caused by simultaneous switching of digital gates can be increased with decoupling capacitors,bec... [more] EMCJ2010-28
pp.39-44
EMCJ 2010-07-15
15:40
Tokyo Kikai-Shinko-Kaikan Bldg. Selection of position of equivalent current source in LSI linear macro-model using Norton equivalent circuit in transient domain
Teruyoshi Yamasaki, Hiroshi Tanaka, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.) EMCJ2010-29
The authors have developed an EMC macro-model called LECCS model composed of a linear equivalent circuit and internal eq... [more] EMCJ2010-29
pp.45-50
EMCJ 2010-07-15
16:05
Tokyo Kikai-Shinko-Kaikan Bldg. Relationship between Contact Point Distribution and Common-Mode Current on Connector with Contact Failure
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.) EMCJ2010-30
 [more] EMCJ2010-30
pp.51-54
EMCJ 2010-07-15
16:30
Tokyo Kikai-Shinko-Kaikan Bldg. Time Domain Analysis of Single Conductor Line Using Propagating Line Current
Yoshinobu Wada, Takashi Hisakado, Osami Wada (Kyotu Univ.) EMCJ2010-31
Today some well-known methods are used to analyze integrated electric circuits, such as the lamped element model, the di... [more] EMCJ2010-31
pp.55-60
 Results 1 - 11 of 11  /   
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